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A CASE-STUDY OF SOFTWARE PROCESS IMPROVEMENT DURING DEVELOPMENT

IEEE TRANSACTIONS ON SOFTWARE ENGINEERING 1993年第12期19卷 1157-1170页

作者： BHANDARI, I HALLIDAY, M TARVER, E BROWN, D CHAAR, J CHILLAREGE, R IBM CORP MID HUDSON VALLEY PROGRAMMING LABWAPPINGERS FALLSNY 12590

We present a case study of the use of a software process improvement method which is based on the analysis of defect data. The first step of the method is the classification of software defects using attributes which relate defects to specific process activities. Such classification captures the semantics of the defects in a fashion which is useful for process correction. The second step utilizes a machine-assisted approach to data exploration which allows a project team to discover such knowledge from defect data as is useful for process correction. We show that such analysis of defect data can readily lead a project team to improve their process during development.

关键词： DATE EXPLORATION DEFECT-BASED PROCESS IMPROVEMENT IN-PROCESS METRICS KNOWLEDGE DISCOVERY

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ORTHOGONAL DEFECT CLASSIFICATION - A CONCEPT FOR IN-PROCESS MEASUREMENTS

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IEEE TRANSACTIONS ON SOFTWARE ENGINEERING 1992年第11期18卷 943-956页

作者： CHILLAREGE, R BHANDARI, IS CHAAR, JK HALLIDAY, MJ MOEBUS, DS RAY, BK WONG, MY IBM CORP MID HUDSON VALLEY PROGRAMMING LAB WAPPINGER FALLS NY USA

This paper describes orthogonal defect classification (ODC), a concept that enables in-process feedback to developers by extracting signatures on the development process from defects. The ideas are evolved from an earlier finding that demonstrates the use of semantic information from defects to extract cause-effect relationships in the development process. This finding is leveraged to develop a systematic framework for building measurement and analysis methods. This paper defines ODC and discusses the necessary and sufficient conditions required to provide feedback to a developer;illustrates the use of the defect type distribution to measure the progress of a product through a process;illustrates the use of the defect trigger distribution to evaluate the effectiveness and eventually the completeness of verification processes such as inspection or testing;provides sample results from pilot projects using ODC;opens the doors to a wide variety of analysis techniques for providing effective and fast feedback based on the concepts of ODC.

关键词： Orthogonal Defect Classification Software Development In Process Measurements Feedback Semantic Information Cause Effect Relationships Measurement And Analysis Methods Necessary And Sufficient Conditions Defect Trigger Distribution Completeness Verification Processes Inspection Testing Software Quality Software Reliability

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PERFORMANCE ANALYSIS OF A MULTIPLE-ACCESS RING NETWORK

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IEEE TRANSACTIONS ON COMMUNICATIONS 1993年第10期41卷 1494-1506页

作者： GHAFIR, HM SILIO, CB Department of Electrical Engineering University of Maryland College Park MD USA IBM Data Systems Division Mid-Hudson Valley Laboratory Poughkeepsie NY USA

We model delay-throughput performance of a class of multiple-access circuit-switched ring local area networks that allow multiple messages to be transferred concurrently on the ring. In particular, we model analytically the PLAYTHROUGH protocol under assumptions of uniform and symmetric traffic, infinite buffers and a first-in, first-out (FIFO) queueing discipline at each station so as to predict message mean waiting times that adequately approximate waiting times observed through simulation. The analysis views the queue at an arbitrary station as a M/G/1 vacation system having a Bernoulli schedule with parameter p, and derives expressions for the vacation duration and p in terms of service times and competing traffic intensities on PLAYTHROUGH rings. The vacation period is modeled as a series of subvacations because the server is allowed to take multiple subvacations when the queue is nonempty. Application of this modeling strategy is shown to provide good agreement between analytical predictions and simulation results. We also compare performance of this class of networks with that of token rings.

关键词： multiple access Queue STATIONS Servers Ring networks first-in first-out Token ring

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IN-PROCESS IMPROVEMENT THROUGH DEFECT DATA INTERPRETATION

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ibm SYSTEMS JOURNAL 1994年第1期33卷 182-214页

作者： BHANDARI, I HALLIDAY, MJ CHAAR, J CHILLAREGE, R JONES, K ATKINSON, JS LEPORICOSTELLO, C JASPER, PY TARVER, ED LEWIS, CC YONEZAWA, M IBM CORP PROGRAMMING LABSAN JOSECA 95193 IBM JAPAN LTD YAMAMOTO LABKANAGAWA 242JAPAN IBM CORP DIV LARGE SCALE COMPPOUGHKEEPSIENY 12601 IBM CORP TRANSACT PROC FACILPROGRAMMING LABPOUGHKEEPSIENY 12601 IBM CORP CANADA DEV LABN YORK M3C 1H7ONCANADA IBM CORP SANTA TERESA LABSAN JOSECA 95161 IBM CORP NETWORKING SYSTRES TRIANGLE PKNC 27709 IBM CORP MID HUDSON VALLEY PROGRAMMING LABPOUGHKEEPSIENY 12602

An approach that involves both automatic and human interpretation to correct the software production process during development is becoming important in ibm as a means to improve quality and productivity. A key step of the approach is the interpretation of defect data by the project team. This paper uses examples of such correction to evaluate and evolve the approach, and to inform and teach those who will use the approach in software development. The methodology is shown to benefit different kinds of projects beyond what can be achieved by current practices, and the collection of examples discussed represents the experiences of using a model of correction.

关键词： COMPUTER software development DEFECT correction methods (Numerical analysis)

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Software recreate problems estimated to range 10-20 percent: A case study on two operating system products 4

Software recreate problems estimated to range 10-20 percent:...

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4th International Symposium on Software Reliability Engineering, ISSRE 1993

作者： Chillarege, Ram Ray, Bonnie Garrigan, Al Ruth, Dave IBM Thomas J. Watson Research Center Yorktown HeightsNY United States Center for Applied Math and Statistics NJIT NewarkNJ United States IBM Mid-Hudson Valley Programming Lab PoughkeepsieNY United States

ISBN: (纸本)0818640103

Software recreates are necessitated due to inadequate diagnostic capability following a failure. They impact the service process and the perception of availability, but have never been adequately quantified. This paper develops a technique to make the key measurements of: percent recreate, arrival rate and open time, from problem service data without requiring any additional instrumentation. The study is conducted over an 18 month period on two operating system products, that are among the best in the industry for diagnosis and service. The results provide the first insight into the problem and some accurate baselines. © 1993 IEEE.

关键词： Software design

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Recovery/serviceability system test improvements for the ibm ES/9000 520 based models

Recovery/serviceability system test improvements for the IBM...

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International Symposium on Fault-Tolerant Computing (FTCS)

作者： A.C. Merenda E. Merenda Mid-Hudson Valley Laboratory IBM Poughkeepsie NY USA

To assist recovery and serviceability testing, the authors dramatically increased the amount of error injection hardware built into the logic of the ES/9000 520 based models. Compare circuits were incorporated into each functional element such that, under program control from either the processor controller or instructions executing on the processor, hardware malfunction conditions could be injected in any element. These hardware malfunctions could be synchronized to occur under a vast majority of the command and data transfer operations that occur during normal machine operation. Also, they combined recovery and serviceability system testing. In system testing, they verified recovery and serviceability with a single fault injection, halving the number of hardware fault injections required.< >

关键词： System testing Hardware Circuit faults Manufacturing Logic testing Computer errors Packaging machines Software packages Circuit testing Process control

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Post-process feedback with and without attribute focusing: a comparative evaluation

Post-process feedback with and without attribute focusing: a...

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International Conference on Software Engineering (ICSE)

作者： I. Bhandari N. Roth IBM Thomas J. Watson Research Center Yorktown Heights NY USA IBM Mid-Hudson Valley Programming Laboratory Poughkeepsie NY USA

Historically, the identification and correction of inadequacies in the process of software production called process feedback has been a difficult, time-consuming, manual exercise. Recently, a methodology for process feedback, called attribute focusing, has been developed. The authors compare post-process feedback with and without attribute focusing to determine how the methodology fares against current practice in post-process correction. Five project teams analyzed post-process defect data and made recommendations to improve the quality of a large operating systems product. That data was based on a multiple-choice questionnaire that was completed for every defect in a sample of defects that was chosen by each team. Subsequently, the same data was reanalyzed using attribute focusing. The comparison suggests attribute focusing can do at least as well or better than current practice in postprocess analysis, while reducing cost of analysis substantially.< >

关键词： Feedback Production Laboratories Costs Data analysis Operating systems Customer satisfaction

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Post-process feedback with and without attribute focusing: a comparative evaluation 93

Post-process feedback with and without attribute focusing: a...

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Proceedings of the 15th international conference on Software Engineering

作者： Inderpal Bhandari Norman Roth IBM T. J. Watson Research Center PO Box 704 Yorktown Heights NY IBM Mid-Hudson Valley Programming Laboratory PO Box 930 - Poughkeepsie NY

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ibm ES/9000 system architecture and hardware

IBM ES/9000 system architecture and hardware

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IEEE International Conference on Computer Design: VLSI in Computers and Processors, (ICCD)

作者： W.J. Nohilly V.T. Lund IBM Data Systems Division Mid-Hudson Valley Laboratory Poughkeepsie NY USA Technology Development IBM Data Systems Division Poughkeepsie NY USA

A description is given how ibm's Enterprise Systems requirements for data management are implemented in the ES/9000 process series. The ES/9000 processor family is the next step in efficient data movement/management for data that reside anywhere in the Enterprise. To manage this vast amount of data, certain high end ES/9000 models utilize four levels of memory (L1 or first level cache, L2 or second level buffer, L3 or main store and L4 or expanded store). Design trade-offs were made to improve processor availability. The processors have been designed to achieve fault tolerant function in power, processor and memory arrays. For example, if one of the power supplies fails, others increase their output to provide full power to the system. Extensive use is made of error detection/correction codes throughout the processor complex. Expanded storage incorporates a sophisticated error correction capability. All double bit errors are corrected, and triple bit errors, are detected.< >

关键词： Hardware Clocks Optical control Optical fibers Distributed computing Optical computing Optical fiber cables Synchronization Productivity Cryptography

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Software recreate problems estimated to range 10-20 percent: A case study on two operating system products

Software recreate problems estimated to range 10-20 percent:...

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International Symposium on Software Reliability Engineering (ISSRE)

作者： R. Chillarege B. Ray A. Garrigan D. Ruth IBM Thomas J. Watson Research Center Yorktown Heights NY USA Center for Applied Math and Statistics New Jersey Institute of Technology Newark NJ USA IBM Mid-Hudson Valley Programming Laboratory Poughkeepsie NY USA

关键词： Computer aided software engineering Operating systems Software measurement Availability Fault diagnosis Computer errors Size measurement Statistics Mathematical programming Time measurement

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