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检索条件"机构=Key Laboratory of Infrared Detecting and Imaging Technology"
97 条 记 录,以下是1-10 订阅
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infrared small target detection based on spatial attention density peaks searching
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Optoelectronics Letters 2025年 第2期21卷 90-96页
作者: RAO Junmin LU Siyu LIU Shijian LI Fanming CAS Key Laboratory of Infrared System Detection and Imaging Technology Shanghai Institute of Technical PhysicsShanghai 200083China University of Chinese Academy of Sciences Beijing 100049China Shanghai Institute of Technical Physics Chinese Academy of SciencesShanghai 200083China School of Information Science and Technology ShanghaiTech UniversityShanghai 201210China
The detection of small targets poses a significant challenge for infrared search and tracking (IRST) systems,as they must strike a delicate balance between accuracy and *** this paper,we propose a detection algorithm ... 详细信息
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infrared aircraft few-shot classification method based on cross-correlation network
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红外与毫米波学报 2025年 第1期44卷 103-111页
作者: HUANG Zhen ZHANG Yong GONG Jin-Fu Key Laboratory of Infrared System Detection and Imaging Technology Chinese Academy of SciencesShanghai 200083China University of Chinese Academy of Sciences Beijing 100049China Shanghai Institute of Technical Physics Chinese Academy of SciencesShanghai 200083China
In response to the scarcity of infrared aircraft samples and the tendency of traditional deep learning to overfit,a few-shot infrared aircraft classification method based on cross-correlation networks is *** method co... 详细信息
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Target detection enhancement method through multi-dimensional information differential projection and fusion
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Optics Express 2025年 第10期33卷 21116-21131页
作者: Dong, Xue Lan, Yubo Zhao, Zongmin Cai, Chang Zhou, Zhiming Zhang, Tong Han, Pingli Xiang, Meng Liu, Jinpeng Xie, Peiyue Liu, Fei School of Optoelectronic Engineering Xidian University Xi’an 710071 China Xi’an Key Laboratory of Computational Imaging Xi’an 710071 China National Key Laboratory of Infrared Detection Technologies Shanghai 200083 China Beijing Key Laboratory of Advanced Optical Remote Sensing Technology Beijing 100094 China
As a powerful detection tool, spectral polarization imaging (SPI) reveals spatial, spectral, and polarization characteristics. When combined with deep learning, its detection capabilities can be further improved. Howe... 详细信息
来源: 评论
Feature Enhancement Network for infrared Small Target Detection in Complex Backgrounds Based on Multi-Scale Attention Mechanism
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Applied Sciences (Switzerland) 2025年 第9期15卷 4966-4966页
作者: Zhang, Sen Du, Weilin Liu, Yuan Zhou, Ni Li, Zheng Key Laboratory of Infrared System Detection and Imaging Technology Shanghai Institute of Technical Physics Chinese Academy of Sciences Shanghai200083 China University of Chinese Academy of Sciences Beijing100049 China
The identification of tiny objects via single-frame infrared is a significant challenge in computer vision, primarily due to large variances in target dimensions, overcrowded backgrounds, suboptimal signal-to-noise ra... 详细信息
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Edge-Object Co-Driven Learning for Remote Sensing Change Detection
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IEEE Transactions on Geoscience and Remote Sensing 2025年 63卷
作者: Liu, Yangguang Liu, Fang Liu, Jia Xiao, Liang Nanjing University of Science and Technology School of Computer Science and Engineering Jiangsu Key Laboratory of Spectral Imaging and Intelligent Sense Nanjing 210094 China Jiangsu Province Engineering Research Center of Airborne Detecting and Intelligent Perceptive Technology Nanjing 210049 China
Remote sensing change detection (CD) aims to accurately reveal surface changes by comparing two temporally separated images of the same area. However, in complex environments, insufficient edge detail recognition and ... 详细信息
来源: 评论
Wafer bow control of extended wavelength InGaAs photodetector materials by strain tailoring
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Materials Science in Semiconductor Processing 2025年 197卷
作者: Liu, Bowen Gu, Yi Yin, Lihao Huang, Huijuan Li, Kang Fan, Liuyan Zhou, Hong Chen, Pingping Yu, Chunlei Li, Tao Shao, Xiumei Li, Xue Gong, Haimei National Key Laboratory of Infrared Detection Technologies Shanghai Institute of Technical Physics Chinese Academy of Sciences Shanghai 200083 China Key Laboratory of Infrared Imaging Materials and Detectors Shanghai Institute of Technical Physics Chinese Academy of Sciences Shanghai 200083 China State Key Laboratory of Infrared Physics Shanghai Institute of Technical Physics Chinese Academy of Sciences Shanghai 200083 China Wuxi Zhongke Dexin Sensing Technology Co. Ltd. Jiangsu Wuxi 214135 China University of Chinese Academy of Sciences Beijing 100049 China
The wafer bow caused by lattice mismatch between metamorphic InGaAs epitaxial layer and InP substrate has become one of the key factors limiting the large-scale development of extended wavelength InGaAs focal plane ar... 详细信息
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An alternative application of GaAs-based light-emitting diodes: X-ray detection and imaging
arXiv
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arXiv 2025年
作者: Yu, Quan Wang, Fangbao Yuan, Xin Liu, Ying Gan, Lianghua Xu, Gangyi Shen, Wenzhong Chen, Liang Zhang, Yueheng Key Laboratory of Artificial Structures and Quantum Control School of Physics and Astronomy Shanghai Jiao Tong University Shanghai200240 China Radiation Detection Research Center Northwest Institute of Nuclear Technology Xi’an710024 China Key Laboratory of Infrared Imaging Materials and Detectors Shanghai Institute of Technical Physics Chinese Academy of Sciences Shanghai200083 China Hangzhou Institute for Advanced Study University of Chinese Academy of Sciences Hangzhou310024 China
GaAs-based light-emitting diodes (LEDs) are commonly employed in a variety of applications, including medical imaging, biosensing, optical communications, and night vision. In this paper, we present an alternative app... 详细信息
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Curvature Compensated CMOS Bandgap Reference with Novel Process Variation Calibration Technique
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Journal of Beijing Institute of technology 2018年 第2期27卷 182-188页
作者: Jiancheng Zhang Mao Ye Yiqiang Zhao Gongyuan Zhao Tianjin Key Laboratory of Imaging and Sensing Microelectronic Technology Tianjin UniversityTianjin 300072China Tianjin Infrared Imaging Technology Engineering Center Tianjin 300072China
A lowtemperature coefficient( TC) bandgap reference( BGR) with novel process variation calibration technique is proposed in this paper. This proposed calibration technique compensating both TC and output value of ... 详细信息
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Short-wave infrared InGaAs photodetectors and focal plane arrays
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Chinese Physics B 2018年 第12期27卷 57-63页
作者: Yong-Gang Zhang Yi Gu Xiu-Mei Shao Xue Li Hai-Mei Gong Jia-Xiong Fang Key Laboratory of Infrared Imaging Materials and Detectors Shanghai Institute of Technical PhysicsChinese Academy of Sciences State Key Laboratory of Functional Materials for Informatics Shanghai Institute of Microsystem and Information TechnologyChinese Academy of Sciences
In this article, unique spectral features of short-wave infrared band of 1 μm–3 μm, and various applications related to the photodetectors and focal plane arrays in this band, are introduced briefly. In addition, t... 详细信息
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InP-based In_xGa_(1-x)As metamorphic buffers with different mismatch grading rates
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Journal of Semiconductors 2013年 第7期34卷 42-46页
作者: 方祥 顾溢 陈星佑 周立 曹远迎 李好斯白音 张永刚 State Key Laboratory of Functional Materials for Informatics Shanghai Institute of Microsystem and Information TechnologyChinese Academy of Sciences Key Laboratory of Infrared Imaging Materials and Detectors Chinese Academy of Sciences
Linearly graded In_xGa_(1-x)As metamorphic buffers with different mismatch grading rates were grown on InP substrate by gas source molecular beam *** temperature photoluminescence spectra show that the sample with l... 详细信息
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