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检索条件"机构=Key Laboratory of Computer System and Architeture Institute of Computing Technology"
526 条 记 录,以下是431-440 订阅
A Self-Repairable Microprocessor
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ECS Transactions 2009年 第1期18卷
作者: Yuanjiang Xie Xiang Fu Zijian He Yang Zhao Yu Hu Xiaowei Li Institute of Computing Technology Chinese Academy of Sciences Department of Computer Science and Engineering University of California Riverside Key Laboratory of Computer System and Architecture Institute of Computing Technology Chinese Academy of Sciences No. 6 Ke-Xue-Yuan South Road Beijing Beijing 100190 China
With increasing defect density, microprocessors, especially the embedded caches, will encounter more faults. Adding spare resources to replace defective components is a widely accepted method for yield enhancement. In...
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Robust test generation for power supply noise induced path delay faults
Robust test generation for power supply noise induced path d...
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2008 Asia and South Pacific Design Automation Conference, ASP-DAC
作者: Fu, Xiang Li, Huawei Hu, Yu Li, Xiaowei Key Laboratory of Computer System and Architecture Institute of Computing Technology Chinese Academy of Sciences Beijing China Graduate School Chinese Academy of Sciences Beijing China
In deep sub-micron designs, the delay caused by power supply noise (PSN) can no longer be ignored. A PSN-induced path delay fault (PSNPDF) model is proposed in this paper, and should be tested to enhance chip quality....
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Diva: A dataflow programming model and its runtime support in java virtual machine
Diva: A dataflow programming model and its runtime support i...
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13th IEEE Asia-Pacific computer systems Architecture Conference, ACSAC 2008
作者: Yang, Chen Bin, Fan Lujie, Zhong Chengyong, Wu Key Laboratory of Computer System and Architecture Institute of Computing Technology Chinese Academy of Science Beijing China Graduate School of the Chinese Academy of Sciences Beijing China
Microprocessors have turned to multicore, i.e. multiple processor cores, along with some levels of on-chip caches and interconnection networks, integrated on a singe chip. However, it brings challenges on how to progr... 详细信息
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A design- for-diagnosis technique for diagnosing both scan chain faults and combinational circuit faults
A design- for-diagnosis technique for diagnosing both scan c...
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2008 Asia and South Pacific Design Automation Conference, ASP-DAC
作者: Wang, Fei Hu, Yu Li, Huawei Li, Xiaowei Key Laboratory of Computer System and Architecture Institute of Computing Technology Chinese Academy of Science Beijing China Graduate University Chinese Academy of Sciences Beijing China
The amount of die area consumed by scan chains and scan control circuit can range from 15%∼30%, and scan chain failures account for almost 50% of chip failures. As the conventional diagnosis process usually runs on t... 详细信息
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Localized random access scan: Towards low area and routing overhead
Localized random access scan: Towards low area and routing o...
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2008 Asia and South Pacific Design Automation Conference, ASP-DAC
作者: Hu, Yu Fu, Xiang Fan, Xiaoxin Fujiwara, Hideo Key Laboratory of Computer System and Architecture Institute of Computing Technology CAS Beijing 100080 China 8916-5 Takayama Ikoma Nara 630-0192 Japan
Conventional random access scan (RAS) designs, although economic in test power dissipation, test application time and test data volume, are expensive in area and routing overhead. In this paper, we present a localized... 详细信息
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A microscopic view on community detection in complex networks
A microscopic view on community detection in complex network...
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2nd PhD Workshop on Information and Knowledge Management, PIKM'08, Co-located with the 17th ACM Conference on Information and Knowledge Management, CIKM'08
作者: Wang, Yang Song, Huaiming Wang, Weiping An, Mingyuan Graduate University of Chinese Academy of Sciences Beijing China Key Laboratory of Computer System and Architecture Institute of Computing Technology Chinese Academy of Sciences Beijing China
The community structure is a basic characteristic of complex networks. A strong community structure has high modularity. It has been proven an NP-Complete problem to identify the community structure with the highest m... 详细信息
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Exploiting idle register classes for fast spill destination
Exploiting idle register classes for fast spill destination
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22nd ACM International Conference on Supercomputing, ICS'08
作者: Lu, Fang Wang, Lei Feng, Xiaobing Li, Zhiyuan Zhang, Zhaoqing Key Laboratory of Computer System and Architecture Institute of Computing Technology Chinese Academy of Sciences Beijing 100191 China Department of Computer Sciences Purdue University West Lafayette IN 47906 United States
On today's microprocessors, there often exist several different types of registers, e.g. general purpose registers and floating point registers. A given program may use one type of registers much more frequently t... 详细信息
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Fetching primary and redundant instructions in turn for a fault-tolerant embedded microprocessor
Fetching primary and redundant instructions in turn for a fa...
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14th IEEE Pacific Rim International Symposium on Dependable computing, PRDC 2008
作者: Zhang, Shijian Hu, Weiwu Key Laboratory of Computer System and Architecture Institute of Computing Technology Chinese Academy of Sciences Beijing 100080 China Graduate School of the Chinese Academy of Sciences Beijing 100039 China
With the development of semiconductor technology, microprocessors become more and more susceptible to transient faults. Some proposed schemes support redundant execution of a program in a superscalar processor for fau... 详细信息
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Capacity-shared heterogeneous CMP cache
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Jisuanji Yanjiu yu Fazhan/computer Research and Development 2008年 第5期45卷 877-885页
作者: Gao, Xiang Zhang, Longbing Hu, Weiwu Key Laboratory of Computer System and Architecture Institute of Computing Technology Chinese Academy of Sciences Beijing 100190 China Department of Computer Science and Technology University of Science and Technology of China Hefei 230027 China
The characteristics of advanced integrated circuit technologies require architects to look for new ways to utilize large numbers of gates and mitigate the effects of high interconnect delays. Chip multiprocessors (CMP... 详细信息
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Testing content addressable memories using instructions and march-like algorithms
Testing content addressable memories using instructions and ...
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15th IEEE International Conference on Electronics, Circuits and systems, ICECS 2008
作者: Lin, Ma Yunji, Chen Menghao, Su Zichu, Qi Heng, Zhang Weiwu, Hu Key Laboratory of Computer System and Architecture Institute of Computing Technology Chinese Academy of Sciences P.O. Box 2704-25 Beijing 100080 China Graduate University Chinese Academy of Science Beijing 100049 China
CAM is widely used in microprocessors and SOC TLB modules. It gives great advantage for software development. And TLB operations become bottleneck of the microprocessor performance. The test cost of normal BIST approa... 详细信息
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