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CONCURRENT LARGE-SIGNAL SIMULATION OF AN ACTIVE MICROSTRIP ANTENNA

INTERNATIONAL JOURNAL OF NUMERICAL MODELLING-ELECTRONIC NETWORKS DEVICES AND FIELDS 1995年第1期8卷 3-12页

作者： MCDOWALL, DS FUSCO, VF High Frequency Electronics Laboratory. Department of Electrical and Electronic Engineering The Queen's University of Belfast Ashby Building Stranmillis Road Belfast BT9 5AH U.K. D. Stewart McDowall was born in Dublin Republic of Ireland in 1967. He received the M. Eng. degree in Electrical and Electronic Engineering from the Queen's University of Belfast in 1990. In the same year he was presented with a Distinction Award from the Departmnet of Education of Northern Ireland and he is currently pursuing his Ph.D. in the Microwave Research Group at Q.U.B. His principal research area is the electromagnetic field mapping of microwave systems using concurrent programming. He is an Associate Member of the Institute of Electrical Engineers. Vincent F. Fusco was educated at the Queens's University of Belfast where he obtained the degree of Ph.D. in 1982. He has worked as a research engineer on short-range radar and radio telemetry systems. Currently he is a reader in Microwave Communications in the School of Electrical engineering and Computer Science the Queen's University of Belfast. His current research interests include non-linear microwave circuit simulatino and concurrent programming techniques for electromagnetic field problems with particular emphasis on EMC applications. He has published numerous research papers in these areas. He is the author of the bookMicrowave Circuits Analysis and Computer Aided Design Prentice-Hall 1987. Dr Fusco is a Chartered Electrical Engineer and a Member of the Institute of Electrical Engineers.

This paper details the use of a circuit-based EM modelling technique combined with a harmonic balance simulator used to model the radiation from the microstrip bodies comprising an active antenna circuit. The modelling approach adopted for the planar bodies in the circuit will be shown to allow the use of concurrent algorithms in order to reduce overall computational time.

关键词： Microstrip antennas

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TOWARDS HIGHER QUALITY OF design AND TEST - PERSPECTIVES OF EBT TOOL INTEGRATION

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MICROELECTRONIC ENGINEERING 1994年第1-4期24卷 259-270页

作者： MULLERGLASER, KD WOLZ, W Institute of Information Processing Technical University of Karlsruhe Karlsruhe Engesserstr. 5 Germany Institute of Computer-Aided Circuit Design University of Erlangen-Nürnberg Erlangen Cauerstr. 6 Germany

At present, powerful support tools are under development that shall enhance diagnosability analysis during the design phase because the designer is the only one who is familiar with all the subtle problems of the design. Already available are the diagnosability and testability analysis in conjunction with CAD tools, functional test pattern generation from simulation data and the fault coverage analysis through fault simulation tools still under development are tools for automated fault localization in the case of non-functional silicon prototypes. Several chip manufacturers and independent Research institutes have carried out basic work on the development of design-to-test links between the design environment and hardware analysis tools (e.g. an electron beam tester) or on the integration of electron beam testers into VLSI test environments. Electron beam testing constitutes an important tool to enhance quality and reliability of circuits and systems - a major factor for continuous success on the market.

关键词： Integrated circuit testing

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RELIABLE EBT FINE POSITIONING USING CORRELATION-BASED WINDOW ADJUSTMENT

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MICROELECTRONIC ENGINEERING 1994年第1-4期24卷 155-162页

作者： SCHARF, R WOLZ, W MULLERGLASER, KD SEITZER, D Institute of Computer Aided Circuit Design University of Erlangen-Nürnberg Cauerstr. 6 D-91058 Erlangen Germany Institute of Information Processing University of Karlsruhe Karlsruhe Germany Fraunhofer-Institute of Integrated Circuits Erlangen Germany

A reliable approach for layout-based fine-positioning of an electron beam is presented. Precise fine positioning can be achieved using mispositioning factors derived from layout data in a given window. Consecutive layout window adjustment leads to an optimized observation window such that the mispositioning probability is minimized. To allow for on-line finepositioning, an algorithm has been developed which computes two-dimensional cross-correlation functions of two sets of line segments rather fast and is used for layout window adjustment as well as for pattern matching purposes. The algorithm is described, results and computation times are shown.

关键词： Electron beams

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An examination of feedback bridging faults in digital CMOS circuits

An examination of feedback bridging faults in digital CMOS c...

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IEEE International Symposium on circuits and Systems (ISCAS)

作者： B.K. Koch K.D. Muller-Glaser Institute of Computer Aided Circuit Design University Erlangen-Nuünberg Erlangen Germany

A new model for feedback bridging faults at the transistor level is presented. The model particularly considers the external connections of the feedback loop. Criteria for the occurrence of oscillations and storage effects are calculated, and the parameters relevant for their occurrence are given. The similarity between oscillation and storage is shown. The results are evaluated using HSPICE (simulation program with IC emphasis) and a standard cell library.< >

关键词： circuit faults CMOS digital integrated circuits Feedback circuits Semiconductor device modeling Inverters Electric resistance Threshold voltage circuit synthesis Libraries circuit simulation

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CAEin Requirements Definition and Specification for complex Microelectronic Systems

CAEin Requirements Definition and Specification for complex ...

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International Conference on VLSI design

作者： K.D. Muller-Glaser J. Bortolazzi Y. Tanurhan J. Ernst Institute of Computer Aided Circuit Design University Erlangen-Nuünberg Erlangen Germany

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Automated comparison of measured versus expected signals in mixed signal device testing and its effect on fault localization strategies

Automated comparison of measured versus expected signals in ...

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European Test Conference

作者： K. Helmreich M. Chowanetz W. Wolz R. Scharf K.D. Muller-Glaser Institute of Computer Aided Circuit Design University Erlangen-Nuünberg Erlangen Germany

The comparison of measured versus expected signals is the basic operation of any test process. It becomes a critical task especially when rather noisy contactless measurement techniques are employed for prototype debug and quality assurance purposes. The presentation describes ways of get most reasonable pass/fail decisions in the case of uncertainties.< >

关键词： Automatic testing Distortion measurement circuit testing Signal processing circuit faults Prototypes Error correction Quality assurance Semiconductor device measurement Integrated circuit measurements

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TLM MODELING USING AN SIMD computer

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INTERNATIONAL JOURNAL OF NUMERICAL MODELLING-ELECTRONIC NETWORKS DEVICES AND FIELDS 1993年第4期6卷 299-304页

作者： TAN, CC FUSCO, VF The Queen's University of Belfast Department of Electrical & Electronic Engineering Ashby Building Stranmillis Road Belfast BT9 5AH U.K. Chun Chia Tan obtained a first-class honours degree from The Queen's University of Belfast. He was awarded an IEE prize for best final-year project. His current research interests include the modelling of electromagnetic fields using parallel processing techniques. At present Mr Tan is working as an electrical engineer in Malaysia. Vincent F. Fusco was educated at The Queen's University of Belfast where he obtained the degree of Ph.D. He has worked as a research engineer on short-range radar and radio telementry systems. Currently he is a Reader in Microwave Commnications in the School of Electrical Engineering and Computer Science The Queen's Univeristy of Belfast. His current research interests include non-linear microwave circuit simulation and concurrent programming techniques for electromagnetic field problems. He has acted as consultant to a number of major companies and has published numerous research papers in these areas. He is author of the bookMicrowave Circuits Analysis and Computer Aided Design(Prentice Hall 1987). Dr Fusco is a Chartered Electrical Engineer and a Member of the Institute of Electrical Engineers.

A major limitation of the transmission-line matrix (TLM) method used to solve Maxwell's equations is the long computation time required. The TLM scattering calculations involved can, however, be viewed as parallel in nature. This paper describes an effort to reduce computational time by using an SIMD, DAP multiprocessor computer employed to solve a two-dimensional TLM electromagnetic field formulation. A parallel algorithm based on the TLM scattering algorithm is designed and implemented using FORTRAN-PLUS Enhanced on an AMT DAP 510 machine. Here the connectivity of the DAP is exploited to simulate the intrinsic scattering behaviour on which the TLM algorithm relies. The results show that parallel processing on an SIMD machine such as the DAP is advantageous, especially for higher-order mesh sizes.

关键词： Electric lines

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CONCURRENT BOUNDARY-ELEMENT COMPUTATION

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INTERNATIONAL JOURNAL OF NUMERICAL MODELLING-ELECTRONIC NETWORKS DEVICES AND FIELDS 1993年第2期6卷 83-98页

作者： MCDOWALL, DS LEE, TW FUSCO, VF Microwave Research Group Department of Electrical and Electronic Engineering The Queen's University of Belfast Ashby Building Stranmillis Road Belfast BT9 5AH Northern Ireland U.K. D. Stewart McDowall was born in Dublin epublic of Ireland in 1967. He received the M. Eng. degree in Electrical and Electronic Engineering from the Queen's University of Belfast in 1990. In the same year he was presented with a Distinction Award from the Department of Education of Northern Ireland and he is currently pursuing his Ph.D. in the Microwave Research Group at Q.U.B. His principal research area is the electromagnetic field mapping of microwave systems using concurrient programming. He is an Associate Member of the Institute of Electrical Engineers. Lee Thaim Wee was awarded the degree of B. Eng. in Electronics from the Queen's University of Belfast in July 1991. He is currently serving in the Malaysian Armed Forces. Vincent F. Fusco was educated at the Queen's Univeristy of Belfast where he obtained the degree of Ph.D. in 1982. He has worked as a research engineer on short-range radar and radio telementry systems. Currently he is a reader in Microwave Communications in the School of Electrical Engineering and Computer Science the Queen's Univeristy of Belfast. His current research interests include non-linear microwave circuit simulation and concurrent programming techniques for electromagnetic field problems with particular emphasis on EMC applications. He has published numerous research papers in these areas. He is the author of the bookMicrowave Circuits Analysis and Computer Aided Design Prentice-Hall 1987. Dr Fusco is a Chartered Electrical Engineer and a Member of the Institute of Electrical Engineers.

A major limitation of the boundary element method (BEM) for the solution of electrical potential problems is the long computational time required. However, a large portion of the calculations involved can be viewed as being parallel in nature and can therefore be computed concurrently. This paper makes an effort to increase the efficiency of the BEM process using transputer-based multiprocessor computing techniques. The algorithms developed may equally well be applied to any multiprocessor system. The application selected to demonstrate the technique is the solution of an electrostatic problem governed by a two-dimensional Laplace equation. A parallel algorithm for problem setup and field extraction using BEM is designed and implemented on a transputer array. Special attention is directed to the utilization of the parallel processors to achieve maximum efficiency. The analysis in this work concentrates on the communication strategies for passing data between processors as well as a consideration of the workload attributed to each processor. The parallel algorithms were implemented using 3L Parallel Fortran;however, the choice of topology for the overall BEM implementation was limited by the fact that certain parts of the algorithm could only utilize a pipeline configuration of processors. Comprehensive results for the parallel BEM algorithm are given and they are encouraging, indicating that parallel processing has much to offer when applied to the boundary element method.

关键词： Boundary element method

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INVESTIGATIONS ON CHIP-INTERNAL CURRENT CONTRAST IMAGING AND MEASUREMENT USING AN ELECTRON-BEAM TESTER

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MICROELECTRONIC ENGINEERING 1992年第1-4期16卷 173-182页

作者： HELMREICH, K NAGEL, P WOLZ, W MULLERGLASER, KD University of Erlangen-Nürnberg Institute of Computer Aided Circuit Design Wetterkreuz 13 8520 Erlangen Germany

Electron beam testers today have become an important tool for fault localization in integrated circuits. However, they allow for the measurement of chip-internal voltage signals only, whereas, in many cases, measurement access to chip-internal current signals would speed up the debug process a lot. Until now, no technique has been introduced that enables current measurements by means of an electron beam tester. The paper discusses different approaches for measuring currents with the electron beam probe. A completely novel imaging and measurement technique giving access to chip-internal current signals is proposed. The generic effects are discussed and calculated analytically. Numerical calculations for realistic measurement situations are presented as well as the results of first experimental investigations.

关键词： Electron Beams

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DRC-BASED SELECTION OF OPTIMAL PROBING POINTS FOR CHIP-INTERNAL MEASUREMENTS

DRC-BASED SELECTION OF OPTIMAL PROBING POINTS FOR CHIP-INTER...

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1992 INTERNATIONAL TEST CONF ON DISCOVER THE NEW WORLD OF TEST AND design

作者： SCHARF, R KUNTZSCH, C HELMREICH, K WOLZ, W MULLERGLASER, KD University of Erlangen-Numberg Institute of Computer-Aided Circuit Design Wetterkreuz 13 Erlangen D-W8520 Germany

ISBN: (纸本)0780307607

This paper introduces a new method for the selection of optinuxl probing points in chip-internal e-beam testing by applying a set ofprobingpoint selection rules to the complete area of the desired wire. Conznzvrcially available design rule check (DRC) tools are used to perform the required topological operations. For easy adaption to different technologies, a rule definition language hus been developed to allow forthedefinition ofrules independent of the utilized DRCtool. Theyrobingpointselection is such thut loculfield eflects, crosstalk and circuit structure influences are nzininzized. © 1992 IEEE.

关键词： Area measurement circuit synthesis circuit testing Crosstalk Electron beams Guidelines Integrated circuit measurements Passivation Semiconductor device measurement Wire

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