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检索条件"机构=Fraunhofer-Institute for Microelectronic Circuits and Systems"
285 条 记 录,以下是81-90 订阅
排序:
Post-CMOS integrated ALD 3D micro- And nanostructures and application for multi-electrode arrays  6
Post-CMOS integrated ALD 3D micro- And nanostructures and ap...
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6. GMM-Workshops Mikro-Nano-Integration - 6th GMM Workshop on Micro-Nano-Integration
作者: Jupe, A. Figge, M. Goehlich, A. Vogt, H. Fraunhofer Institute for Microelectronic Circuits and Systems Finkenstr. 61 Duisburg47057 Germany
The fraunhofer IMS has developed a new Post-CMOS process based on DRIE and ALD technique, which can be used for the production of 3D micro- and nanostructures. As an example of this technology multi-electrode arrays (... 详细信息
来源: 评论
High temperature GaN gate driver in SOI CMOS technology
High temperature GaN gate driver in SOI CMOS technology
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IMAPS International Conference and Exhibition on High Temperature Electronics, HiTEC 2016
作者: Kappert, Holger Braun, Sebastian Kordas, Norbert Dreiner, Stefan Kokozinski, Rainer Fraunhofer Institute for Microelectronic Circuits and Systems IMS Finkenstrasse 61 Duisburg47057 Germany
Power electronics is a rapidly developing application area for high temperature electronics. Wide bandgap semiconductors have intrinsic advantages for high temperature operation due to the large bandgap in comparison ... 详细信息
来源: 评论
Experimental reliability studies and SPICE simulation for EEPROM at temperatures up to 450°C
Experimental reliability studies and SPICE simulation for EE...
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作者: Kelberer, A. Dreiner, S. Grella, K. Dittrich, D. Kappert, H. Vogt, H. Paschen, U. Fraunhofer Institute for Microelectronic Circuits and Systems IMS Finkenstraße 61 Duisburg47057 Germany
This article presents reliability studies of single polysilicon electrically erasable programmable read-only memory (EEPROM) cells at temperatures from 50°C to 450°C. The technically challenging measurements... 详细信息
来源: 评论
Reproducibility of Photoplethysmography-Based Local Pulse Transit Time Measurement
Reproducibility of Photoplethysmography-Based Local Pulse Tr...
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Annual International Conference of the IEEE Engineering in Medicine and Biology Society
作者: Nils Beckmann Reinhard Viga Aysegul Dogangun Anton Grabmaier Department of Electronic Components and Circuits University of Duisburg-Essen Duisburg Germany Competence Center Personal Analytics University of Duisburg-Essen Duisburg Germany Department of Electronic Components and Circuits Fraunhofer Institute for Microelectronic Circuits and Systems Duisburg Germany
There are several previously published approaches of measuring local pulse transit time (PTT). One of these approaches is to use two optical sensors based on photoplethysmography (PPG). However, little information abo... 详细信息
来源: 评论
Time and frequency synchronization characteristics in rapid prototyping environments
Time and frequency synchronization characteristics in rapid ...
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European Conference on Smart Objects, systems and Technologies 2016, Smart SysTech 2016
作者: Schmidt, Philip Meyer, Stephan vom Bögel, Gerd Grabmaier, Anton Fraunhofer IMS Institute for Microelectronic Circuits and Systems Duisburg Germany Fraunhofer FKIE Institute for Communication Information Processing and Ergonomics Wachtberg Germany
This paper presents the transfer of a real-time testbed communication system, where the wireless measured bit error rate (BER) matches the theoretical one, into a Matlab-Simulink and GNURadio model. With this model we... 详细信息
来源: 评论
Implementation of an Integrated Differential Readout Circuit for Transistor-Based Physically Unclonable Functions
Implementation of an Integrated Differential Readout Circuit...
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Austrian Workshop on microelectronics (Austrochip)
作者: Benjamin Willsch Kai-Uwe Müller Qi Zhang Julia Hauser Stefan Dreiner Alexander Stanitzki Holger Kappert Rainer Kokozinski Holger Vogt Fraunhofer Institute for Microelectronic Circuits and Systems (IMS) Duisburg Germany Chinese Academy of Sciences Shanghai Institute of Micro-system and Information Technology Shanghai China University of Chinese Academy of Sciences Beijing China Department of Electronic Components and Circuits University of Duisburg-Essen Duisburg Germany
Physically Unclonable Functions (PUFs) offer enticing possibilities to incorporate hardware-based security on semiconductor device level. In order to make efficient use of PUF functionality in lightweight cryptographi... 详细信息
来源: 评论
Development of a low temperature SiC protection layer for post-CMOS MEMS fabrication utilizing vapour release technologies
Development of a low temperature SiC protection layer for po...
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Micro-Nano-Integration;6. GMM-Workshop
作者: Christian Walk Yizhou Chen Nino Vidovic Andreas Kuhl Michael Goertz Holger Vogt Fraunhofer Institute for Microelectronic Circuits and Systems
In post-CMOS processing a sufficient protection of the underlying CMOS structures, while applying sacrificial layer release technologies to realize free standing MEMS, is required. In this work, a low temperature Sili... 详细信息
来源: 评论
MoveHN-A database to support the development of motion based biosignal processing systems
MoveHN-A database to support the development of motion based...
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European Signal Processing Conference
作者: Andreas Kitzig Stefan Schroter Edwin Naroska Gudrun Stockmanns Reinhard Viga Anton Grabmaier Faculty of Electrical Engineering and Computer Science Ambient Intelligence Laboratory Krefeld Germany Universitat Duisburg-Essen Duisburg Nordrhein-Westfalen DE Department of Electronic Components and Circuits University of Duisburg-Essen Fraunhofer Institute for Microelectronic Circuits and Systems (IMS) Duisburg Germany
In the field of signal processing, pattern recognition and also modeling and simulation, it is often necessary to use large data sets. These allow reliable, independent and test case spanning development of algorithms... 详细信息
来源: 评论
Post-CMOS integrated ALD 3D micro- and nanostructures and application for multi-electrode arrays
Post-CMOS integrated ALD 3D micro- and nanostructures and ap...
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Micro-Nano-Integration;6. GMM-Workshop
作者: A. Jupe M. Figge A. Goehlich H. Vogt Fraunhofer Institute for Microelectronic Circuits and Systems
The fraunhofer IMS has developed a new Post-CMOS process based on DRIE and ALD technique, which can be used for the production of 3D micro- and nanostructures. As an example of this technology multi-electrode arrays (... 详细信息
来源: 评论
Development of a Post-CMOS Compatible Nanoporous Thin Film layer Based on Al2O3
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IOP Conference Series: Materials Science and Engineering 2018年 第1期350卷
作者: Ö Dogan A Buschhausen C Walk W Mokwa H Vogt Fraunhofer Institute for Microelectronic Circuits and Systems 47057 Duisburg Germany Department of Microelectronics University of Applied Sciences 40476 Düsseldorf Germany Department of Materials in Electrical Engineering 1 RWTH Aachen University 52074 Aachen Germany Department of Electronic Components and Circuits University of Duisburg-Essen 47057 Duisburg Germany
Porous alumina is a popular material with numerous application fields. A post-CMOS compatible process chain for the fabrication of nanoporous surface based on Al2O3 by atomic layer deposition (ALD) is presented. By al...
来源: 评论