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检索条件"机构=Intel - Assembly and Test Technology Development"
122 条 记 录,以下是101-110 订阅
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Minimum error bounded efficient 1 tracker with occlusion detection
Minimum error bounded efficient 1 tracker with occlusion det...
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作者: Mei, Xue Ling, Haibin Wu, Yi Blasch, Erik Bai, Li Assembly Test Technology Development Intel Corporation Chandler AZ United States Center for Information Science and Technology Computer and Information Science Department Temple University Philadelphia PA United States College of Computer and Software Nanjing University of Information Science and Technology Nanjing 210044 China Air Force Research Lab SNAA OH United States Electrical and Computer Engineering Department Temple University Philadelphia PA United States
Recently, sparse representation has been applied to visual tracking to find the target with the minimum reconstruction error from the target template subspace. Though effective, these L1 trackers require high computat... 详细信息
来源: 评论
Minimum error bounded efficient ℓ1 tracker with occlusion detection
Minimum error bounded efficient ℓ1 tracker with occlusion d...
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Conference on Computer Vision and Pattern Recognition (CVPR)
作者: Xue Mei Haibin Ling Yi Wu Erik Blasch Li Bai Assembly Test Technology Development Intel Corporation Chandler AZ USA University of Maryland College Park USA Center of Information Science & Technology Computer & Information Science Department Temple University Philadelphia PA USA College of Computer and Software Nanjing University of Information Science and Technology Nanjing China Air Force Research Laboratory SNAA OH USA Electrical and Computer Engineering Department Temple University Philadelphia PA USA
Recently, sparse representation has been applied to visual tracking to find the target with the minimum reconstruction error from the target template subspace. Though effective, these L1 trackers require high computat... 详细信息
来源: 评论
A case study of multi-chip package signal and power integrity optimization and tradeoff
A case study of multi-chip package signal and power integrit...
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DesignCon 2010
作者: Ji, Steven Warner, Ethan Guo, Yan Kandasamy, Aruljothi Heinemann, Erich Liu, Bowen Karunan, Anoop Ji, Gang Intel Corporation United States Physical and Electrical Design Team Assembly Test and Technology Development Group Intel Corporation United States
Package design optimization is a big challenge to microprocessor designs due to increasing design complexity. This paper presents signal and power integrity learning on mobile multi- chip-package design and validation... 详细信息
来源: 评论
Electrical evaluation of power- Grid configurations
Electrical evaluation of power- Grid configurations
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DesignCon 2010
作者: Bharath, Krishna Suryakumar, Mahadevan Sarangi, Ananda Taylor, Greg Intel Corporation United States Advance Design Team Assembly Test Technology Development Group Intel Chandler AZ United States
Scaling of transistor geometries has been the primary mechanism to support the exponential increase in microprocessor performance over generations. However, the metal interconnect and bump pitch have not scaled at the... 详细信息
来源: 评论
Underfill Cure Induced Micro-Anomaly (CIMA) And Its Mechanism and Reliability Implications
Underfill Cure Induced Micro-Anomaly (CIMA) And Its Mechanis...
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2010 11th International Conference on Electronic Packaging technology & High Density Packaging(2010 电子封装技术与高密度封装国际会议)
作者: Jieping Zhang Marcus Hsu Saikumar Jayaraman Assembly and Test Technology Development Intel Corporation Chandler AZ
Cure Induced Micro-Anomaly (CIMA) are worm like hollow microstructures found within resin rich region of underfill after curing within a BGA package with combination of copper die bumps and Sn-Ag substrate bumps. CIMA... 详细信息
来源: 评论
Effects of Bump Metallurgies, Underfill Material and its Cure Process on Package Warpage
Effects of Bump Metallurgies, Underfill Material and its Cur...
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2010 11th International Conference on Electronic Packaging technology & High Density Packaging(2010 电子封装技术与高密度封装国际会议)
作者: Jieping Zhang Dongwen Gan Jinlin Wang Jayaraman Saikumar Li-Hsin Chang Assembly & Test Technology Development Intel Corporation Chandler Arizona 85226 USA
Excessive warpage in flip-chip packages would raise concerns of process stability and reliability as well as customer acceptance concerns, making it critical to understand the thermal-mechanical mechanism of package w... 详细信息
来源: 评论
Mm-wave rectangular slot loop antenna array for broad spatial coverage
Mm-wave rectangular slot loop antenna array for broad spatia...
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Antennas and Propagation Society International Symposium
作者: Helen K. Pan Bryce D. Horine Kranti K. Tantwai Intel Laboratory Intel Corporation Hillsboro OR USA Assembly Test and Technology Development Intel Corporation India
In this paper, a planar rectangular slot loop antenna is proposed that provides unique radiation pattern with broad beam pattern tilting toward the side. Other than typical broadside or endfire antenna array, the beam... 详细信息
来源: 评论
Cooling performance of piezoelectric fan in notebook system
Cooling performance of piezoelectric fan in notebook system
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34th International Electronics Manufacturing technology Conference, IEMT 2010
作者: Kar Mun, Ng Sauciuc, Ioan Wada, Hiroaki Tanaka, Nobuhira Intel Asia-Pacific Research and Development Ltd. Shanghai Zizhu Science Park No. 880 Zi Xing Road Shanghai 20041 China Assembly and Test Technology Development Intel Corporation 5000 W. Chandler Blvd Arizona United States Murata Manufacturing Company Ltd. 1-10-1 Higashikotari Nagaokakyo-shi Kyoto 617-8555 Japan
Thin form factor and high computing performance are the inevitable trend of notebook industry. Both vectors impose more stringent challenge on thermal solution design to maintain internal components and external chass... 详细信息
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Cooling performance of piezoelectric fan in notebook system
Cooling performance of piezoelectric fan in notebook system
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IEEE/CHMT(CPMT) International Electronics Manufacturing technology Symposium
作者: Ng Kar Mun Ioan Sauciuc Hiroaki Wada Nobuhira Tanaka Intel Asia-Pacific Research & Development Ltd. No. 880 Zi Xing Road Shanghai Zizhu Science Park 20041 China Assembly & Test Technology Development Chandler Arizona Murata Manufacturing Company Ltd. Kyoto Japan
Thin form factor and high computing performance are the inevitable trend of notebook industry. Both vectors impose more stringent challenge on thermal solution design to maintain internal components and external chass... 详细信息
来源: 评论
A compact 802.11 a/b/g/n WLAN Front-End Module using passives embedded in a flip-chip BGA organic package substrate
A compact 802.11 a/b/g/n WLAN Front-End Module using passive...
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Microwave, MTT-S International Symposium
作者: Telesphor Kamgaing Emile Davies-Venn Kaladhar Radhakrishnan Components Research Intel Corporation Chandler AZ USA Assembly and Test Technology Development Intel Corporation Chandler AZ USA
This paper discusses the design and implementation of a compact RF front-end-module for 802.11 a/b/g/n application. A high performance embedded passives technology has been developed by extending existing multilayer F... 详细信息
来源: 评论