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检索条件"机构=Faculty of Information Technology and Systems Section of Computer Engineering"
2797 条 记 录,以下是2591-2600 订阅
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Facilitating e-Negotiation Processes with Semantic Web Technologies
Facilitating e-Negotiation Processes with Semantic Web Techn...
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Annual Hawaii International Conference on System Sciences (HICSS)
作者: D.K.W. Chiu S.C. Cheung P.C.K. Hung Ho-fung Leung Dickson Computer Systems Hong Kong China Department of Computer Science Hong Kong University of Science and Technology Hong Kong China Faculty of Business and Information Technology University of Ontario Institute of Technology (UOIT) Canada Department of Computer Science and Engineering Chinese University of Hong Kong Hong Kong China
Semantic Web technologies have recently been maturing to make e-commerce interactions and cross-organizational processes more flexible and automated. Ontology has also been developed in various business domains. Howev... 详细信息
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An intelligent system for Aerial image Retrieval and Classification
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3rd Hellenic Conference on Artificial Intelligence, SETN 2004
作者: Gasteratos, Antonios Zafeiridis, Panagiotis Andreadis, Ioannis Laboratory of Robotics and Automation Section of Production Systems Department of Production and Management Engineering Democritus University of Thrace Building of University’s Library Kimmeria XanthiGR-671 00 Greece Laboratory of Electronics Section of Electronics and Information Systems Technology Department of Electrical and Computer Engineering Democritus University of Thrace Vassilisis Sophias 12 XanthiGR-671 00 Greece
Content based image retrieval is an active research area of pattern recognition. A new method of extracting global texture energy descriptors is proposed and it is combined with features describing the color aspect of... 详细信息
来源: 评论
Kinematic analysis of human lifting movement for biped robot control
Kinematic analysis of human lifting movement for biped robot...
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International Workshop on Advanced Motion Control (AMC)
作者: N. Matsunaga Y. Okimura S. Kawaji Department of Computer Science Faculty of Engineering Kumamoto University Japan Department of Systems Engineering and Information Science Graduate School of Science and Technology Kumamoto University Japan
An increasing biped robot development may be viewed in terms of realization of autonomous works in real world, where robot motion with lifting and/or carrying of heavy objects must be designed. Such motion control of ... 详细信息
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Analyzing the impact of process variations on DRAM testing using border resistance traces  12
Analyzing the impact of process variations on DRAM testing u...
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12th Asian Test Symposium, ATS 2003
作者: Al-Ars, Z. Van De Goor, A.J. Section of Computer Engineering Faculty of Information Technology and Systems Delft University of Technology Mekelweg 4 Delft2628 CD Netherlands
As a result of variations in the fabrication process, different memory components are produced with different operational characteristics, a situation that complicates the fault analysis process of manufactured memori... 详细信息
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Systematic memory test generation for DRAM defects causing two floating nodes
Systematic memory test generation for DRAM defects causing t...
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Records of the 2003 International Workshop on Memory technology, Design and Testing, MTDT 2003
作者: Al-Ars, Zaid Van De Goor, Ad J. Section of Computer Engineering Faculty of Information Technology and Systems Delft University of Technology Mekelweg 4 Delft2628 CD Netherlands
The high complexity of the faulty behavior observed in DRAMs is caused primarily by the presence of internal floating nodes in defective DRAMs. This paper describes a new analysis method to apply electrical simulation... 详细信息
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A fault primitive based analysis of linked faults in RAMs
A fault primitive based analysis of linked faults in RAMs
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Records of the 2003 International Workshop on Memory technology, Design and Testing, MTDT 2003
作者: Al-Ars, Zaid Hamdioui, Said Van De Goor, Ad J. Delft University of Technology Faculty of Information Technology and Systems Computer Engineering Laboratory Mekelweg 4 Delft2628 CD Netherlands
Linked faults are very important for memory testing because they reduce the fault coverage of the tests. Their analysis has proven to be a source for new memory tests, characterized by an increased fault coverage for ... 详细信息
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Optimizing stresses for testing DRAM cell defects using electrical simulation
Optimizing stresses for testing DRAM cell defects using elec...
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Design, Automation and Test in Europe Conference and Exhibition, DATE 2003
作者: Al-Ars, Zaid Van De Goor, Ad J. Braun, Jens Richter, Detlev Faculty of Information Technology and Systems Section of Computer Engineering Delft University of Technology Mekelweg 4 2628 CD Delft Netherlands Infineon Technologies AG Product Engineering Group 2 Balanstr. 73 81541 Munich Germany
Stresses are considered an integral part of any modern industrial DRAM test. This paper describes a novel method to optimize stresses for memory testing, using defect injection and electrical simulation. The new metho... 详细信息
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Preface
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Lecture Notes in computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics) 2004年 3266卷 v-vii页
作者: Solé-Pareta, Josep Smirnov, Michael van Mieghem, Piet Domingo-Pascual, Jordi Monteiro, Edmundo Reichl, Peter Stiller, Burkhard Gibbens, Richard CataloniaBarcelona08034 Spain Fraunhofer FOKUS Kaiserin-Augusta-Allee 31 Berlin10589 Germany Delft University of Technology Faculty of Information Technology and Systems P.O. Box 5031 Delft2600 GA Netherlands University of Coimbra Department Computer Engineering POLO II Pinhal de Marrocos Coimbra3030 Portugal ForschungszentrumWien FTW Donau-City-Str. 1 Wien1220 Austria Computer Engineering and Networks Laboratory TIK ETH Zürich Gloriastrasse 35 ZürichCH-8092 Switzerland University of Federal Armed Forces Munich Information Systems Laboratory Werner-Heisenberg-Weg 39 Neubiberg85577 Germany Cambridge University Computer Laboratory 15 JJ Thomson Avenue CambridgeCB 3 0FD United Kingdom
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Database technology and industrial transaction techniques in control education  6
Database technology and industrial transaction techniques in...
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6th IFAC Symposium on Advances in Control Education, ACE 2003
作者: Flochova, Jana Galbavy, Miroslav Department of Automatic Control Systems Department of Computer Science Faculty of Electrical Engineering and Information Technology Slovak University of Technology Ilkovicova 3 Bratislava81219 Slovakia
New developments in computer networks and communications provide new possibilities for control purposes. Control systems for highly complex plants are themselves very complex and heterogeneous. A new software infrastr... 详细信息
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Consequences of RAM bitline twisting for test coverage
Consequences of RAM bitline twisting for test coverage
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Design, Automation and Test in Europe Conference and Exhibition, DATE 2003
作者: Schanstra, Ivo Van De Goor, Ad.J. Infineon Technologies AG Balanstrasse 73 D-81541 Munich Germany Delft University of Technology Department of Information Technology and Systems Section Computer Engineering Mekelweg 4 2628 CD Delft Netherlands
In order to reduce coupling effects between bitlines in static or dynamic RAMs bitline twisting can be used in the design. For testing, however, this has consequences for the to-be-used data backgrounds. A generic twi...
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