This paper proposes a novel face recognition algorithm inspired by the selective attention of Human Visual System (HVS). We record four observers' eye movements when they are viewing 100 FRGC [1] frontal view face...
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Stencil computations are core of wide range of scientific and engineering applications. A lot of efforts have been put into improving efficiency of stencil calculations on different platforms, but unfortunately it is ...
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Stencil computations are core of wide range of scientific and engineering applications. A lot of efforts have been put into improving efficiency of stencil calculations on different platforms, but unfortunately it is not easy to reuse. In this paper we present a PAttern-Driven Stencil compiler-based tool and a simple tuning system to reuse those well optimized methods and codes. We also suggest extensions to OpenMP, depicting high-level data structures in order to facilitate recognition of various stencil computation patterns. The PADS allows programmers to rewrite kernel of stencils or reuse source-to-source translator outputs as optimized stencil template codes with related tuning parameters, In addition, PADS consists of a OpenMP to CUDA translator and code generator using optimized template codes. It also obtains architecture-specific parameters to tune stencils across different GPU platforms. To demonstrate our system flexibility and performance portability, we illustrate four different stencil computations, Laplacian operator with Jacobi iterative method, divergence operator, 3 dimension 25 point stencil and a 2D heat equation using ADI method with periodic boundary conditions. PADS succeeds in generating all these four stencil codes using different optimization strategies and delivers a promising performance improvement.
This work presents a method to detect the size and location of tumor in soft tissues using ultrasound. Quantitative ultrasound is utilized to allow an ultrasound signal to be sent from a transmitter to multiple receiv...
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Rough set theory proposed by Pawlak, is a complementary generalization of classical set theory. The relations between rough sets and algebraic systems endowed with two binary operations such as rings, groups and semig...
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This paper addresses the problem of evaluating a heavy load of subscribed queries (or simply multi-queries) over compressed XML data in a distributed service-oriented DaaS (Database as a Service) environment. We propo...
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Coverage model is the main technique to evaluate the thoroughness of dynamic verification of a Design-under-Verification (DUV). However, rather than achieving a high coverage, the essential purpose of verification is ...
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Coverage model is the main technique to evaluate the thoroughness of dynamic verification of a Design-under-Verification (DUV). However, rather than achieving a high coverage, the essential purpose of verification is to expose as many bugs as possible. In this paper, we propose a novel verification methodology that leverages the early bug prediction of a DUV to guide and assess related verification process. To be specific, this methodology utilizes predictive models built upon artificial neural networks (ANNs), which is capable of modeling the relationship between the high-level attributes of a design and its associated bug information. To evaluate the performance of constructed predictive model, we conduct experiments on some open source projects. Moreover, we demonstrate the usability and effectiveness of our proposed methodology via elaborating experiences from our industrial practices. Finally, discussions on the application of our methodology are presented.
As the feature size of FPGA shrinks to nanometers, soft errors increasingly become an important concern for SRAM-based FPGAs. Without consideration of the application level impact, existing reliability-oriented placem...
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As the feature size of FPGA shrinks to nanometers, soft errors increasingly become an important concern for SRAM-based FPGAs. Without consideration of the application level impact, existing reliability-oriented placement and routing approaches analyze soft error rate (SER) only at the physical level, consequently completing the design with suboptimal soft error mitigation. Our analysis shows that the statistical variation of the application level factor is significant. Hence in this work, we first propose a cube-based analysis to efficiently and accurately evaluate the application level factor. And then we propose a cross-layer optimized placement and routing algorithm to reduce the SER by incorporating the application level and the physical level factor together. Experimental results show that, the average difference of the application level factor between our cube-based method and Monte Carlo golden simulation is less than 0.01. Moreover, compared with the baseline VPR placement and routing technique, the cross-layer optimized placement and routing algorithm can reduce the SER by 14% with no area and performance overhead.
The limitation of the existing methods of traffic data collection is that they rely on techniques that are strictly local in nature. The airborne system in unmanned aircrafts provides the advantages of wider view angl...
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Scan chain design is a widely used design-for-testability(DFT) technique to improve test and diagnosis qualityHowever, failures on scan chain itself account for up to 30% of chip failuresTo diagnose root causes of sca...
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Scan chain design is a widely used design-for-testability(DFT) technique to improve test and diagnosis qualityHowever, failures on scan chain itself account for up to 30% of chip failuresTo diagnose root causes of scan chain failures in a short period is vital to failure analysis process and yield improvementsAs the conventional diagnosis process usually runs on the faulty free scan chain, scan chain faults may disable the diagnostic process, leaving large failure area to time-consuming failure analysisIn this paper, a SAT-based technique is proposed to generate patterns to diagnose scan chain faultsThe proposed work can efficiently generate high quality diagnostic patterns to achieve high diagnosis resolutionMoreover, the computation overhead of proving equivalent faults is reducedExperimental results on ISCAS'89 benchmark circuits show that the proposed method can reduce the number of diagnostic patterns while achieving high diagnosis resolution.
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