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检索条件"机构=Institute of Microelectronnics and Key Laboratory of Microelectronics Devices and Circuits"
422 条 记 录,以下是401-410 订阅
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Resistive Switching Behaviors and Mechanism of Transition Metal Oxides-Based Memory devices
Resistive Switching Behaviors and Mechanism of Transition Me...
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2008 9th International Conference on Solid-State and Integrated-Circuit Technology
作者: J.F.Kang B.Sun B.Gao N.Xu X.Sun L.F.Liu Y.Wang X.Y.Liu R.Q.Han Y.Y.Wang Institute of Microelectronics Peking University & Key Laboratory of Microelectronic Devices and CircuitsMinistry of Education
In this paper,the characteristics and mechanism of the transition metal oxide(TMO) based resistive switching memory(RRAM) devices were addressed. The results show that doping in oxide matrix materials, electrode mater... 详细信息
来源: 评论
Structure and magnetic properties of Co-doped TiO2 nanotubes by aqueous solution method
Structure and magnetic properties of Co-doped TiO2 nanotubes...
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International Conference on Solid-State and Integrated Circuit Technology
作者: A-bo Zheng Yan Li Yi Wang Lei Sun Li-feng Liu De-dong Han Jin-feng Kang Xing Zhang Ru-qi Han Key Laboratory of Microelectronic Devices and Circuits Institute of Microelectronics Peking University Beijing China
The Co-doped titanium dioxide nanotubes were synthesized via the aqueous solution reaction. After hydrogenation, room temperature ferromagnetism (RTFM) was found in the cobalt doped titanium dioxide nanotubes at 300 K... 详细信息
来源: 评论
Fabrication and characteristics of ZnO-based thin film transistors
Fabrication and characteristics of ZnO-based thin film trans...
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International Conference on Solid-State and Integrated Circuit Technology
作者: Dedong Han Yi Wang Shengdong Zhang Lei Sun Jinfeng Kang Xiaoyan Liu Gang Du Lifeng Liu Ruqi Han Key Laboratory of Microelectronic Devices and Circuits Institute of Microelectronics Peking University Beijing China
ZnO-based thin-film transistors (TFT) have been fabricated on p-Si (100) substrates by radio frequency (rf) magnetron sputtering at room temperature with a bottom gate configuration. The XRD and SEM show that ZnO film... 详细信息
来源: 评论
A dual loop dual VCO CMOS PLL using a novel coarse tuning technique for DTV
A dual loop dual VCO CMOS PLL using a novel coarse tuning te...
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International Conference on Solid-State and Integrated Circuit Technology
作者: Congyin Shi Huaizhou Yang Huiling Xiao Junhua Liu Huailin Liao Key Laboratory of Microelectronic Devices and Circuits Institute of Microelectronics Peking University Beijing China
A CMOS phase-locked loop (PLL) which synthesizes frequencies between 474 and 858 MHz in steps of 1 MHz and settles in less than 180 ¿s is presented. This PLL can be implemented as a sub-circuit for a frequency sy... 详细信息
来源: 评论
Recovery Characteristics of NBTI of pMOSFETs with Oxynitride Dielectrics Under Drain Bias
Recovery Characteristics of NBTI of pMOSFETs with Oxynitride...
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2008 9th International Conference on Solid-State and Integrated-Circuit Technology
作者: Jiaqi Yang Junyan Pan Lihua Huang Xiaoyan Liu Ruqi Han and Jinfeng Kang L.F.Zhang Z.W.Zhu C.C.Liao H.M.Wu Key Laboratory of Microelectronic Devices and Circuits Institute of MicroelectronicsPeking University Semiconductor Manufacturing International Corporation
In this paper,the recovery characteristics of negative bias temperature instability(NBTI) of pMOSFETs under drain bias were *** is observed that,the drain bias not only worsens the NBTI degradation in high |V| regio... 详细信息
来源: 评论
An Acquisition Circuit in Global Positioning System Receivers
An Acquisition Circuit in Global Positioning System Receiver...
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2008 9th International Conference on Solid-State and Integrated-Circuit Technology
作者: Xiaoxin Cui Chungan Peng Key Laboratory of Microelectronic Devices and Circuits Institute of MicroelectronicsPeking University Institute of Beijing Remote Sensing Information
The conventional matched filter structures are investigated in this paper,An acquisition circuit based on the polyphase form matched filter in Global Positioning System(GPS) receiver is *** the cost of less hardware r... 详细信息
来源: 评论
A Low-Voltage Voltage Doubler without Body Effect
A Low-Voltage Voltage Doubler without Body Effect
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2008 9th International Conference on Solid-State and Integrated-Circuit Technology
作者: Ming Li Li-Wu Yang Jinfeng Kang Yangyuan Wang Key Laboratory of Microelectronic Devices and Circuits Institute of MicroelectronicsPeking University Semiconductor Manufacturing International Corporation
<正>A voltage doubler,which avoids body effect and then improves rise time and efficiency even with 1V power supply,is *** art is designed for word line boosting,using 0.18um EEPROM *** only the voltage doubler can ... 详细信息
来源: 评论
Resistive switching behaviors and mechanism of transition metal oxides-based memory devices
Resistive switching behaviors and mechanism of transition me...
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International Conference on Solid-State and Integrated Circuit Technology
作者: J. F. Kang B. Sun B. Gao N. Xu X. Sun L. F. Liu Y. Wang X. Y. Liu R. Q. Han Y.Y. Wang Institute of Microelectronics Ministry of Education Peking University and Key Laboratory of Microelectronic Devices and Circuits Beijing China
In this paper, the characteristics and mechanism of the transition metal oxide (TMO) based resistive switching memory (RRAM) devices were addressed. The results show that doping in oxide matrix materials, electrode ma... 详细信息
来源: 评论
3-D Simulation of Geometrical Variations Impact on Nanoscale FinFETs
3-D Simulation of Geometrical Variations Impact on Nanoscale...
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2008 9th International Conference on Solid-State and Integrated-Circuit Technology
作者: Shimeng Yu Yuning Zhao Yuncheng Song Gang Du Jinfeng Kang Ruqi Han Xiaoyan Liu Key Laboratory of Microelectronic Devices and Circuits Institute of MicroelectronicsPeking University Shenzhen Graduate School Peking University
Intra-die fluctuations in the nanoscale CMOS technology emerge inherently to geometrical variations such as line edge roughness(LER) and oxide thickness fluctuations (OTF).A full 3-D statistical simulation is presente... 详细信息
来源: 评论
Simulation of Charge Trapping Memory with Novel Structures
Simulation of Charge Trapping Memory with Novel Structures
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2008 9th International Conference on Solid-State and Integrated-Circuit Technology
作者: X.Y.Liu Y.C.Song Gang Du R.Q Han Z.L.Xia D.Kim K-H Lee Key Laboratory of Microelectronic Devices and Circuits Institute of MicroelectronicsPeking University Samsung Electronics Co.Ltd
<正>Ⅰ.Introduction Flash memories are one of the basic building blocks of today’s electronic *** floating gate type of Flash memory is impossible to scale down to beyond 45nm due to the difficulty in scaling the t...
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