The characterization of individual nanoscale objects such as carbon nanotubes (CNTs) is one of the main challenges in material science and nanotechnology. In this paper, we present a nanorobotic strategy allowing the ...
详细信息
One of the key challenges of microsystem- and nanotechnologies is the automation of robot-based nanomanipulation. However,there is limited sensor feedback due to lack of appropriate *** feedback is required for repeat...
详细信息
ISBN:
(纸本)9781424427239
One of the key challenges of microsystem- and nanotechnologies is the automation of robot-based nanomanipulation. However,there is limited sensor feedback due to lack of appropriate *** feedback is required for repeatable actuator movements from macro- down to the *** complicates the design of reliable automation *** this paper,the development of an automated robot-based toolbox for cell injection and handling is presented. This toolbox includes several sensor methods,bridging several orders of magnitude as feedback for automation. A non-linear support vector machine(SVM) is applied for classification of the viability of cells as feedback for quality control.A visual servoing algorithm for position tracking of the injection needle as well as an injection force sensor have been *** automation results and the control system are explained.
This article presents a software architecture for image processing applications. Its intended use is in the automation of manipulation processes at the microand nanoscale. The main requirements for this architecture a...
详细信息
ISBN:
(纸本)9784901122092
This article presents a software architecture for image processing applications. Its intended use is in the automation of manipulation processes at the microand nanoscale. The main requirements for this architecture are the capability for real-time processing, the flexibility to cover a wide range of different applications and simplicity of usage. Some of the biggest challenges include online changes of control- and data-flow, integration of a large number of devices for microscopy and the need for high-speed result forwarding. The architecture has been implemented and tested extensively. Three key applications are presented: object tracking, classification of biological cells and 3D image reconstruction for scanning electron microscopes.
Inertia-drive is one category of drive principles that is widely used for piezoelectric actuators, thanks to its simple control and drive structure. However, such principle suffers from the residual vibrations caused ...
详细信息
This paper deals with the extraction of small object positions in the scanning electron microscope (SEM). An approach based on line scanning and new object tracking approaches are presented and evaluated for their cap...
详细信息
ISBN:
(纸本)9780980740448
This paper deals with the extraction of small object positions in the scanning electron microscope (SEM). An approach based on line scanning and new object tracking approaches are presented and evaluated for their capabilities to reliably track objects in the SEM when the objects are moving quickly. Image acquisition of such fast moving objects has the issue of strong distortions and very high displacements, which can affect the performance of the algorithms. The new approaches are compared to common image processing algorithms.
Electron Beam induced Deposition (EBiD) is a promising process technology for nano-structuring and -prototyping inside a scanning electron microscope (SEM). Firstly, the EBiD-process used for layer deposition is descr...
详细信息
ISBN:
(纸本)9781845640804
Electron Beam induced Deposition (EBiD) is a promising process technology for nano-structuring and -prototyping inside a scanning electron microscope (SEM). Firstly, the EBiD-process used for layer deposition is described. We have performed nanoindentation experiments on EBiD-layers with the purpose of determining their hardness. A special setup for nanoindentation inside the SEM is described. Before performing tests on EBiD-layers, calibration measurements on fused silica and sapphire were necessary. Hardness of the silicon wafer substrate and of the EBiD-layers has been also determined. The layers were small quadrates, with dimensions in the range of 20 20 m, with a thickness varying between 93 and 2256 nm. Nanoindentation tests on the deposited layers revealed values between 7.1 and 10.0 GPa for tungsten containing deposits and between 3.4 and 3.5 for cobalt containing deposits depending on the metal-content.
This study describes an approach towards the detection of carbon nanotubes in scanning electron microscopic images. It is designed to work in a real-time environment for automated nanofabrication. Main difficulties ar...
详细信息
ISBN:
(纸本)9784901122092
This study describes an approach towards the detection of carbon nanotubes in scanning electron microscopic images. It is designed to work in a real-time environment for automated nanofabrication. Main difficulties are the high level of image noise and the occurrence of debris objects. A descriptor derived from the principle component analysis of the geometrical object distribution is found to be a very helpful indicator for object classification. It turns out to be largely invariant to alterations in imaging conditions. All methods described have been implemented and evaluated in largescale experiments. The procedure has also been fully integrated into a distributed control architecture.
Fast closed-loop control is a key issue for high-throughput automated micro-and nanohandling. Currently, mobile robot position control relies on computer vision using FireWire- or USB-cameras. This approach has severa...
详细信息
The process of electron beam induced deposition was used to create sensor structures for strain measurements with outer dimensions of 20 μm by 30 μm. The sensor principle was derived from classic macroscopic strain ...
详细信息
ISBN:
(纸本)9781617825583
The process of electron beam induced deposition was used to create sensor structures for strain measurements with outer dimensions of 20 μm by 30 μm. The sensor principle was derived from classic macroscopic strain gage sensors. Therefore, electrically conductive lines with a width of 200 nm were directly deposited on an SiO2 coated silicon wafer by writing them with the electron beam of a scanning electron microscope and in the presence of an organometallic tungsten precursor. To determine the properties of the sensor structure, the electric noise was measured and compared to a constantan strain gage and a semiconductor strain gage. From this noise voltage, the best achievable mechanical resolution for every strain gage type is determined. The electric resistance of the sensor structure was measured at defined strain and compression to determine the gauge factor which is needed to calculate the value of arbitrary strain from measured resistances. Long time period measurements of the electrical resistance showed effects of a burning-in process, aging and wear of the sensor structure, which were analyzed in the last part of this work.
Separation and palletizing of microparts is a prerequisite for microhandling and microassembly, especially for components such as microspheres that cannot be efficiently produced and transported in a well-ordered form...
详细信息
暂无评论