Algorithm-specific, that is, semantic-specific optimizations have been observed to bring significant performance gains, especially for a diverse set of multi/many-core architectures. However, current programming model...
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In this paper, an automatic test instruction generation (ATIG) technique using expanded instructions is presented for software-based selftesting (SBST) of processors. First, mappings between expanded instructions and ...
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In this paper, an automatic test instruction generation (ATIG) technique using expanded instructions is presented for software-based selftesting (SBST) of processors. First, mappings between expanded instructions and signals are obtained through data mining, and they are used to impose value ranges of expanded instructions on component signals and generate instruction-level constraints. Second, virtual circuits are established based on the instruction-level constraints, and test patterns are generated for the constrained components. Third, test patterns are translated into test instructions according to the values of controlling signals and constraints for their mappings to instructions, and an SBST program is produced after assembling the test instructions. Experimental results on the Parwan processor show that the proposed ATIG technique can achieve 94.8% stuck-at fault coverage, which is close to that of the full-scan test generation method. In addition, it can cut down 57% test volume of the previous random pattern generation based SBST technique, while the test time reduces to one thirteenth of the previous SBST technique.
As semiconductor technology advances, there will be billions of transistors on a single chip. Chip many-core processors are emerging to take advantage of these greater transistor densities to deliver greater performan...
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As semiconductor technology advances, there will be billions of transistors on a single chip. Chip many-core processors are emerging to take advantage of these greater transistor densities to deliver greater performance. Effective fault tolerance techniques are essential to improve the yield of such complex chips. In this paper, a core-level redundancy scheme called N+M is proposed to improve N-core processors'yield by providing M spare cores. In such architecture, topology is an important factor because it greatly affects the processors'performance. The concept of logical topology and a topology reconfiguration problem are introduced, which is able to transparently provide target topology with lowest performance degradation as the presence of faulty cores on-chip. A row rippling and column stealing (RRCS) algorithm is also proposed. Results show that PRCS can give solutions with average 13.8% degradation with negligible computing time.
Faster than at-speed testing provides an effective way to detect small delay defects (SDDs). It requires test patterns to be delicately classified into groups according to the delay of sensitized paths. Each group of ...
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Faster than at-speed testing provides an effective way to detect small delay defects (SDDs). It requires test patterns to be delicately classified into groups according to the delay of sensitized paths. Each group of patterns is applied at certain frequency. In this paper, we propose to generate tests for faster than at-speed testing using path delay fault (PDF) model and single path sensitization criterion. An effective path selection and grouping method is introduced, which could quickly and accurately identify paths whose delay falls into a given delay span. Several techniques are used to improve the efficiency of the testable path selection procedure. Experimental results on ISCAS'89 benchmark circuits show that the proposed method could achieve high transition fault coverage and high test quality of SDDs with low CPU time.
In this paper, we focus on generation of a universal path candidate set V that contains testable long paths for delay testing. Some strategies are presented to speed up the depth first search procedure of U generation...
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In this paper, we focus on generation of a universal path candidate set V that contains testable long paths for delay testing. Some strategies are presented to speed up the depth first search procedure of U generation, targeting the reduction of sensitization criteria checking times. Experimental results illustrate that our approach achieves an 8X speedup on average in comparison with the traditional depth first search approach.
In wireless sensor networks (WSNs), a faulty sensor may produce incorrect data and transmit them to the other sensors. This would consume the limited energy and bandwidth of WSNs. Furthermore, the base station may mak...
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In wireless sensor networks (WSNs), a faulty sensor may produce incorrect data and transmit them to the other sensors. This would consume the limited energy and bandwidth of WSNs. Furthermore, the base station may make inappropriate decisions when it receives the incorrect data sent by the faulty sensors. To solve these problems, this paper develops an online distributed algorithm to detect such faults by exploring the weighted majority vote scheme. Considering the spatial correlations in WSNs, a faulty sensor can diagnose itself through utilizing the spatial and time information provided by its neighbor sensors. Simulation results show that even when as many as 30% of the sensors are faulty, over 95% of faults can be correctly detected with our algorithm. These results indicate that the proposed algorithm has excellent performance in detecting fault of sensor measurements in WSNs.
As a primary method for functional verification of microprocessors, simulation-based verification has received extensive studies over the last decade. Most investigations have been dedicated to the generation of stimu...
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As a primary method for functional verification of microprocessors, simulation-based verification has received extensive studies over the last decade. Most investigations have been dedicated to the generation of stimuli (test cases), while relatively few has focused on explicitly reducing the redundant stimuli among the generated ones. In this paper, we propose an on-the-fly approach for reducing the stimuli redundancy based on machine learning techniques, which can learn from new knowledge in every cycle of simulation-based verification. Our approach can be easily embedded in traditional framework of simulation-based functional verification, and the experiments on an industrial microprocessor have validated that the approach is effective and efficient.
Conventional temporal redundant techniques to detect transient faults have resulted in considerable performance loss. One major reason for this problem is the reclamation of some critical resources, such as the in...
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Conventional temporal redundant techniques to detect transient faults have resulted in considerable performance loss. One major reason for this problem is the reclamation of some critical resources, such as the instruction window and physical registers, is delayed, which degrades instruction-level parallelism. This paper proposes a novel fault- tolerant micro-architecture based on checkpoint mechanism. All occupied resources are reclaimed during the retirement stage in the first execution. Therefore, the performance overhead is mitigated evidently. Our scheme requires only small hardware cost and provides short fault detection latency.
The continuous development of VLSI technology is shrinking the minimal sizes to nanometer region, making circuits more susceptible to transient error. In this paper, we present a frequency analysis method to accur...
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The continuous development of VLSI technology is shrinking the minimal sizes to nanometer region, making circuits more susceptible to transient error. In this paper, we present a frequency analysis method to accurately estimate the possible propagation of transient fault-due glitches through a CMOS combinational circuit. We use the frequency feature of signal and frequency response of electrical system to analyze the propagation of transient error. Experiments show that on average, our approach provides approximately 95% accuracy and several orders of magnitude faster with respect to HSPICE simulation.
This paper presents the design and implementation of a runtime system (named "GodRunner") on Godson-T many-core processor to support task-level parallelism efficiently and flexibly. GodRunner abstracts under...
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