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检索条件"机构=Institute of Microelectronics and Key Laboratory of Microelectronics Devices and Circuits"
1643 条 记 录,以下是181-190 订阅
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Investigation of Electrical Characteristics on Morphotropic Phase Boundary of Hf1-xZrxO2 for Dynamic Random Access Memories
Investigation of Electrical Characteristics on Morphotropic ...
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China Semiconductor Technology International Conference (CSTIC)
作者: Kun Zhong Huaxiang Yin Zhaohao Zhang Fan Zhang Key Laboratory of Microelectronics Devices and Integrated Technology Institute of Microelectronics of Chinese Academy of Sciences Beijing China School of Integrated Circuits University of Chinese Academy of Sciences Beijing China Xidian University Key Laboratory of Wide Bandgap Semiconductor Materials
This paper investigates the properties of different Zr compositions in $\mathrm{H}\mathrm{f}_{1-\mathrm{x}}\mathrm{Z}\mathrm{r}_{\mathrm{x}}\mathrm{O}_{2}$ films. Due to the morphotropic phase boundary (MPB) between t...
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An AuNPs/Mesoporous NiO/Nickel Foam Nanocomposite as a Miniaturized Electrode for Heavy Metal Detection in Groundwater
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Engineering 2023年 第8期27卷 199-208页
作者: Boyuan Xue Qian Yang Kaidong Xia Zhihong Li George Y.Chen Dayi Zhang Xiaohong Zhou State Key Joint Laboratory of Environment Simulation and Pollution Control School of EnvironmentTsinghua UniversityBeijing 100084China National Key Laboratory of Science and Technology on Micro/Nano Fabrication Institute of MicroelectronicsPeking UniversityBeijing 100871China Shenzhen Key Laboratory of Photonic Devices and Sensing Systems for Internet of Things Guangdong and Hong Kong Joint Research Centre for Optical Fiber SensorsShenzhen UniversityShenzhen 518060China College of New Energy and Environment Jilin UniversityChangchun 130021China The Research Institute of Environmental Innovation(Suzhou) Tsinghua UniversitySuzhou 215000China
Heavy metals,notably Pb2+and Cu^(2+),are some of the most persistent contaminants found in *** monitoring of these metals,which relies on efficient,sensitive,cost-effective,and reliable methods,is a *** present a nano... 详细信息
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Effective gate length model for asymmetrical gate-all-around silicon nanowire transistors
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Science China(Information Sciences) 2020年 第10期63卷 288-290页
作者: Xiaoqiao DONG Ming LI Wanrong ZHANG Yuancheng YANG Gong CHEN Shuang SUN Jianing WANG Xiaoyan XU Xia AN Key Laboratory of Microelectronic Devices and Circuits Institute of MicroelectronicsPeking University Faculty of Information Technology Beijing University of Technology
Dear editor,With the development of VLSI technology,gateall-around (GAA) silicon nano wire transistor(SNWT) has emerged as one of the most potential candidates for ultimately scaled CMOS devices at the end of the tech... 详细信息
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A novel active-passive protection strategy endows carbonyl iron with excellent intelligent anti-corrosion and microwave absorption dual functional characteristics
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Nano Research 2025年 第1期18卷 487-500页
作者: Wei Tian Quanyuan Feng Linbo Zhang Yinfan Liu Xian Jian Longjiang Deng Institute of Microelectronics School of Information Science and TechnologySouthwest Jiaotong UniversityChengdu 611756China National Engineering Researching Centre of Electromagnetic Radiation Control Materials Key Laboratory of Multi-Spectral Absorbing Materials and Structures of Ministry of EducationState Key Laboratory of Electronic Thin Films and Integrated DevicesSchool of Electronic Science and EngineeringUniversity of Electronic Science and Technology of ChinaChengdu 611731China School of Materials and Energy University of Electronic Science and Technology of ChinaChengdu 611731China The Yangtze Delta Region Institute(Huzhou)&School of Electronic Science and Engineering University of Electronic Science and Technology of ChinaHuzhou 313001China
Carbonyl iron absorbers(CI)face significant challenges in practical applications,such as corrosion,interface bonding failure,detachment,and high maintenance ***,we have developed intelligent self-healing technology ba... 详细信息
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Influence of Back Gate Bias on the Hot Carrier Reliability of DSOI nMOSFET
Influence of Back Gate Bias on the Hot Carrier Reliability o...
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Annual International Symposium on Reliability Physics
作者: Xinyi Zhang Kewei Wang Fang Wang Jiangjiang Li Zhicheng Wu Duoli Li Bo Li Jianhui Bu Zhengsheng Han Institute of Microelectronics of Chinese Academy of Sciences Beijing China University of Chinese Academy of Sciences Beijing China Key Laboratory of Science and Technology on Silicon Devices Chinese Academy of Sciences Beijing China State key Lab of Fabrication Technologies for Integrated Circuits Institute of Microelectronics Chinese Academy of Sciences Beijing China Laboratory of Microelectronics Devices and Integrated Technology Institute of Microelectronics Chinese Academy of Sciences Beijing China
The hot carrier reliability under different back-gate bias in DSOI nMOSFET is studied. Reverse back-gate bias results in an over-all larger time exponents than the forward back-gate bias, which is attributed to the in... 详细信息
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Flash-based in-memory computing for stochastic computing in image edge detection
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Journal of Semiconductors 2023年 第5期44卷 145-149页
作者: Zhaohui Sun Yang Feng Peng Guo Zheng Dong Junyu Zhang Jing Liu Xuepeng Zhan Jixuan Wu Jiezhi Chen School of Information Science and Engineering(ISE) Shandong UniversityQingdao 266000China Shandong Sinochip Semiconductors Co.Ltd Jinan 250101China Neumem Co. LtdHefei 230088China Key Laboratory of Microelectronic Devices and Integrated Technology Institute of Microelectronics of Chinese Academy of SciencesBeijing 100029China
The“memory wall”of traditional von Neumann computing systems severely restricts the efficiency of data-intensive task execution,while in-memory computing(IMC)architecture is a promising approach to breaking the *** ... 详细信息
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Arbitrary hue-brightness structural colors with high saturation generated by anisotropic metasurfaces
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Photonics Research 2025年 第3期13卷 772-780页
作者: CHONG WANG HE LI LONGJIE LI XIAO SHANG SHENGQIONG CHEN HUIWEN XUE PEIWEN ZHANG JIEBIN NIU YONGLIANG ZHANG LINA SHI State Key Laboratory of Fabrication Technologies for Integrated Circuits Institute of MicroelectronicsChinese Academy of SciencesBeijing 100029China University of Chinese Academy of Sciences Beijing 100049China Department of Electronic and Optical Engineering Space Engineering UniversityBeijing 101416China State Key Laboratory of Semiconductor Physics and Chip Technologies Institute of SemiconductorsChinese Academy of SciencesBeijing 100083China
Structural colors have always attracted much attention due to important applications in display devices,imaging security certification,optical data storage,and so *** brightness of structure colors,as the carrier of c... 详细信息
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Recent advances in two-dimensional layered and non-layered materials hybrid heterostructures
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Chinese Physics B 2022年 第10期31卷 231-246页
作者: Haixin Ma Yanhui Xing Boyao Cui Jun Han Binghui Wang Zhongming Zeng Key Laboratory of Opto-electronics Technology Ministry of EducationCollege of MicroelectronicsBeijing University of TechnologyBeijing 100124China Key Laboratory of Nanodevices and Applications Suzhou Institute of Nano-tech and Nano-bionicsChinese Academy of SciencesSuzhou 215123China Nanchang Nano-Devices and Technologies Division Suzhou Institute of Nano-Tech and Nano-BionicsChinese Academy of SciencesNanchang 330200China
With the development of Moore's law, the future trend of devices will inevitably be shrinking and integration to further achieve size reduction. The emergence of new two-dimensional non-layered materials(2DNLMs) n... 详细信息
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Multitarget gas alarm system for high-performance and anti-interference chemical warfare agents simulants detection
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Science China(Technological Sciences) 2025年 第3期68卷 349-358页
作者: Yubin YUAN Qiang WU Menglong JIAO Haiyang WU Weihua LIU Xuming WANG Xiangrui BU Gong LI Chuanyu HAN Long HU Xin LI Xiaoli WANG Shool of Microelectronics School of Electronics and Information EngineeringXi’an Jiaotong UniversityXi’an710049China The Key Lab of Micro-nano Electronics and System Integration of Xi’an City Xi’an710049China Hangzhou Institute for Advanced Study University of Chinese Academy of SciencesHangzhou310024China School of Automation and Information Engineering Xi’an University of TechnologyXi’an710048China Key Laboratory for Physical Electronics and Devices of the Ministry of Education Xi’an Jiaotong UniversityXi’an710049China School of Science Xi’an Jiaotong UniversityXi’an710049China
Chemical warfare agents(CWAs)can cause significant harm to health and even death in a very short time even when inhaled in small amounts(~100 mg min/m^(3)).Detection equipment based on conventional techniques,includin... 详细信息
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Three-Dimensional Manifold Microchannel Integrated Heat Sink for High-Performance Computing Chips
Three-Dimensional Manifold Microchannel Integrated Heat Sink...
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Electronics Packaging Technology Conference (EPTC)
作者: Guoran Lu Yuxin Ye Cheng Li Binbin Jiao Yanmei Kong Ruiwen Liu Institute of Microelectronics of the Chinese Academy of Science Beijing China University of Chinese Academy of Science Beijing China Key Laboratory of Fabrication Technologies for Integrated Circuits Chinese Academy of Sciences Beijing Microelectronics Technology Institute
Generative AI, exemplified by ChatGPT, places heightened demands on the computational power of high-performance computing (HPC) chips, leading to an increase in power consumption. Conventional indirect cooling is limi... 详细信息
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