In summary, a novel RRAM with the structure of Cu/SixO yNz/W was first fabricated and its characteristics are thoroughly investigated. The new device exhibited low switching voltages and low reset currents, demonstrat...
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ISBN:
(纸本)9781424477272
In summary, a novel RRAM with the structure of Cu/SixO yNz/W was first fabricated and its characteristics are thoroughly investigated. The new device exhibited low switching voltages and low reset currents, demonstrating its potential for low-power applications. Repeatable unipolar resistive switching characteristics in terms of high off/on resistance ratio and good retention capability were observed. The switching mechanism of the device was analyzed and can be explained by the formation and rupture of vacancy-filaments.
RapidIO is an emerging high-performance and point-to-point packetized interconnection technology. In this paper, the design of the logical core based on safety arbitration mechanisms is described in detail. The packin...
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RapidIO is an emerging high-performance and point-to-point packetized interconnection technology. In this paper, the design of the logical core based on safety arbitration mechanisms is described in detail. The packing and unpacking of I/O Logical, Message Passing and Globally Shared Memory transactions are achieved. Excellent average data transfer rates, up to 7.8 bytes per cycle are reached in certain transactions with 256-byte data payloads, meanwhile the data efficiencies are more than 95%. Moreover, maintenance read transactions targeted at local capability and status registers can be executed in a lower latency compared with the reference design.
In this paper, two high-resolution medium-bandwidth single-loop 4th-order single-bit sigma-delta modulators using a feed-forward and a feedback topology respectively are implemented in 0.13μm CMOS technology. The ove...
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In this paper, two high-resolution medium-bandwidth single-loop 4th-order single-bit sigma-delta modulators using a feed-forward and a feedback topology respectively are implemented in 0.13μm CMOS technology. The oversampling ratio is 50 with 312.5kHz input bandwidth, 14.66-bit and 16.62-bit resolution have been reached. The two circuits each consume about 8-mW from a single 1.2V supply voltage. After simulation, under the same circuit conditions, feedback structure gives better performance than feed-forward one. The experiment result could be a useful reference for the topology choice.
In this paper, the effects of nanowire (NW) line-edge roughness (LER) in gate-all-around (GAA) silicon nanowire MOSFETs (SNWTs) are investigated by 3-D statistical simulation in terms of both performance variation and...
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In this paper, the effects of nanowire (NW) line-edge roughness (LER) in gate-all-around (GAA) silicon nanowire MOSFETs (SNWTs) are investigated by 3-D statistical simulation in terms of both performance variation and mean value degradation. A physical model is developed for NW LER induced performance degradation in SNWTs for the first time. The results indicate large performance mean value degradations due to NW LER in SNWTs. However, the LER induced parameter variation is still acceptable. In addition, as the LER correlation length (Λ) scales beyond the gate length, new distribution of performance parameters is observed, which has dual-peaks rather than single in conventional Gaussian distribution. The optimization for NW LER parameters is given for SNWT design as well.
In this paper, a novel design method has been proposed to realize feed-forward low-distortion unity STF sigma-delta modulators which are the critical blocks in multi-loop SMASH structure. Using the method, a timing-re...
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In this paper, a novel design method has been proposed to realize feed-forward low-distortion unity STF sigma-delta modulators which are the critical blocks in multi-loop SMASH structure. Using the method, a timing-relaxed stable unity STF 2nd-order modulator has been proposed in detail. After that, an extremely high-resolution SMASH 2(3b)-2(3b)-1(2b) has been suggested using the proposed stages. Extensive results prove the efficiency of this topology.
In this paper, the nanowire (NW) line-edge/width roughness (LER/LWR) effects in Si nanowire transistors (SNWTs) are investigated by both experiments and theoretical analysis. New LER/LWR characteristics are first obse...
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In this paper, the nanowire (NW) line-edge/width roughness (LER/LWR) effects in Si nanowire transistors (SNWTs) are investigated by both experiments and theoretical analysis. New LER/LWR characteristics are first observed in SNWTs, which exhibits suppressed randomization and enhanced systematic variation, rather than pure random LER/LWR in planar and FinFET devices. An improved characterization method is proposed to distinguish the random and systematic variation components in NW LER/LWR. For the first time, the effects of the key fabrication process on the NW LWR are studied in detail, including impacts of different oxidation temperature, NW channel orientations, and patterning techniques (hardmask trimming, spacer define and E-beam lithography). The results indicate that the spacer define method combined with self-limiting oxidation is beneficial for SNWTs. The mechanism of reducing the random variation in NW LER/LWR is analyzed, considering 2-D stress-retarded curvature-dependent oxidation. Taken into account the variation of quantum confined carrier profile, a physical device model is also developed, providing some guidelines for LER/LWR-hardening design of SNWTs.
This paper presents a 14-bit digital-to-analog converter (DAC) with pipelined dynamic element matching to eliminate signal-dependent distortions and achieve good linearity at high sampling frequencies. A return-to-zer...
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This paper presents a 14-bit digital-to-analog converter (DAC) with pipelined dynamic element matching to eliminate signal-dependent distortions and achieve good linearity at high sampling frequencies. A return-to-zero output stage is developed to enhance the dynamic linearity and increase the output impedance of current sources. And a novel current source array is employed to eliminate systematic and graded errors. The spurious-free dynamic range is 80.9dB at 312MS/s with a 150MHz input. The DAC is implemented in a 0.13-μm CMOS process, and consumes 48mW at 1.2-V power supply and 312MS/s.
This work presents a low-power low-cost CDR design for RapidIO SerDes. The design is based on phase interpolator, which is controlled by a synthesized standard cell digital block. Half-rate architecture is adopted to ...
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This work presents a low-power low-cost CDR design for RapidIO SerDes. The design is based on phase interpolator, which is controlled by a synthesized standard cell digital block. Half-rate architecture is adopted to lessen the problems in routing high speed clocks and reduce power. An improved half rate bang-bang phase detector is presented to assure the stability of the system. Moreover, the paper proposes a simplified control scheme for the phase interpolator to further reduce power and cost. The CDR takes an area of less than 0.05 m m 2 , and post simulation shows that the CDR has a RMS jitter of UI pp /32 (11.4 ps @3.125GBaud) and consumes 9.5 mW at 3.125 GBaud.
In this paper, several techniques which relax circuit requirements of building blocks are presented to effectively realize wideband high-resolution cascade sigma-delta modulator. Three cascade structures have been pro...
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In this paper, several techniques which relax circuit requirements of building blocks are presented to effectively realize wideband high-resolution cascade sigma-delta modulator. Three cascade structures have been proposed in this paper. First, a MASH 2-2 with feed-forward topology in both stages has been explained to obtain low-distortion property and remove subtraction Second, a flexible SMASH 2-2 has been proposed to choose appropriate coefficients for different requirements. Third, a SMASH 2-2 with feed-forward quantization noise self-coupled structure has been displayed to cancel quantization error of the preceding stage totally. Detailed simulation results and comparisons demonstrate the performance of these topologies.
A novel LDMOS-SCR device for electrostatic discharge protection of power device is presented. The device is able to be fabricated in SOI 40V LDMOS process without any extra mask. Due to the new structure, a proper and...
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ISBN:
(纸本)9781424457977
A novel LDMOS-SCR device for electrostatic discharge protection of power device is presented. The device is able to be fabricated in SOI 40V LDMOS process without any extra mask. Due to the new structure, a proper and controllable triggering voltage and fine heat dissipation capability are achieved.
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