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检索条件"机构=Dpt. of Computer Architecture and Computer Technology"
165 条 记 录,以下是161-170 订阅
排序:
A parallel pipelined hough transform  2nd
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2nd International Euro-Par Conference on Parallel Processing, Euro-Par 1996
作者: Guil, N. Zapata, E.L. Dpt. of Computer Architecture University of Málaga Campus de Teatinos P.O. Box 4114 Málaga29080 Spain
The algorithms based on Hough Transform techniques to detect complex shapes, like circles and ellipses, require excessive computing time. In order to obtain better execution times we propose a new procedure to paralle... 详细信息
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An approach to minimize testability overhead for bilbo based built-in-self-test  5
An approach to minimize testability overhead for bilbo based...
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5th International Conference on VLSI Design, ICVD 1992
作者: Basu, Anupam Wilson, T.C. Banerji, D.K. Majithia, J.C. Dpt. of Computing and Info Scicnce University of Guelph GuelphONN1G 2W1 Canada Dept. of Computer Science and Engg. Indian Institute of Technology Kharagpur721302 India
Minimization of the total testing lime of a chip and the extra overhead involved form two key aspects in design for testability. This paper presents an integrated approach for selecting the test plans with the objecti... 详细信息
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Simplified Algorithm for Decoupling of Nonlinear Systems via Dynamic Compensators
Simplified Algorithm for Decoupling of Nonlinear Systems via...
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American Control Conference (ACC)
作者: Stamatis D. Voliotis Manolis A. Christodoulou Syracuse University Dpt. of Electrical and Computer Engineering Syracuse NY 13210. University of Patras Dpt. of Computer Engineering and Computer Technology Institute Patras Greece. Technical University of Crete Dpt. of Electronic Engineering Chania Crete Greece.
This paper presents an algorithm for input output decoupling of nonlinear systems with the use of a dynamic precompensator. The algorithm has a simple form. Accordingly necessary and sufficient conditions are establis... 详细信息
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Fault simulation and test pattern generation at the multiple-valued switch level
Fault simulation and test pattern generation at the multiple...
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IEEE International Test Conference
作者: J.-P. Caisso B. Courtois VLSI Design Laboratory of the Electrical Engineering Dpt. McGill University Montreal Canada IMAG/TIM3-Computer Architecture Group Grenoble France
A fault simulation and test-pattern-generation environment is specified. It includes a multiple-valued algebra, allows the natural treatment of loops and bidirectional devices, and models the physical failures. The au... 详细信息
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Rough Sets and Intelligent Systems Paradigms  1
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丛书名: Lecture Notes in computer Science
1000年
作者: Marzena Kryszkiewicz Zbigniew W. Raś Chris Cornelis Davide Ciucci Jesús Medina-Moreno Hiroshi Motoda
This book constitutes the refereed proceedings of the 23rd Australasian Joint Conference on Rough Sets and Intelligent Systems Paradigms, RSEISP 2014, held in Granada and Madrid, Spain, in July 2014. RSEISP 2014 was h... 详细信息
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