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Extendable pattern-oriented optimization directives

Extendable pattern-oriented optimization directives

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作者： Cui, Huimin Xue, Jingling Wang, Lei Yang, Yang Feng, Xiaobing Fan, Dongrui Key Laboratory of Computer System and Architecture Chinese Academy of Sciences Institute of Computing Technology Beijing China School of Computer Science and Engineering University of New South Wales Sydney NSW Australia

Algorithm-specific, that is, semantic-specific optimizations have been observed to bring significant performance gains, especially for a diverse set of multi/many-core architectures. However, current programming models and compiler technologies for the state-of-the-art architectures do not exploit well these performance opportunities. In this article, we propose a pattern-making methodology that enables algorithm-specific optimizations to be encapsulated into "optimization patterns". Such optimization patterns are expressed in terms of preprocessor directives so that simple annotations can result in significant performance improvements. To validate this new methodology, a framework, named EPOD, is developed to map these directives into the underlying optimization schemes for a particular architecture. It is difficult to create an exact performance model to determine an optimal or near-optimal optimization scheme (including which optimizations to apply and in which order) for a specific application, due to the complexity of applications and architectures. However, it is trackable to build individual optimization components and let compiler developers synthesize an optimization scheme from these components. Therefore, our EPOD framework provides an Optimization Programming Interface (OPI) for compiler developers to define new optimization schemes. Thus, new patterns can be integrated into EPOD in a flexible manner. We have identified and implemented a number of optimization patterns for three representative computer platforms. Our experimental results show that a pattern-guided compiler can outperform the state-of-theart compilers and even achieve performance as competitive as hand-tuned code. Therefore, such a patternmaking methodology represents an encouraging direction for domain experts' experience and knowledge to be integrated into general-purpose compilers. © 2012 ACM.

关键词： Semantics

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Software-Based Self-Testing of Processors Using Expanded Instructions

Software-Based Self-Testing of Processors Using Expanded Ins...

引用

2010 19th IEEE Asian Test Symposium(第19届IEEE亚洲测试技术学术会议 ATS 2010)

作者： Ying Zhang Xiaowei Li Huawei Li Key Laboratory of Computer System and Architecture Institute of Computing Technology Chinese Acade Key Laboratory of Computer System and Architecture Institute of Computing Technology Chinese Acade

In this paper, an automatic test instruction generation (ATIG) technique using expanded instructions is presented for software-based selftesting (SBST) of processors. First, mappings between expanded instructions and signals are obtained through data mining, and they are used to impose value ranges of expanded instructions on component signals and generate instruction-level constraints. Second, virtual circuits are established based on the instruction-level constraints, and test patterns are generated for the constrained components. Third, test patterns are translated into test instructions according to the values of controlling signals and constraints for their mappings to instructions, and an SBST program is produced after assembling the test instructions. Experimental results on the Parwan processor show that the proposed ATIG technique can achieve 94.8％ stuck-at fault coverage, which is close to that of the full-scan test generation method. In addition, it can cut down 57％ test volume of the previous random pattern generation based SBST technique, while the test time reduces to one thirteenth of the previous SBST technique.

关键词： Software-Based Self-Test Automatic Test Instruction Generation Instruction-Level Constraint On-Line Test

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Fault Tolerance Mechanism in Chip Many-Core Processors

Fault Tolerance Mechanism in Chip Many-Core Processors

引用

第十二届全国容错计算学术会议

作者： ZHANG Lei HAN Yinhe LI Huawei LI Xiaowei Key Laboratory of Computer System and Architecture Institute of Computing TechnologyChinese Academy Key Laboratory of Computer System and Architecture Institute of Computing TechnologyChinese Academy

As semiconductor technology advances, there will be billions of transistors on a single chip. Chip many-core processors are emerging to take advantage of these greater transistor densities to deliver greater performance. Effective fault tolerance techniques are essential to improve the yield of such complex chips. In this paper, a core-level redundancy scheme called N+M is proposed to improve N-core processors'yield by providing M spare cores. In such architecture, topology is an important factor because it greatly affects the processors'performance. The concept of logical topology and a topology reconfiguration problem are introduced, which is able to transparently provide target topology with lowest performance degradation as the presence of faulty cores on-chip. A row rippling and column stealing (RRCS) algorithm is also proposed. Results show that PRCS can give solutions with average 13.8％ degradation with negligible computing time.

关键词： chip many-core processors yield fault tolerance reconfiguration network-on-chip

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On Selection of Testable Paths with Specified Lengths for Faster-Than-At-Speed Testing

On Selection of Testable Paths with Specified Lengths for Fa...

引用

2010 19th IEEE Asian Test Symposium(第19届IEEE亚洲测试技术学术会议 ATS 2010)

作者： Xiang Fu Xiaowei Li Huawei Li Key Laboratory of Computer System and Architecture Institute of Computing Technology Chinese Acade Key Laboratory of Computer System and Architecture Institute of Computing Technology Chinese Acade

Faster than at-speed testing provides an effective way to detect small delay defects (SDDs). It requires test patterns to be delicately classified into groups according to the delay of sensitized paths. Each group of patterns is applied at certain frequency. In this paper, we propose to generate tests for faster than at-speed testing using path delay fault (PDF) model and single path sensitization criterion. An effective path selection and grouping method is introduced, which could quickly and accurately identify paths whose delay falls into a given delay span. Several techniques are used to improve the efficiency of the testable path selection procedure. Experimental results on ISCAS'89 benchmark circuits show that the proposed method could achieve high transition fault coverage and high test quality of SDDs with low CPU time.

关键词： faster-than at-speed testing testable path selection small delay defect

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An Efficient Algorithm for Finding a Universal Set of Testable Long Paths

An Efficient Algorithm for Finding a Universal Set of Testab...

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2010 19th IEEE Asian Test Symposium(第19届IEEE亚洲测试技术学术会议 ATS 2010)

作者： Zijian He Tao Lv Xiaowei Li Huawei Li Key Laboratory of Computer System and Architecture Institute of Computing Technology Chinese Academ Key Laboratory of Computer System and Architecture Institute of Computing Technology Chinese Academ

In this paper, we focus on generation of a universal path candidate set V that contains testable long paths for delay testing. Some strategies are presented to speed up the depth first search procedure of U generation, targeting the reduction of sensitization criteria checking times. Experimental results illustrate that our approach achieves an 8X speedup on average in comparison with the traditional depth first search approach.

关键词： delay testing testable long paths

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Online Distributed Fault Detection of Sensor Measurements

Online Distributed Fault Detection of Sensor Measurements

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第十二届全国容错计算学术会议

作者： GAO Jianliang XU Yongjun LI Xiaowei Key Laboratory of Computer System and Architecture Institute of Computing TechnologyChinese Academy Key Laboratory of Computer System and Architecture Institute of Computing TechnologyChinese Academy

In wireless sensor networks (WSNs), a faulty sensor may produce incorrect data and transmit them to the other sensors. This would consume the limited energy and bandwidth of WSNs. Furthermore, the base station may make inappropriate decisions when it receives the incorrect data sent by the faulty sensors. To solve these problems, this paper develops an online distributed algorithm to detect such faults by exploring the weighted majority vote scheme. Considering the spatial correlations in WSNs, a faulty sensor can diagnose itself through utilizing the spatial and time information provided by its neighbor sensors. Simulation results show that even when as many as 30％ of the sensors are faulty, over 95％ of faults can be correctly detected with our algorithm. These results indicate that the proposed algorithm has excellent performance in detecting fault of sensor measurements in WSNs.

关键词： wireless sensor networks fault diagnosis fault detection fault tolerance spatial correlation

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On-the-fly Reduction of Stimuli for Functional Verification

On-the-fly Reduction of Stimuli for Functional Verification

引用

2010 19th IEEE Asian Test Symposium(第19届IEEE亚洲测试技术学术会议 ATS 2010)

作者： Qi Guo Weiwu Hu Tianshi Chen Haihua Shen Yunji Chen Key Laboratory of Computer System and Architecture Institute of Computing Technology Chinese Acade Key Laboratory of Computer System and Architecture Institute of Computing Technology Chinese Acade

As a primary method for functional verification of microprocessors, simulation-based verification has received extensive studies over the last decade. Most investigations have been dedicated to the generation of stimuli (test cases), while relatively few has focused on explicitly reducing the redundant stimuli among the generated ones. In this paper, we propose an on-the-fly approach for reducing the stimuli redundancy based on machine learning techniques, which can learn from new knowledge in every cycle of simulation-based verification. Our approach can be easily embedded in traditional framework of simulation-based functional verification, and the experiments on an industrial microprocessor have validated that the approach is effective and efficient.

关键词： Functional Verification Stimuli Reduction Redundancy Online Learning Godson-2

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CREA: A Checkpoint Based Reliable Micro-architecture for Superscalar Processors

CREA: A Checkpoint Based Reliable Micro-architecture for Sup...

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The 16th Asian Test Symposium(第十六届亚洲测试学术会议)

作者： Shijian Zhang Weiwu Hu Key Laboratory of Computer System and Architecture Institute of Computing Technology Chinese Acade Key Laboratory of Computer System and Architecture Institute of Computing Technology Chinese Acade

Conventional temporal redundant techniques to detect transient faults have resulted in considerable performance loss. One major reason for this problem is the reclamation of some critical resources, such as the instruction window and physical registers, is delayed, which degrades instruction-level parallelism. This paper proposes a novel fault- tolerant micro-architecture based on checkpoint mechanism. All occupied resources are reclaimed during the retirement stage in the first execution. Therefore, the performance overhead is mitigated evidently. Our scheme requires only small hardware cost and provides short fault detection latency.

关键词： Registers Fault detection Retirement Hardware Costs Delay Pipelines Buffer storage Redundancy Yarn

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Frequency Analysis Method for Propagation of Transient Errors in Combinational Logic

Frequency Analysis Method for Propagation of Transient Error...

引用

The 16th Asian Test Symposium(第十六届亚洲测试学术会议)

作者： Shaohua Lei Yinhe Han Xiaowei Li Key Laboratory of Computer System and Architecture Institute of Computing Technology Chinese Acade Key Laboratory of Computer System and Architecture Institute of Computing Technology Chinese Acade

The continuous development of VLSI technology is shrinking the minimal sizes to nanometer region, making circuits more susceptible to transient error. In this paper, we present a frequency analysis method to accurately estimate the possible propagation of transient fault-due glitches through a CMOS combinational circuit. We use the frequency feature of signal and frequency response of electrical system to analyze the propagation of transient error. Experiments show that on average, our approach provides approximately 95％ accuracy and several orders of magnitude faster with respect to HSPICE simulation.

关键词： Transient analysis Frequency estimation CMOS logic circuits Very large scale integration CMOS technology Circuit faults Combinational circuits Frequency response Signal analysis Circuit simulation

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An efficient and flexible task management for many cores

An efficient and flexible task management for many cores

引用

作者： Yuan, Nan Yu, Lei Fan, Dong-Rui Key Laboratory of Computer System and Architecture Institute of Computing Technology Chinese Academy of Sciences Beijing 100190 China Graduate University of Chinese Academy of Sciences Beijing 100039 China

ISBN: (纸本)9783642245671

This paper presents the design and implementation of a runtime system (named "GodRunner") on Godson-T many-core processor to support task-level parallelism efficiently and flexibly. GodRunner abstracts underlying hardware resource, providing ease-of-use programming interface. A two-grade task management mechanism is proposed to support both coarse-grained and fine-grained multithreading efficiently. Two load-balanced scheduling policies are combined flexibly in GodRunner. The software-controlled task management makes GodRunner more configurable and extensible than hard-wired ones. The experiment shows that the tasking overhead in GodRunner is as small as hundreds of cycles, which is about the hundreds of times faster than the conventional Pthread based multithreading on a SMP machine. Furthermore, our approach scales well and supports fine-grained tasks as small as 20k cycles optimally. © 2011 Springer-Verlag Berlin Heidelberg.

关键词： computer architecture

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