咨询与建议

限定检索结果

文献类型

  • 311 篇 会议
  • 94 篇 期刊文献

馆藏范围

  • 405 篇 电子文献
  • 0 种 纸本馆藏

日期分布

学科分类号

  • 239 篇 工学
    • 164 篇 计算机科学与技术...
    • 97 篇 软件工程
    • 65 篇 电子科学与技术(可...
    • 40 篇 信息与通信工程
    • 26 篇 机械工程
    • 24 篇 控制科学与工程
    • 17 篇 电气工程
    • 12 篇 动力工程及工程热...
    • 12 篇 生物工程
    • 10 篇 仪器科学与技术
    • 9 篇 交通运输工程
    • 7 篇 光学工程
    • 7 篇 材料科学与工程(可...
    • 6 篇 建筑学
    • 6 篇 土木工程
    • 5 篇 航空宇航科学与技...
    • 4 篇 冶金工程
    • 3 篇 化学工程与技术
  • 68 篇 理学
    • 32 篇 数学
    • 27 篇 系统科学
    • 14 篇 物理学
    • 11 篇 生物学
    • 9 篇 统计学(可授理学、...
    • 4 篇 化学
  • 37 篇 管理学
    • 32 篇 管理科学与工程(可...
    • 16 篇 工商管理
    • 7 篇 图书情报与档案管...
  • 5 篇 医学
    • 4 篇 临床医学
  • 3 篇 经济学
    • 3 篇 应用经济学
  • 3 篇 法学
    • 3 篇 社会学
  • 3 篇 农学

主题

  • 72 篇 computer archite...
  • 41 篇 laboratories
  • 33 篇 delay
  • 27 篇 circuit faults
  • 26 篇 hardware
  • 23 篇 circuit testing
  • 21 篇 costs
  • 20 篇 bandwidth
  • 20 篇 clocks
  • 20 篇 system testing
  • 18 篇 protocols
  • 17 篇 microprocessors
  • 16 篇 computer network...
  • 15 篇 network-on-a-chi...
  • 14 篇 switches
  • 14 篇 automatic test p...
  • 13 篇 parallel process...
  • 13 篇 fault tolerance
  • 13 篇 system-on-a-chip
  • 12 篇 concurrent compu...

机构

  • 95 篇 key laboratory o...
  • 83 篇 key laboratory o...
  • 38 篇 key laboratory o...
  • 37 篇 graduate univers...
  • 29 篇 beijing key labo...
  • 29 篇 chinese academy ...
  • 27 篇 institute of com...
  • 21 篇 graduate univers...
  • 16 篇 chinese academy ...
  • 12 篇 key laboratory o...
  • 12 篇 chinese academy ...
  • 11 篇 loongson technol...
  • 10 篇 graduate school ...
  • 10 篇 key laboratory o...
  • 9 篇 key laboratory o...
  • 8 篇 department of co...
  • 8 篇 beijing key labo...
  • 8 篇 key laboratory o...
  • 6 篇 school of comput...
  • 6 篇 key laboratory o...

作者

  • 58 篇 xiaowei li
  • 31 篇 huawei li
  • 30 篇 yu hu
  • 28 篇 li xiaowei
  • 20 篇 chen mingzhe
  • 18 篇 yinhe han
  • 16 篇 weiwu hu
  • 15 篇 dongrui fan
  • 14 篇 yang yang
  • 14 篇 hu yu
  • 13 篇 li huawei
  • 13 篇 hong an
  • 13 篇 sun ninghui
  • 12 篇 han yinhe
  • 12 篇 yin changchuan
  • 11 篇 ninghui sun
  • 11 篇 ge zhang
  • 10 篇 fan dongrui
  • 10 篇 saad walid
  • 10 篇 李晓维

语言

  • 372 篇 英文
  • 29 篇 中文
  • 4 篇 其他
检索条件"机构=Key Laboratory of Computer System and architecture"
405 条 记 录,以下是321-330 订阅
排序:
Robust test generation for power supply noise induced path delay faults
Robust test generation for power supply noise induced path d...
收藏 引用
Asia and South Pacific Design Automation Conference
作者: Xiang Fu Huawei Li Yu Hu Xiaowei Li Graduate School of Chinese Academy of Sciences Beijing China Key Laboratory of Computer System and Architecture Institute of Computing Technology Chinese Academy and Sciences China
In deep sub-micron designs, the delay caused by power supply noise (PSN) can no longer be ignored. A PSN-induced path delay fault (PSNPDF) model is proposed in this paper, and should be tested to enhance chip quality.... 详细信息
来源: 评论
Fetching Primary and Redundant Instructions in Turn for a Fault-Tolerant Embedded Microprocessor
Fetching Primary and Redundant Instructions in Turn for a Fa...
收藏 引用
Pacific Rim International Symposium on Dependable Computing
作者: Shijian Zhang Weiwu Hu Graduate School of Chinese Academy of Sciences Beijing China Key Laboratory of Computer System and Architecture Institute of Computing Technology Chinese Academy and Sciences Beijing China
With the development of semiconductor technology, microprocessors become more and more susceptible to transient faults. Some proposed schemes support redundant execution of a program in a superscalar processor for fau... 详细信息
来源: 评论
Instruction level test for parallel multipliers
Instruction level test for parallel multipliers
收藏 引用
15th IEEE International Conference on Electronics, Circuits and systems, ICECS 2008
作者: Lin, Ma. Yan, Gao Key Laboratory of Computer System and Architecture Institute of Computing Technology Chinese Academy of Sciences P.O. Box 2704-25 Beijing 100190 China College of Electronics and Information Engineering Tongji University SiPing Road 1239 Shanghai 200092 China Graduate University of Chinese Academy of Science Beijing 100049 China
Multiplication operations are the normal operations in operating systems or scientific calculations. Multipliers embedded in processors, DSP or SoC are well optimized for best performance, and they are sensitive to te... 详细信息
来源: 评论
Channel Width Utilization Improvement in Testing NoC-Based systems for Test Time Reduction
Channel Width Utilization Improvement in Testing NoC-Based S...
收藏 引用
IEEE International Workshop on Electronic Design, Test and Applications (DELTA)
作者: Jia Li Qiang Xu Yu Hu Xiaowei Li Key Laboratory of Computer System and Architecture ICT CAS Beijing China Department of Computer Science & Engineering Chinese University of Hong Kong Hong Kong China Chinese Academy and Sciences Beijing China
Testing NoC-based systems mainly relies on reusing the Network-on-Chip architecture as the test access mechanism (TAM). This, however, implies that the core's test wrapper is supplied with full NoC channel width e... 详细信息
来源: 评论
A Case Study on At-Speed Testing for a Gigahertz Microprocessor
A Case Study on At-Speed Testing for a Gigahertz Microproces...
收藏 引用
IEEE International Workshop on Electronic Design, Test and Applications (DELTA)
作者: Da Wang Rui Li Yu Hu Huawei Li Xiaowei Li Chinese Academy and Sciences China Key Laboratory of Computer System and Architecture Institute of Computing Technology Chinese Academy and Sciences Beijing China STMicroelectronics Company Limited Shanghai China
This paper describes a low cost, high quality at-speed testing strategy implemented on a gigahertz microprocessor with multi-clock domains. The presented DFT method not only utilizes the internal phase-locked loops (P... 详细信息
来源: 评论
Frequency method to study the propagation of transient fault in combinational logic
收藏 引用
Jisuanji Fuzhu Sheji Yu Tuxingxue Xuebao/Journal of computer-Aided Design and computer Graphics 2008年 第5期20卷 605-611+617页
作者: Lei, Shaohua Han, Yinhe Li, Xiaowei Key Laboratory of Computer System and Architecture Institute of Computing Technology Chinese Academy of Sciences Beijing 100080 China Institute of Computing Technology Chinese Academy of Sciences Beijing 100080 China Graduate University Chinese Academy of Sciences Beijing 100049 China
This paper presents a frequency analysis method to analyze the propagation procedure of transient error in combinational logic. By using the Fourier transform with the input signal and the frequency feature of combina... 详细信息
来源: 评论
A HyperTransport-based personal parallel computer
A HyperTransport-based personal parallel computer
收藏 引用
IEEE International Conference on Cluster Computing
作者: Xiaojun Yang Fei Chen Hailiang Cheng Ninghui Sun Institute of Computing Technology Chinese Academy and Sciences Beijing China Chinese Academy of Sciences Beijing China Key Laboratory of Computer System and Architecture Chinese Academy and Sciences Beijing China
Instead of all using commodity components, an approach building a personal parallel computer on top of a non-coherent HyperTransport (HT) fabric is presented in the paper. The advantage is to provide both lower cost a... 详细信息
来源: 评论
A novel hint-based I/O mechanism for centralized file server of cluster
A novel hint-based I/O mechanism for centralized file server...
收藏 引用
IEEE International Conference on Cluster Computing
作者: Huan Chen Jin Xiong Ninghui Sun Chinese Academy of Sciences Beijing China Institute of Computing Technology Chinese Academy and Sciences Beijing China Key Laboratory of Computer Architecture and System Chinese Academy and Sciences Beijing China
In the medium and small cluster systems, the centralized file server such as NFS is the main approach to provide the storage service with low cost and easy management. However, when multiple parallel applications acce... 详细信息
来源: 评论
On reducing both shift and capture power for scan-based testing
On reducing both shift and capture power for scan-based test...
收藏 引用
Asia and South Pacific Design Automation Conference
作者: Jia Li Qiang Xu Yu Hu Xiaowei Li Chinese Academy of Sciences Beijing China Department of Computer Science and Engineering Chinese University of Hong Kong Hong Kong China Key Laboratory of Computer System and Architecture ICT Chinese Academy and Sciences Beijing China
Power consumption in scan-based testing is a major concern nowadays. In this paper, we present a new X-fllling technique to reduce both shift power and capture power during scan tests, namely LSC-filling . The basic ... 详细信息
来源: 评论
On capture power-aware test data compression for scan-based testing  08
On capture power-aware test data compression for scan-based ...
收藏 引用
IEEE International Conference on computer-Aided Design
作者: Jia Li Xiao Liu Yubin Zhang Yu Hu Xiaowei Li Qiang Xu Chinese Academy and Sciences Beijing China CUhk REliable computing laboratory (CURE) Department of Computer Science & Engineering Chinese University of Hong Kong New Territories Hong Kong China Key Laboratory of Computer System and Architecture ICT CAS Beijing China
Large test data volume and high test power are two of the major concerns for the industry when testing large integrated circuits. With given test cubes in scan-based testing, the ldquodonpsilat-carerdquo bits can be e... 详细信息
来源: 评论