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检索条件"机构=Institute of Microelectronics and Key Laboratory of Microelectronics Devices and Circuits"
1615 条 记 录,以下是1391-1400 订阅
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A clock and data recovery circuit for 3.125Gb/s RapidIO SerDes
A clock and data recovery circuit for 3.125Gb/s RapidIO SerD...
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IEEE Conference on Electron devices and Solid-State circuits
作者: Zhao Zhihui Wang Yuan Zhao Junlei Yang Hailing Jia Song Key Laboratory of Microelectronic Devices and Circuits Institute of Microelectronics Peking University Beijing China
This work presents a low-power low-cost CDR design for RapidIO SerDes. The design is based on phase interpolator, which is controlled by a synthesized standard cell digital block. Half-rate architecture is adopted to ... 详细信息
来源: 评论
Cascade 2–2 sigma-delta modulators for wideband high-resolution applications
Cascade 2–2 sigma-delta modulators for wideband high-resolu...
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Asia Pacific Conference on Postgraduate Research in microelectronics & Electronics (PrimeAsia)
作者: Hongyi Li Yuan Wang Song Jia Xing Zhang Key Laboratory of Microelectronic Devices and Circuits Institute of Microelectronics Peking University Beijing China
In this paper, several techniques which relax circuit requirements of building blocks are presented to effectively realize wideband high-resolution cascade sigma-delta modulator. Three cascade structures have been pro... 详细信息
来源: 评论
Study of LDMOS-SCR: A High Voltage ESD Protection Device
Study of LDMOS-SCR: A High Voltage ESD Protection Device
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2010 10th IEEE International Conference on Solid-State and Integrated Circuit Technology(第十届固态和集成电路技术国际会议 ICSICT-2010)
作者: Peng Zhang Yuan Wang Song Jia Xing Zhang Key Laboratory of Microelectronic Devices and Circuits Institute of Microelectronics Peking University Beijing 100871 China
A novel LDMOS-SCR device for electrostatic discharge protection of power device is presented. The device is able to be fabricated in SOI 40V LDMOS process without any extra mask. Due to the new structure, a proper and... 详细信息
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Predictive Modeling of Capacitance and Resistance in Gate-all-around Cylindrical Nanowire MOSFETs for Parasitic Design Optimization
Predictive Modeling of Capacitance and Resistance in Gate-al...
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2010 10th IEEE International Conference on Solid-State and Integrated Circuit Technology(第十届固态和集成电路技术国际会议 ICSICT-2010)
作者: Qiumin Xu Jibin Zou Jieyin Luo Runsheng Wang Ru Huang Key Laboratory of Microelectronic Devices and Circuits Institute of Microelectronics Peking University Beijing 100871 China
This paper presents a predictive electrostatic capacitance and resistance compact model of multiple gate MOSFET with cylindrical conducting channels, taking into account parasitic effects, quantum confinement and quas... 详细信息
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Impacts of Diameter-Dependent Annealing on S/D Extension Random Dopant Fluctuations in Silicon Nanowire MOSFETs
Impacts of Diameter-Dependent Annealing on S/D Extension Ran...
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2010 10th IEEE International Conference on Solid-State and Integrated Circuit Technology(第十届固态和集成电路技术国际会议 ICSICT-2010)
作者: Tao Yu Runsheng Wang Wei Ding Ru Huang Key Laboratory of Microelectronic Devices and Circuits Institute of Microelectronics Peking University Beijing 100871 China
In this paper, the impacts of diameter-dependent annealing (DDA) effect on nanowire S/D extension random dopant fluctuations (SDE-RDF) in silicon nanowire MOSFETs (SNWTs) are investigated, in terms of electrostatic pr... 详细信息
来源: 评论
Dummy Poly Silicon Gate Removal by Wet Chemical Etching
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ECS Transactions 2011年 第1期34卷
作者: Tao Young Huaxiang Yin Qiuxia Xu Chao Zhao Jun Feng Li Dapeng Chen Key Laboratory of Microelectronics Devices & Integrated Technology Chinese Academy of Sciences No.3 Bei-Tu-Cheng West Road Beijing Beijing 100029 China Integrated Circuit Advanced Process Center Institute of Microelectronics Chinese Academy of Sciences No. 3 Bei-Tu-Cheng West Road Beijing Beijing 100029 China Integrated Circuit Advanced Process Center Institute of Microelectronics Chinese Academy of Sciences Institute of Microelectronics Chinese Academy of Sciences
For the gate last integration scheme, dummy poly silicon gate removal is one of the indispensable processes either for a high-k first or a high-k last route. In this paper, experimental results of dummy poly silicon g...
来源: 评论
Pulse Voltage Dependent Resistive Switching Behaviors of HfO2-Based RRAM
Pulse Voltage Dependent Resistive Switching Behaviors of HfO...
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2010 10th IEEE International Conference on Solid-State and Integrated Circuit Technology(第十届固态和集成电路技术国际会议 ICSICT-2010)
作者: Bin Gao Bing Chen Yuansha Chen Lifeng Liu Xiaoyan Liu Ruqi Han Jinfeng Kang Institute of Microelectronics Peking University & Key Laboratory of Microelectronic Devices and Circuits Ministry of Education Beijing 100871 China
Voltage pulse dependent resistive switching behavior during SET process in HfO2-based RRAM device is investigated. When a resistor is connected in series to RRAM during the SET process, the resistance uniformity can b... 详细信息
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Influence of boundary force on the performance of gate-all-around Ge (110) NW FETs with HfO2 gate insulator
Influence of boundary force on the performance of gate-all-a...
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IEEE International Nanoelectronics Conference (INEC)
作者: Honghua Xu Xiaoyan Liu Gang Du Yuhui He Chun Fan Ruqi Han Jinfeng Kang Institute of Microelectronics Key Laboratory of Microelectronic Devices and Circuits Ministry of Education Peking University Beijing China Institute of Microelectronics Peking University Beijing China Key Laboratory of Nanofabrication and Novel Devices Integration Technology Institute of Microelectronics Chinese Academy and Sciences Beijing China Computer Center Peking University Beijing China
We calculate valence band structures and transport property of HfO 2 gate dielectric surrounded Ge (110) nanowire with a radial force at the boundary of the insulator. The radial force pushes the valence subbands dow... 详细信息
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Design consideration of multi-band RF CMOS filter based on active inductors
Design consideration of multi-band RF CMOS filter based on a...
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2010 Academic Symposium on Optoelectronics and microelectronics Technology and 10th Chinese-Russian Symposium on Laser Physics and Laser Technology, RCSLPLT/ASOT 2010
作者: Gao, Zhiqiang Xu, Honglin Zhang, Zhongzhao Lan, Jinbao Microelectronics Center of HIT Harbin Institute of Technology Harbin City 150080 China Harbin Institute of Technology School of Electronics and Information Engineering Harbin City 150080 China National Key Laboratory of Analog Integrated Circuits Sichuan Institute of Solid State Circuits Chongqing City 40060 China
In this paper, topology of gyrator-C active inductors are briefly reviewed. A novel structure of multi-band RF active inductor using transistors is presented. Issues of the active inductor related to stability, Q-enha... 详细信息
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"Spontaneous electrolysis" and simultaneously assembly hierarchy nanostructures of copper tetracyanoquinodimethane
"Spontaneous electrolysis" and simultaneously assembly hiera...
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作者: Ji, Zhuoyu Li, Hongxiang Liu, Yaling Hu, Wenping Liu, Ming Beijing National Laboratory of Molecular Sciences Institute of Chemistry Chinese Academy of Sciences Beijing 100080 China Key Laboratory of Nano-Fabrication and Novel Devices Integrated Technology Institute of Microelectronics Chinese Academy of Sciences Beijing 100029 China
A simple method was developed to generate nanolamellas of CuTCNQ based on the principle of "spontaneous electrolysis". The nanolamellas were identified to belong to phase I of CuTCNQ. Intermediate products b... 详细信息
来源: 评论