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Memory materials and devices:From concept to application

InfoMat 2020年第2期2卷 261-290页

作者： Zhenhan Zhang Zongwei Wang Tuo Shi Chong Bi Feng Rao Yimao Cai Qi Liu Huaqiang Wu Peng Zhou State Key Laboratory of ASIC and System School of MicroelectronicsFudan UniversityShanghaiChina Key Laboratory of Microelectronic Devices and Circuits(MOE) Institute of MicroelectronicsPeking UniversityBeijingChina Key Laboratory of Microelectronic Devices and Integrated Technology Institute of MicroelectronicsChinese Academy of SciencesBeijingChina College of Materials Science and Engineering Shenzhen UniversityShenzhenChina Institute of Microelectronics Tsinghua UniversityBeijingChina

Memory cells have always been an important element of information *** emerging technologies like big data and cloud computing,the scale and complexity of data storage has reached an unprecedented peak with a much higher requirement for memory *** is well known,better data storage is mostly achieved by ***,as the size of the memory device is reduced,a series of problems,such as drain gate-induced leakage,greatly hinder the performance of memory *** meet the increasing demands of information technology,novel and high-performance memory is urgently ***,emerging memory technologies are expected to improve memory performance and drive the information *** review will focus on the progress of several emerging memory technologies,including two-dimensional material-based memories,resistance random access memory(RRAM),magnetic random access memory(MRAM),and phasechange random access memory(PCRAM).Advantages,mechanisms,and applications of these diverse memory technologies will be discussed in this review.

关键词： memory MRAM PCRAM RRAM two-dimensional material

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A Spike-Event-Based Neuromorphic Processor with Enhanced On-Chip STDP Learning in 28nm CMOS

A Spike-Event-Based Neuromorphic Processor with Enhanced On-...

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IEEE International Symposium on circuits and Systems (ISCAS)

作者： Yi Zhong Xiaoxin Cui Yisong Kuang Kefei Liu Yuan Wang Ru Huang Key Laboratory of Microelectronics Devices and Circuits Institute of Microelectronics Peking University Beijing China

Event-based spiking neural network (SNN) has displayed a promising prospect to realize real-time, efficient and intelligent hardware platforms. Whereas great efforts are still being appealed to explore the possibility of introducing online learning abilities to neuromorphic systems. In this paper, a 28-nm CMOS neuromorphic processor is presented, fulfilling online learning by adopting counter and lookup table (LUT) based spike-timing-dependent plasticity (STDP) rule. Designed to work at high-precision scenarios, the presented processor integrates up to 1024 neurons and 256K signed 9-bit synapses. It also ensures chip array interconnection to fit large neural networks. Moreover, by utilizing the sparse property of spike events to minimize activity rate, the typical power consumption is further reduced to 3.348mW for training MNIST dataset.

关键词： Training Power demand Neuromorphics Table lookup System-on-chip Biological neural networks Synapses

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On-Chip Incremental Learning based on Unsupervised STDP Implementation

On-Chip Incremental Learning based on Unsupervised STDP Impl...

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IEEE International Conference on Artificial Intelligence circuits and Systems (AICAS)

作者： Guang Chen Jian Cao Shuo Feng Zilin Wang Yi Zhong Qibin Li Xiongbo Zhao Xing Zhang Yuan Wang School of Software and Microelectronics Peking University Beijing China Key Laboratory of Microelectronic Devices and Circuits (MoE) MPW Center Peking University Beijing China School of Integrated Circuits Peking University Beijing China Beijing Aerospace Automatic Control Institute Beijing China

ISBN: (数字)9798350383638

ISBN: (纸本)9798350383645

Spiking neural network (SNN), a bio-inspired neuron network, utilizes a learning rule named spike-timing-dependent plasticity (STDP) to achieve high-performance unsupervised learning. However, it may suffer from catastrophic forgetting when the distribution of new data significantly differs from that of old data. To address this issue, an incremental learning implementation for ship classification is presented in this paper. We develop an incremental learning algorithm based on STDP and corresponding platform. A competitive SNN is built into our algorithm, and add-STDP is utilized to update the weights of network for efficient learning. To enhance learning performance, we incorporate weight decay. And to avoid catastrophic forgetting, we incorporate data replay. The corresponding learning platform consists of the FPGA Zynq 7100 and the STDP neuromorphic prototype chip, and our algorithm is executed on the chip. We evaluate the ship classification task on our platform, which demonstrates the superior potential of our on-chip implementation for incremental learning.

关键词： Incremental learning Neuromorphics Neurons Prototypes Spiking neural networks Classification algorithms System-on-chip

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Improved turn-on behavior in a diode-triggered silicon-controlled rectifier for high-speed electrostatic discharge protection

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Science China(Information Sciences) 2019年第6期62卷 79-86页

作者： Lizhong ZHANG Yuan WANG Yize WANG Xing ZHANG YANDong HE Key Laboratory of Microelectronic Devices and Circuits (MoE) Institute of MicroelectronicsPeking University

A conventional diode-triggered silicon-controlled rectifier(DTSCR) structure with a layout strategy for electrostatic discharge(ESD) protection is presented and confirmed in a 65-nm CMOS *** modified device is featured by a scaled-down trigger-diode string, which shortens its turn-on time using a variable scaling factor. To confirm the parasitic resistance adjustments of the modified DTSCR, transmission line pulsing(TLP)/very fast transmission line pulsing(VF-TLP) tests and simulations are performed on the device. Compared to a conventional DTSCR, this structure exhibits an improved turn-on speed and robustness, which are suitable for I/O protection of ESD events in the nanosecond range, particularly the charged-device model(CDM) event.

关键词： diode triggered silicon controlled rectifier(DTSCR) electrostatic discharge(ESD) transmission line pulsing(TLP) very fast transmission line pulsing(VF-TLP) turn-on behavior

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A Systematic Characterization Method for Time-resolved Stability and Reliability Issues on Lateral GaN Power devices

A Systematic Characterization Method for Time-resolved Stabi...

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International Symposium on Power Semiconductor devices and Ics (ISPSD)

作者： Yifei Huang Qimeng Jiang Sen Huang Xinyu Liu High-Frequency High-Voltage Device and Integrated Circuits R&D Center Institute of Microelectronics of the Chinese Academy of Sciences Beijing China University of Chinese Academy of Sciences Beijing China Key Laboratory of Microelectronic Devices & Integrated Technology Institute of Microelectronics of the Chinese Academy of Sciences Beijing China Institute of Microelectronics University of Chinese Academy of Sciences Beijing China

In this work, three testing modes, including continuous hard switching testing (HSW), high-voltage DC stress testing (DC) and recovery testing (RE), are implemented to characterize time-resolved dynamic $R_{\text{ON}}$ behaviors of GaN HEMT devices, based on the inductive-load evaluation platform. The proposed stressing pattern (DC-HSW-DC-RE) enables the separation of de-stress- and transient-stress-induced dynamic $R_{\text{ON}}$ . Based on the stressing pattern, a novel physical-based characterization method is proposed to identify the irreversible degradation of dynamic $R_{\text{ON}}$ , featuring excellent sensitivity when compared with the traditional methods. In addition, lifetime acceleration experiments are carried out, and the irreversible $R_{\text{ON}}$ degradation exhibits a strong dependence on voltage and current, but a weak dependence on temperature.

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Low power and high uniformity of HfOx-based RRAM via tip-enhanced electric fields

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Science China(Information Sciences) 2019年第10期62卷 164-170页

作者： Xiaokang LI Baotong ZHANG Bowen WANG Xiaoyan XU Yuancheng YANG Shuang SUN Qifeng CAI Shijie HU Xia AN Ming LI Ru HUANG Key Laboratory of Microelectronic Devices and Circuits (MOE) Institute of MicroelectronicsPeking University

In this paper, the HfOx-based resistive random access memory（RRAM） devices with sub-100 nm pyramid-type electrodes were fabricated. With the help of tip-enhanced electric field around the pyramid-type electrodes, it was experimentally demonstrated that the novel devices have better cycle-to-cycle variation control, lower forming/set voltage（1.97/0.7V） and faster switching speed（≤30 ns under 0.9V pulse） as well as better endurance reliability than conventional flat electrode resistive memory devices. In addition,the novel RRAM is experimentally demonstrated with independence of electrode number for the first time to present great potential in scaling down. This novel structure metal-oxide based RRAM will be suitable for the future low-power non-volatile memory application.

关键词： RRAM pyramid-type electrode variation reliability switching speed conducting filament

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Semimetallization induced Hall anomaly in doped polymers

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Physical Review Research 2024年第4期6卷 043180-043180页

作者： Zean Guo Jiawei Wang Mengmeng Li Yawei Lv Nianduan Lu Chong Bi Yeliang Wang Ling Li Ming Liu State Key Lab of Fabrication Technologies for Integrated Circuits Institute of Microelectronics Chinese Academy of Sciences Beijing 100029 China University of Chinese Academy of Sciences Beijing 100049 China Key Laboratory for Micro-/Nano-Optoelectronic Devices of the Ministry of Education School of Physics and Electronics Hunan University Changsha 410082 China School of Information and Electronics MIIT Key Laboratory for Low-Dimensional Quantum Structure and Devices Beijing Institute of Technology Beijing 100081 China

Hall anomaly related to deviations in Hall carrier concentrations have always been recognized as signs of charge incoherence in organic semiconductors, which lack ordered lattices. In this paper, we show that the Hall carrier concentration anomaly in doped polymers might be a result of semimetallization. Based on the observation of semimetal-like states, a dual-channel model, in which electrons and holes compensate the Hall voltages of each other, is employed to account for the anomaly. Observations of possible nonlinear Hall effect and temperature dependent Hall signs further support the origin of Hall anomaly from semimetal states.

关键词： Anomalous Hall effect Hall effect Conducting polymers Density functional theory Electron spin resonance X-ray photoelectron spectroscopy

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Experimental Investigation of Ultra-Low Temperature LA2O3/HFO2 Bi-Layer Dipole-First Process Using PVD Method for Advanced IC Technology

Experimental Investigation of Ultra-Low Temperature LA2O3/HF...

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China Semiconductor Technology International Conference (CSTIC)

作者： Yanzhao Wei Jiaxin Yao Renren Xu Qingzhu Zhang Huaxiang Yin Integrated Circuit Advanced Process R&D Center Institute of Microelectronics Chinese Academy of Sciences Beijing China School of Integrated Circuits University of Chinese Academy of Sciences Beijing China Key Laboratory of Microelectronic Devices and Integrated Technology Institute of Microelectronics Chinese Academy of Sciences Beijing China

In this paper, a La 2 O 3 /HfO 2 bi-layer dipole-first (DF) process is proposed and investigated by ultra-low temperature PVD dielectric laminates to achieve lower gate effective work function (EWF) for monolithic 3D-IC (M3D) application. The impacts of ultra-low temperature La-dipole on EWF modulation and interfacial properties are comprehensively investigated. It is found that the flat-band voltage (V FB ) negatively shifts 60 mV with sub-1nm La 2 O 3 thickness, which provides an effective way to meet the require of Si conduction band-edge EWF modulation. Furthermore, the electron trap/detrap densities (Not) and interfacial trap densities (Dit) are suppressed by La 2 O 3 /HfO 2 bi-layer DF process to improve device performance. These results exhibit a promising bi-layer DF process in low thermal integration for advanced IC technology.

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Deep insight into the voltage amplification effect from ferroelectric negative capacitance

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Science China(Information Sciences) 2019年第8期62卷 216-218页

作者： Huimin WANG Qianqian HUANG Mengxuan YANG Xing ZHANG Ru HUANG Key Laboratory of Microelectronic Devices and Circuits (MOE) Institute of Microelectronics

Dear editor,Power dissipation has become one of the most serious problems for nano-electronics. For conventional transistors, the operation voltage cannot be continuously reduced due to the fundamental limitation of subthreshold swing (SS)(60 mV/decade at room temperature)[1, 2]. The voltage amplification (VA) induced by the negative capacitance

关键词： Deep insight into the voltage amplification effect from ferroelectric negative capacitance

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Rectangular suspended single crystal Si nanowire with (001) planes and direction developed via TMAH wet chemical etching

Rectangular suspended single crystal Si nanowire with (001) ...

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2020 China Semiconductor Technology International Conference, CSTIC 2020

作者： Sun, Shuang Zhang, Baotong Yang, Yuancheng An, Xia Xu, Xiaoyan Huang, Ru Li, Ming Key Laboratory of Microelectronic Devices and Circuits Institute of Microelectronics Peking University Beijing100871 China

ISBN: (纸本)9781728165585

In this study, a kind of rectangular suspended single crystal Si nanowire with (001) planes and along direction is developed via a CMOS-compatible top-down scheme. In this scheme, the nanowires are formed by anisotropic etching of TMAH on different silicon crystallography orientations. By designing the initial orientations of hard mask patterns, the rectangular suspended silicon nanowires can be successfully fabricated without any sacrificial epitaxial layers. Due to the damage-free process and the high mobility on (001) planes, this scheme will provide a high-quality channel for the future gate-alI-around silicon transistor technology. © 2020 IEEE.

关键词： Nanowires

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