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检索条件"机构=Fraunhofer Research Institute of Optronics and Pattern Recognition"
98 条 记 录,以下是1-10 订阅
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IEEE T-BIOM Editorial Board Changes
IEEE Transactions on Biometrics, Behavior, and Identity Scie...
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IEEE Transactions on Biometrics, Behavior, and Identity Science 2024年 第1期7卷 1-2页
作者: Naser Damer Weihong Deng Jianjiang Feng Vishal M. Patel Ajita Rattani Mark Nixon Smart Living & Biometric Technologies Fraunhofer Institute for Computer Graphics Research IGD Darmstadt Germany Pattern Recognition and Intelligent System Laboratory Beijing University of Posts and Telecommunications Beijing China Department of Automation Tsinghua University Beijing China Department of Electrical and Computer Engineering Johns Hopkins University Baltimore MD USA Department of Computer Science and Engineering College of Engineering University of North Texas Denton TX USA
来源: 评论
Synthetic image rendering solves annotation problem in deep learning nanoparticle segmentation
arXiv
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arXiv 2020年
作者: Mill, Leonid Wolff, David Gerrits, Nele Philipp, Patrick Kling, Lasse Vollnhals, Florian Ignatenko, Andrew Jaremenko, Christian Huang, Yixing de Castro, Olivier Audinot, Jean-Nicolas Nelissen, Inge Wirtz, Tom Maier, Andreas Christiansen, Silke Institute of Optics Information and Photonics Friedrich-Alexander-University Erlangen-Nuremberg Erlangen Germany Pattern Recognition Lab Friedrich-Alexander-University Erlangen-Nuremberg Erlangen Germany Health Unit Flemish Institute for Technological Research Mol Belgium Institut für Nanotechnologie und korrelative Mikroskopie Forchheim Germany Advanced Instrumentation for Ion Nano-Analytics Materials Research and Technology Department Luxembourg Institute of Science and Technology Belvaux Luxembourg Physics Department Free University Berlin Germany Fraunhofer Institute for Ceramic Technologies and Systems Dresden Germany
Nanoparticles occur in various environments as a consequence of man-made processes, which raises concerns about their impact on the environment and human health. To allow for proper risk assessment, a precise and stat... 详细信息
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Correlative X-ray and electron tomography for scale-bridging, quantitative analysis of complex, hierarchical particle systems
Tomography of Materials and Structures
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Tomography of Materials and Structures 2025年
作者: Alexander Götz Fabian Lutter Dennis Simon Possart Daniel Augsburger Usman Arslan Sabrina Pechmann Carmen Rubach Moritz Buwen Umair Sultan Alexander Kichigin Johannes Böhmer Nora Vorlaufer Peter Suter Tor Hildebrand Matthias Thommes Peter Felfer Nicolas Vogel Katharina Breininger Silke Christiansen Benjamin Apeleo Zubiri Erdmann Spiecker Institute of Micro- and Nanostructure Research (IMN) & Center for Nanoanalysis and Electron Microscopy (CENEM) Friedrich-Alexander-Universität (FAU) Erlangen-Nürnberg IZNF Cauerstraße 3 Erlangen Germany Fraunhofer-Institute for Ceramic Technologies and Systems – Correlative Microscopy and Materials Data Äußere Nürnberger Straße 62 Forchheim Germany Professur für Informatik (Pattern Recognition) Center for AI and Data Science (CAIDAS) Julius-Maximilians-Universität Würzburg John-Skilton-Str. 4a Würzburg Germany Institute of Particle Technology Friedrich-Alexander-Universität (FAU) Erlangen-Nürnberg Cauerstraße 4 Erlangen Germany Institute for General Materials Properties MSEI Friedrich-Alexander-Universität (FAU) Erlangen-Nürnberg Martenstraße 5 Erlangen Germany Lucid Concepts AG Zürich Switzerland Institute of Separation Science and Technology Friedrich-Alexander-Universität (FAU) Erlangen-Nürnberg Egerlandstraße 3 Erlangen Germany
This study presents a comprehensive workflow for investigating particulate materials through combined 360° electron tomography (ET), nano-computed X-ray tomography (nanoCT), and micro-computed X-ray tomography (m... 详细信息
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Front Cover: Synthetic Image Rendering Solves Annotation Problem in Deep Learning Nanoparticle Segmentation (Small Methods 7/2021)
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Small Methods 2021年 第7期5卷
作者: Leonid Mill David Wolff Nele Gerrits Patrick Philipp Lasse Kling Florian Vollnhals Andrew Ignatenko Christian Jaremenko Yixing Huang Olivier De Castro Jean-Nicolas Audinot Inge Nelissen Tom Wirtz Andreas Maier Silke Christiansen Pattern Recognition Lab Friedrich-Alexander-University Erlangen-Nuremberg 91058 Erlangen Germany Institute of Optics Information and Photonics Friedrich-Alexander-University Erlangen-Nuremberg 91058 Erlangen Germany Institut für Nanotechnologie und korrelative Mikroskopie 91301 Forchheim Germany Health Unit Flemish Institute for Technological Research Mol 2400 Belgium Advanced Instrumentation for Ion Nano-Analytics Materials Research and Technology Department Luxembourg Institute of Science and Technology Belvaux L-4422 Luxembourg Physics Department Free University 14195 Berlin Germany Correlative Microscopy and Material Data Department Fraunhofer Institute for Ceramic Technologies and Systems 01277 Dresden Germany
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A modified version of StaMPS for the detection of localized surface displacement  8
A modified version of StaMPS for the detection of localized ...
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8th European Conference on Synthetic Aperture Radar, EUSAR 2010
作者: Alexander, Schunert Markus, Even Uwe, Sorgel Karsten, Schulz Institute of Photogrammetry and GeoInformation Leibniz University Hanover Germany Fraunhofer Research Institute for Optronics and Patter Recognition Ettlingen Germany
In the last decade the Persistent Scatterer (PS) technique became a valuable tool for the estimation of surface deformation from stacks of differential interferograms. In order to extract the deformation with reasonab... 详细信息
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Atmospheric phase screen-estimation for PSInSAR applied to TerraSAR-X high resolution spotlight-data
Atmospheric phase screen-estimation for PSInSAR applied to T...
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IEEE International Symposium on Geoscience and Remote Sensing (IGARSS)
作者: Markus Even Alexander Schunert Karsten Schulz Uwe Soergel Fraunhofer Research Institute of Optronics and Pattern Recognition Ettlingen Germany Institute of Photogrammetry and GeoInformation Leibniz Universität Hannover Germany
The PSInSAR technique, invented by Ferretti et. al. ten years ago, meanwhile has proven it's capability for very precise measurement of surface deformations. To achieve this, the influence of the atmospheric phase... 详细信息
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Detection and tracking of objects with direct integration of perception and expectation
Detection and tracking of objects with direct integration of...
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2009 IEEE 12th International Conference on Computer Vision Workshops, ICCV Workshops 2009
作者: Jüngling, Kai Arens, Michael Research Institute for Optronics and Pattern Recognition Ettlingen Germany
One of the main challenges in video-based multi-target tracking is the consistent maintenance of object identities over time. We present a novel approach to that challenge that integrates tracking and detection in a s... 详细信息
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Segmentation and Fusion of Building Features Based on InSAR and Optical Data
Segmentation and Fusion of Building Features Based on InSAR ...
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SPIE Conference on Remote Sensing for Environmental Monitoring, GIS Applications, and Geology IX
作者: Thiele, A. Wegner, J. D. Cadario, E. Schulz, K. Soergel, U. FGAN-Research Institute for Optronics and Pattern Recognition (Germany) Leibniz Univ. Hannover (Germany)
The new generation of space borne SAR sensors provides geometric resolution of one meter, airborne systems even higher. In this high resolution data many features of urban objects become visible, which were beyond the... 详细信息
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A new triangulation-based method for disparity estimation in image sequences
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16th Scandinavian Conference on Image Analysis, SCIA 2009
作者: Bulatov, Dimitri Wernerus, Peter Lang, Stefan Research Institute for Optronics and Pattern Recognition Gutleuthausstr. 1 76275 Ettlingen Germany
We give a simple and efficient algorithm for approximating computation of disparities in a pair of rectified frames of an image sequence. The algorithm consists of rendering a sparse set of correspondences, which are ... 详细信息
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Optical limiting performance of nanoparticles in liquid and solid media
Optical limiting performance of nanoparticles in liquid and ...
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Electro-Optical and Infrared Systems: Technology and Applications VI
作者: Dengler, S. Ritt, G. Eberle, B. FGAN-FOM Research Institute for Optronics and Pattern Recognition Gutleuthausstr. 1 76275 Ettlingen Germany
We present our investigation of the optical limiting behaviour of different metal and semiconductor nanoparticles in liquid and solid media. Nonlinear transmission measurements were performed by the use of nanosecond ... 详细信息
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