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检索条件"机构=Information and Computer systems in Automation"
856 条 记 录,以下是1-10 订阅
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Data-driven modeling of hysteresis in ReRAM devices: A multifactorial approach for enhanced memory performance  35
Data-driven modeling of hysteresis in ReRAM devices: A multi...
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35th GI-Workshop on Foundations of Database systems, GvDB 2024
作者: Zamankhani, Saba TU Ilmenau Department of Computer Science and Automation Databases and Information Systems Group Germany
Many physical systems in the real world exhibit complex behavior, making it difficult to identify their dynamics. To overcome this problem, prototypes are created to provide a better insight into the behavior of such ... 详细信息
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DCFNet:Discriminant Correlation Filters Network for Visual Tracking
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Journal of computer Science & Technology 2024年 第3期39卷 691-714页
作者: 胡卫明 王强 高晋 李兵 Stephen Maybank State Key Laboratory of Multimodal Artificial Intelligence Systems Institute of AutomationChinese Academy of Sciences Beijing 100190China Department of Computer Science and Information Systems Birkbeck CollegeLondon WC1E 7HXU.K.
CNN(convolutional neural network)based real time trackers usually do not carry out online network update in order to maintain rapid tracking *** inevitably influences the adaptability to changes in object *** filter b... 详细信息
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Data-driven output regulation control for constrained linear systems
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Science China(information Sciences) 2025年 第3期68卷 338-353页
作者: Chaoyu XIA Yi DONG Chaoli WANG Shengyuan XU Shanghai Research Institute for Intelligent Autonomous Systems Tongji University College of Electronic and Information Engineering Shanghai Research Institute for Intelligent Autonomous SystemsTongji University Department of Control Science and Engineering School of Optical-Electrical and Computer EngineeringUniversity of Shanghai for Science and Technology Department of Automation Nanjing University of Science and Technology
This study introduces a data-driven approach for state and output feedback control addressing the constrained output regulation problem in unknown linear discrete-time systems. Our method ensures effective tracking pe... 详细信息
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Towards NLP-driven Online-classification of Industrial Alarm Messages  50
Towards NLP-driven Online-classification of Industrial Alarm...
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50th Annual Conference of the IEEE Industrial Electronics Society, IECON 2024
作者: Shatewakasi, Yeersen Vogel-Heuser, Birgit Wilch, Jan Hankemeier, Victoria Höfgen, Josua Technical University of Munich Institute of Automation and Information Systems Garching Germany University of Münster Computer Science Department Autonomous Intelligent Systems Group Münster Germany
Industrial alarm systems facilitate the reliable and effective management of industrial process operations. However, the manufacturer’s fear of missing a critical fault or lacking process understanding may lead to th... 详细信息
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Modeling and Measurement of 3D Solenoid Inductor Based on Through-Silicon Vias
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Chinese Journal of Electronics 2023年 第2期32卷 365-374页
作者: YIN Xiangkun WANG Fengjuan ZHU Zhangming Vasilis F.Pavlidis LIU Xiaoxian LU Qijun LIU Yang YANG Yintang Shaanxi Key Lab.of Integrated Circuits and Systems School of Microelectronics Xidian University School of Automation and Information Engineering Xi'an University of Technique Department of Computer Science University of Manchester
Through-silicon via(TSV) provides vertical interconnectivity among the stacked dies in three-dimensional integrated circuits(3D ICs) and is a promising option to minimize 3D solenoid inductors for on-chip radio-freque... 详细信息
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Automating CPPSs Analyses with SysML v2 and Lingua Franca in the Context of Industry 4.0  50
Automating CPPSs Analyses with SysML v2 and Lingua Franca in...
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50th Annual Conference of the IEEE Industrial Electronics Society, IECON 2024
作者: Gaiardelli, Sebastiano Wilch, Jan Fummi, Franco Vogel-Heuser, Birgit Industrial Computer Engineering Laboratory Department of Engineering for Innovation Medicine University of Verona Italy Institute of Automation and Information Systems Technical University of Munich Germany
The design of manufacturing systems requires exploring diverse component configurations for one that best satisfies the requirements of the target system. At the same time, manufacturing systems evolve continuously, i... 详细信息
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Scheduling Bi-Objective Lot-Streaming Hybrid Flow Shops with Consistent Sublots via an Enhanced Artificial Bee Colony Algorithm
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Complex System Modeling and Simulation 2025年 第1期5卷 46-67页
作者: Lu, Benxue Gao, Kaizhou Duan, Peiyong Slowik, Adam School of Computer Science Liaocheng University Liaocheng252000 China Macau Institute of Systems Engineering Macau University of Science and Technology Macau999078 China School of Information and Automation Engineering Qilu University of Technology Jinan250353 China Koszalin University of Technology Department of Electronics and Computer Science Koszalin75-453 Poland
This work addresses bi-objective hybrid flow shop scheduling problems considering consistent sublots (Bi-HFSP_CS). The objectives are to minimize the makespan and total energy consumption. First, the Bi-HFSP_CS is for... 详细信息
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Towards a Test Framework for Reactive (Type 2) Asset Administration Shell Implementations  29
Towards a Test Framework for Reactive (Type 2) Asset Adminis...
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29th IEEE International Conference on Emerging Technologies and Factory automation, ETFA 2024
作者: Miny, Torben Heppner, Sebastian Garmaev, Igor Ristin, Marko Otto, Björn Braunisch, Nico Jacoby, Michael Kleinert, Tobias Van De Venn, Hans Wernher Wollschlaeger, Martin Information and Automation Systems Rwth Aachen University Aachen Germany Zurich Switzerland Institute for Automation and Communication Otto von Guericke University Magdeburg Germany Institute of Applied Computer Science Tu Dresden Dresden Germany Karlsruhe Germany
As Industrie 4.0 (I4.0) technologies continue to advance, ensuring the reliability and robustness of emerging standards like Asset Administration Shells (AAS) becomes paramount. This paper introduces a comprehensive t... 详细信息
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Methods of Reducing the Energy Consumption of Digital-Analog Converters and Increasing Their Metrological Reliability  17
Methods of Reducing the Energy Consumption of Digital-Analog...
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17th IEEE International Conference on Advanced Trends in Radioelectronics, Telecommunications and computer Engineering, TCSET 2024
作者: Zastavnyy, Oleg Kochan, Orest Bykovyy, Pavlo Sachenko, Anatoliy Kochan, Roman Kochan, Volodymyr West Ukrainian National University Department of Specialized Computer Systems Termopil Ukraine Lviv Polytechnic National University Department of Information and Measurement Technologies Automation and Metrology Lviv Ukraine West Ukrainian National University Department of Information Computer Systems and Control Termopil Ukraine Research Institute for Intelligent Computer Systems West Ukrainian National University Termopil Ukraine Kazimierz Pulaski University of Radom Department of Teleinformatics Radom Poland Lviv Polytechnic National University Department of Specialized Computer Systems Lviv Ukraine
This work analyzes the possibility of reducing the energy consumption of digital-to-analog converters by minimizing the energy consumption of the elements that ensure their operation. Due to the fact that such decisio... 详细信息
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An Intelligent Factory automation System with Multivariate Time Series Algorithm for Chip Probing Process
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IEEE Robotics and automation Letters 2023年 第9期8卷 5464-5471页
作者: Hsieh, Yu-Ming Lin, Chin-Yi Wilch, Jan Vogel-Heuser, Birgit Lin, Yu-Chen Lin, Yu-Chuan Hung, Min-Hsiung Cheng, Fan-Tien National Cheng Kung University Academy of Innovative Semiconductor and Sustainable Manufacturing Tainan701401 Taiwan National Cheng Kung University Institute of Manufacturing Information and Systems Tainan701401 Taiwan Technical University of Munich Institute of Automation and Information Systems Garching80333 Germany Chinese Culture University Department of Computer Science and Information Engineering Taipei11114 Taiwan
Chip-probing is the key process for IC manufacturing to its ensure quality. As the number of tests increases, the test quality and the test yield will be affected because the needles on the probe card of the tester wi... 详细信息
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