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The 16th Asian Test Symposium(第十六届亚洲测试学术会议)

作者： Shijian Zhang Weiwu Hu Key Laboratory of Computer System and Architecture Institute of Computing Technology Chinese Acade Key Laboratory of Computer System and Architecture Institute of Computing Technology Chinese Acade

Conventional temporal redundant techniques to detect transient faults have resulted in considerable performance loss. One major reason for this problem is the reclamation of some critical resources, such as the instruction window and physical registers, is delayed, which degrades instruction-level parallelism. This paper proposes a novel fault- tolerant micro-architecture based on checkpoint mechanism. All occupied resources are reclaimed during the retirement stage in the first execution. Therefore, the performance overhead is mitigated evidently. Our scheme requires only small hardware cost and provides short fault detection latency.

关键词： Registers Fault detection Retirement Hardware Costs Delay Pipelines Buffer storage Redundancy Yarn

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Frequency Analysis Method for Propagation of Transient Errors in Combinational Logic

Frequency Analysis Method for Propagation of Transient Error...

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The 16th Asian Test Symposium(第十六届亚洲测试学术会议)

作者： Shaohua Lei Yinhe Han Xiaowei Li Key Laboratory of Computer System and Architecture Institute of Computing Technology Chinese Acade Key Laboratory of Computer System and Architecture Institute of Computing Technology Chinese Acade

The continuous development of VLSI technology is shrinking the minimal sizes to nanometer region, making circuits more susceptible to transient error. In this paper, we present a frequency analysis method to accurately estimate the possible propagation of transient fault-due glitches through a CMOS combinational circuit. We use the frequency feature of signal and frequency response of electrical system to analyze the propagation of transient error. Experiments show that on average, our approach provides approximately 95％ accuracy and several orders of magnitude faster with respect to HSPICE simulation.

关键词： Transient analysis Frequency estimation CMOS logic circuits Very large scale integration CMOS technology Circuit faults Combinational circuits Frequency response Signal analysis Circuit simulation

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An efficient and flexible task management for many cores

An efficient and flexible task management for many cores

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作者： Yuan, Nan Yu, Lei Fan, Dong-Rui Key Laboratory of Computer System and Architecture Institute of Computing Technology Chinese Academy of Sciences Beijing 100190 China Graduate University of Chinese Academy of Sciences Beijing 100039 China

ISBN: (纸本)9783642245671

This paper presents the design and implementation of a runtime system (named "GodRunner") on Godson-T many-core processor to support task-level parallelism efficiently and flexibly. GodRunner abstracts underlying hardware resource, providing ease-of-use programming interface. A two-grade task management mechanism is proposed to support both coarse-grained and fine-grained multithreading efficiently. Two load-balanced scheduling policies are combined flexibly in GodRunner. The software-controlled task management makes GodRunner more configurable and extensible than hard-wired ones. The experiment shows that the tasking overhead in GodRunner is as small as hundreds of cycles, which is about the hundreds of times faster than the conventional Pthread based multithreading on a SMP machine. Furthermore, our approach scales well and supports fine-grained tasks as small as 20k cycles optimally. © 2011 Springer-Verlag Berlin Heidelberg.

关键词： computer architecture

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A unified online fault detection scheme via checking of stability violation 09

A unified online fault detection scheme via checking of stab...

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2009 Design, Automation and Test in Europe Conference and Exhibition, DATE '09

作者： Guihai, Yan Yinhe, Han Xiaowei, Li Key Laboratory of Computer System and Architecture Institute of Computing Technology Chinese Academy of Sciences Beijing 100190 China Graduate University Chinese Academy of Sciences Beijing 100039 China

ISBN: (纸本)9783981080155

In ultra-deep submicro technology, two of the paramount reliability concerns are soft errors and device aging. Although intensive studies have been done to face the two challenges, most take them separately so far, thereby failing to reach better performance-cost tradeoffs. To support a more efficient design tradeoff, we present a new fault model, Stability Violation, derived from analysis of signal behavior. Furthermore, we propose a unified fault detection scheme - Stability Violation based Fault Detection (SVFD), by which the soft errors (both Single Event Upset and Single Event Transient), aging delay, and delay faults can be uniformly handled. SVFD can greatly facilitate soft error-resistant and aging-aware designs. SVFD is validated by conducting a set of intensive Hspice simulations targeting 65nm CMOS technology. Experimental results show that SVFD has more robust capability for fault detection than previous schemes at comparable overhead in terms of area, power, and performance. © 2009 EDAA.

关键词： Fault detection

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Testable critical path selection considering process variation

Testable critical path selection considering process variati...

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作者： Fu, Xiang Li, Huawei Li, Xiaowei Key Laboratory of Computer System and Architecture Institute of Computing Technology Chinese Academic of Science Beijing 100190 China Graduate University of Chinese Academic of Sciences Beijing 100039 China

Critical path selection is very important in delay testing. Critical paths found by conventional static timing analysis (STA) tools are inadequate to represent the real timing of the circuit, since neither the testability of paths nor the statistical variation of cell delays caused by process variation is considered. This paper proposed a novel path selection method considering process variation. The circuit is firstly simplified by eliminating non-critical edges under statistical timing model, and then divided into sub-circuits, while each sub-circuit has only one prime input (PI) and one prime output (PO). Critical paths are selected only in critical sub-circuits. The concept of partially critical edges (PCEs) and completely critical edges (CCEs) are introduced to speed up the path selection procedure. Two path selection strategies are also presented to search for a testable critical path set to cover all the critical edges. The experimental results showed that the proposed circuit division approach is efficient in path number reduction, and PCEs and CCEs play an important role as a guideline during path selection. Copyright © 2010 The institute of Electronics.

关键词： Delay circuits

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A routing algorithm for random error tolerance in network-on-chip

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12th International Conference on Human-computer Interaction, HCI International 2007

作者： Zhang, Lei Li, Huawei Li, Xiaowei Key Laboratory of Computer System and Architecture Institute of Computing Technology Chinese Academy of Sciences 100080 Beijing China Graduate University Chinese Academy of Sciences Beijing 100080 China

ISBN: (纸本)9783540731092

In DSM and nanometer technology, there will present more and more new fault types, which are difficult to predict and avoid. Applying fault tolerant algorithms to achieve reliable on-chip communication is one of the most important issues of Network-on-Chip (NoC). This paper reviews the main on-chip fault tolerant communication algorithms and then proposes a new routing algorithm with end-to-end feedback. The average transmission latency, power consumption and reliability are compared with other techniques. As experiments show, the proposed algorithm has lower latency, lower power consumption compared with those of others, and it can provide high reliability. © Springer-Verlag Berlin Heidelberg 2007.

关键词： Routing algorithms

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Green challenges to system software in data centers

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Frontiers of Materials Science 2011年第3期5卷 353-368页

作者： Yuzhong SUN Yiqiang ZHAO Ying SONG Vajun YANG Haifeng FANG Hongyong ZANG Yaqiong LI Yunwei GAO Key Laboratory of Computer System and Architecture Institute of Computing Technology Chinese Academy of Sciences Beijing 100190 China Graduate University of Chinese Academy of Sciences Beijing 100190 China

With the increasing demand and the wide application of high performance commodity multi-core processors, both the quantity and scale of data centers grow dramatically and they bring heavy energy consumption. Researchers and engineers have applied much effort to reducing hardware energy consumption, but software is the true consumer of power and another key in making better use of energy. system software is critical to better energy utilization, because it is not only the manager of hardware but also the bridge and platform between applications and hardware. In this paper, we summarize some trends that can affect the efficiency of data centers. Meanwhile, we investigate the causes of software inefficiency. Based on these studies, major technical challenges and corresponding possible solutions to attain green system software in programmability, scalability, efficiency and software architecture are discussed. Finally, some of our research progress on trusted energy efficient system software is briefly introduced.

关键词： green software multi-core data center,power efficient system software

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Protein structure superposition by curve moment invariants and iterative closest point

Protein structure superposition by curve moment invariants a...

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2007 1st International Conference on Bioinformatics and Biomedical Engineering, ICBBE

作者： Xu, Dong Li, Hua Gu, Tongjun Key Laboratory of Intelligent Information Processing Key Laboratory of Computer System and Architecture National Research Center for Intelligent Computing Systems Institute of Computing Technology Chinese Academy of Sciences Center for Systems Biology Institute of Biophysics Chinese Academy of Sciences Graduate University Chinese Academy of Sciences

ISBN: (纸本)1424411203

Superimpose one protein tertiary structure to another can help to find similarity between them and further identify functional and evolutionary relationships. We first extract invariant features under rigid body transformation for each protein backbone which is represented by alpha-carbons of all the residues. Then, the invariant features are embedded with Iterative Closest Point algorithm for superposition. With several initialized orientations, pairwise alignment can be achieved accurately only by few iterations. Experiments indicate that our proposed algorithm is competitive with several well-known algorithms and with smallest root mean squared distance. © 2007 IEEE.

关键词： Proteins

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Fetching primary and redundant instructions in turn for a fault-tolerant embedded microprocessor

Fetching primary and redundant instructions in turn for a fa...

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14th IEEE Pacific Rim International Symposium on Dependable computing, PRDC 2008

作者： Zhang, Shijian Hu, Weiwu Key Laboratory of Computer System and Architecture Institute of Computing Technology Chinese Academy of Sciences Beijing 100080 China Graduate School of the Chinese Academy of Sciences Beijing 100039 China

ISBN: (纸本)9780769534480

With the development of semiconductor technology, microprocessors become more and more susceptible to transient faults. Some proposed schemes support redundant execution of a program in a superscalar processor for fault tolerance. However, they require a huge queue to accommodate interim states, which enlarge the hardware cost significantly. This paper analyzes the effect of halving a processor's instruction fetch bandwidth on a program's performance. We find that the performance degradation resulted from halving instruction fetch bandwidth declines when instruction latency is lengthened, branch prediction accuracy deteriorates or cache miss rate increases. Since an embedded microprocessor is characterized by long instruction latency, high branch misprediction rate and cache miss rate, a fault-tolerant scheme is proposed, in which two threads fetch instructions in turn and execute in the same processor core simultaneously without any extra queue. The simulation results from eight embedded applications show that performance penalty of our solution ranges from 6.5% to 30.1%, with an average of 22.5%, which is lower than that of the other proposed schemes. The experiment also indicates that our scheme can effectively detect faults occurring in the entire pipeline with short fault detection latency and minimal hardware cost. It is well suited for our solution to realize a reliable embedded microprocessor. © 2008 IEEE.

关键词： Fault detection

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Extended selective encoding of scan slices for reducing test data and test power

Extended selective encoding of scan slices for reducing test...

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18th Asian Test Symposium, ATS 2009

作者： Liu, Jun Han, Yinhe Li, Xiaowei Key Laboratory of Computer System and Architecture Institute of Computing Technology Chinese Academy of Sciences Beijing China School of Computer and Information Hefei University of Technology Hefei China Academy of Sciences Graduate University of Chinese Beijing China

ISBN: (纸本)9780769538648

Recently, selective encoding of scan slices is proposed to compress test data. This encoding technique, unlike many other compression techniques encoding all the bits, only encodes the target-symbol by specifying single bit index and copying group data. In this paper, we propose an extended selective encoding which presents two new techniques: flexible grouping strategy, X bits exploitation and filling strategy. Flexible grouping strategy is able to decrease the number of encoded groups to improve compression ratio. X bits exploitation and filling strategy can exploit a large number of don't care bits to reduce testing power with no compression ratio loss. Experimental results show that the proposed technique needs less test data storage volume and reduces average weighted switching activity by 24.7%, peak weighted switching activity by 11.6% during scan shift compared to selective encoding. © 2009 IEEE.

关键词： Filling

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