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检索条件"机构=Key Laboratory of Computer System and architecture"
405 条 记 录,以下是11-20 订阅
Revisiting Multiple Pattern Matching Algorithms for Multi-Core architecture
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Journal of computer Science & Technology 2011年 第5期26卷 866-874页
作者: 谭光明 刘萍 卜东波 刘燕兵 Key Laboratory of Computer System and Architecture Institute of Computing TechnologyChinese Academy of Sciences Key Laboratory of Network Technology Institute of Computing TechnologyChinese Academy of Sciences
Due to the huge size of patterns to be searched,multiple pattern searching remains a challenge to several newly-arising applications like network intrusion *** this paper,we present an attempt to design efficient mult... 详细信息
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Green challenges to system software in data centers
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中国计算机科学前沿 2011年 第3期5卷 353-368页
作者: Yuzhong SUN Yiqiang ZHAO Ying SONG Yajun YANG Haifeng FANG Hongyong ZANG Yaqiong LI Yunwei GAO Key Laboratory of Computer System and Architecture Institute of Computing Technology Chinese Academy of Sciences Beijing 100190 China Key Laboratory of Computer System and Architecture Institute of Computing Technology Chinese Academy of Sciences Beijing 100190 China Graduate University of Chinese Academy of Sciences Beijing 100190 China
With the increasing demand and the wide application of high performance commodity multi-core processors,both the quantity and scale of data centers grow dramatically and they bring heavy energy *** and engineers have ... 详细信息
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Design-for-Testability Features and Test Implementation of a Giga Hertz General Purpose Microprocessor
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Journal of computer Science & Technology 2008年 第6期23卷 1037-1046页
作者: 王达 胡瑜 李华伟 李晓维 Key Laboratory of Computer System and Architecture Institute of Computing TechnologyChinese Academy of Sciences Graduate University of Chinese Academy of Sciences
This paper describes the design-for-testability (DFT) features and low-cost testing solutions of a general purpose microprocessor. The optimized DFT features are presented in detail. A hybrid scan compression struct... 详细信息
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Selected Crosstalk Avoidance Code for Reliable Network-on-Chip
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Journal of computer Science & Technology 2009年 第6期24卷 1074-1085页
作者: 张颖 李华伟 李晓维 Key Laboratory of Computer System and Architecture Institute of Computing Technology Chinese Academy of Sciences Graduate School of the Chinese Academy of Sciences
With the shrink of the technology into nanometer scale, network-on-chip (NOC) has become a reasonable solution for connecting plenty of IP blocks on a single chip. But it suffers from both crosstalk effects and sing... 详细信息
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Landing Stencil Code on Godson-T
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Journal of computer Science & Technology 2010年 第4期25卷 886-894页
作者: 崔慧敏 王蕾 范东睿 冯晓兵 Key Laboratory of Computer System and Architecture Institute of Computing TechnologyChinese Academy of Sciences Graduate University of Chinese Academy of Sciences
The advent of multi-core/many-core chip technology offers both an extraordinary opportunity and a profound challenge. In particular, computer architects and system software designers are faced with a unique opportunit... 详细信息
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Lightweight Task-Oriented Semantic Communication Empowered by Large-Scale AI Models
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IEEE Transactions on Vehicular Technology 2025年
作者: Liu, Chuanhong Guo, Caili Yang, Yang Chen, Mingzhe Quek, Tony Q. S. Beijing University of Posts and Telecommunications Beijing Key Laboratory of Network System Architecture and Convergence School of Information and Communication Engineering Beijing100876 China Beijing University of Posts and Telecommunications Beijing Laboratory of Advanced Information Networks School of Information and Communication Engineering Beijing100876 China University of Miami Department of Electrical and Computer Engineering Institute for Data Science and Computing Coral GablesFL United States Singapore University of Technology and Design Dept. of Information Systems Technology and Design 487372 Singapore
Recent studies have focused on leveraging large-scale artificial intelligence (LAI) models to improve semantic representation and compression capabilities. However, the substantial computational demands of LAI models ... 详细信息
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Online Distributed Fault Detection of Sensor Measurements
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Tsinghua Science and Technology 2007年 第S1期12卷 192-196页
作者: 高建良 徐勇军 李晓维 Key Laboratory of Computer System and Architecture Institute of Computing TechnologyChinese Academy of Sciences
In wireless sensor networks (WSNs), a faulty sensor may produce incorrect data and transmit them to the other sensors. This would consume the limited energy and bandwidth of WSNs. Furthermore, the base station may mak... 详细信息
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The Godson Processors:Its Research,Development,and Contributions
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Journal of computer Science & Technology 2011年 第3期26卷 363-372页
作者: 胡伟武 高燕萍 陈天石 肖俊华 Key Laboratory of Computer System and Architecture Chinese Academy of Sciences Loongson Technologies Corporation Limited Graduate University of Chinese Academy of Sciences
The Godson project with an R&D history of 10 years is an independent national program of China that aims at developing advanced microprocessor technologies based on fundamental research and commercialization of the c... 详细信息
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High Performance General-Purpose Microprocessors: Past and Future
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Journal of computer Science & Technology 2006年 第5期21卷 631-640页
作者: 胡伟武 侯锐 肖俊华 章隆宾 Key Laboratory of Computer System and Architecture Institute of Computing Technology Chinese Academy of Sciences Beijing 100080 P.R. China
It can be observed from looking backward that processor architecture is improved through spirally shifting from simple to complex and from complex to simple. Nowadays we are facing another shifting from complex to sim... 详细信息
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Leakage Current Optimization Techniques During Test Based on Don't Care Bits Assignment
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Journal of computer Science & Technology 2007年 第5期22卷 673-680页
作者: 王伟 胡瑜 韩银和 李晓维 张佑生 School of Computer and Information Hefei University of Technology Hefei 230009China Key Laboratory of Computer System and ArchitectureInstitute of Computing TechnologyChinese Academy of Sciences Beijing 100080China Key Laboratory of Computer System and Architecture Institute of Computing Technology Chinese Academy of Sciences Beijing 100080China School of Computer and Information Hefei University of Technology Hefei 230009China
It is a well-known fact that test power consumption may exceed that during functional operation. Leakage power dissipation caused by leakage current in Complementary Metal-Oxide-Semiconductor (CMOS) circuits during ... 详细信息
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