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检索条件"机构=Key Laboratory of Microelectronics Devices and Integrated Technology"
4866 条 记 录,以下是111-120 订阅
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Experimental investigation of the gate voltage range of negative differential capacitance in ferroelectric transistors
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Science China(Information Sciences) 2022年 第6期65卷 277-278页
作者: Mengxuan YANG Qianqian HUANG Chang SU Liang CHEN Yangyuan WANG Ru HUANG Key Laboratory of Microelectronic Devices and Circuits (MOE) Institute of MicroelectronicsPeking University Beijing Laboratory of Future IC Technology and Science Peking University
Dear editor,Recently, ferroelectric(FE)-based negative capacitance FET(NCFET) with ferroelectric/dielectric(FE/DE) gate stack has attracted extensive attention due to its capability of sub-60 mV/dec subthreshold swing... 详细信息
来源: 评论
High on-state current p-type tunnel effect transistor based on doping modulation
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Chinese Physics B 2023年 第7期32卷 577-581页
作者: 孙佳乐 张玉明 吕红亮 吕智军 朱翊 潘禹澈 芦宾 School of Microelectronics Xidian UniversityThe State Key Discipline Laboratory of Wide Band Gap Semiconductor TechnologyXi’an 710071China Department of Integrated Circuit Design Institute of Microelectronics TechnologyXi’an 710071China School of Physics and Information Engineering Shanxi Normal UniversityTaiyuan 030031China
To solve the problem of the low on-state current in p-type tunnel field-effect transistors(p-TFETs),this paper analyzes the mechanism of adjusting the tunneling current of a TFET device determined by studying the infl... 详细信息
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Advance in two-dimensional twisted moirématerials:Fabrication,properties,and applications
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Nano Research 2023年 第2期16卷 2579-2596页
作者: Han Yang Liwei Liu Huixia Yang Yu Zhang Xu Wu Yuan Huang Hong-Jun Gao Yeliang Wang MIIT Key Laboratory for Low-Dimensional Quantum Structure and Devices School of Integrated Circuits and ElectronicsBeijing Institute of TechnologyBeijing 100081China Institute of Physics Chinese Academy of SciencesBeijing 100190China
Two-dimensional(2D)twisted moirématerials,a new class of van der Waals(vdW)layered heterostructures with different twist angles between neighboring layers,have attracted tremendous attention due to their rich eme... 详细信息
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Sensitivity investigation of 100-MeV proton irradiation to SiGe HBT single event effect
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Chinese Physics B 2024年 第1期33卷 554-562页
作者: 冯亚辉 郭红霞 刘益维 欧阳晓平 张晋新 马武英 张凤祁 白如雪 马晓华 郝跃 State Key Laboratory of Wide Bandgap Semiconductor Devices School of MicroelectronicsXidian UniversityXi'an 710071China School of Materials Science and Engineering Xiangtan UniversityXiangtan 411105China School of Space Science and Technology Xidian UniversityXi'an 710071China State Key Laboratory of Experimental Simulation and Effects of Strong Pulse Radiation Northwest Institute of Nuclear TechnologyXi'an 710024China
The single event effect(SEE) sensitivity of silicon–germanium heterojunction bipolar transistor(Si Ge HBT) irradiated by 100-Me V proton is investigated. The simulation results indicate that the most sensitive positi... 详细信息
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High performance carrier stored trench bipolar transistor with dual shielding structure
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Chinese Physics B 2023年 第3期32卷 576-582页
作者: 张金平 邓浩楠 朱镕镕 李泽宏 张波 State Key Laboratory of Electronic Thin Films and Integrated Devices University of Electronic Science and Technology of China(UESTC)Chengdu 610054China Institute of Electronic and Information Engineering of UESTC in Guangdong Dongguan 523808China
We propose a novel high performance carrier stored trench bipolar transistor(CSTBT)with dual shielding structure(DSS-CSTBT).The proposed DSS-CSTBT features a double trench structure with different trench profiles in t... 详细信息
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Enhanced potassium storage of carbon nanofibers as binderfree anodes enabled by coupling ultra-small amorphous Sb_(2)O_(3),graphene modification and sulfur doping
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Rare Metals 2024年 第1期43卷 51-64页
作者: Zhao Huang Yu-Kang Lou Lin Peng Yuan Peng Meng-Meng Wang Ming Zhang College of Railway Transportation Hunan University of TechnologyZhuzhou 412007China College of Semiconductors(College of Integrated Circuits) Changsha Semiconductor Technology and Application Innovation Research InstituteHunan UniversityChangsha 410082China Key Laboratory for Micro-Nano Optoelectronic Devices of Ministry of Education College of Semiconductors(College of Integrated Circuits)Hunan UniversityChangsha 410082China
Considering the intrinsic advantages of natural copiousness and cost-effectiveness of potassium resource,potassium-ion batteries(KIBs) are booming as prospective alternatives to lithium-ion batteries(LIBs) in large-sc... 详细信息
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Substrate bias effects in p-channel GaN-on-Si transistors
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Science China(Information Sciences) 2025年 第1期68卷 404-405页
作者: Mengyao ZHAO Jie MA Lanlan YANG Chuanqi PAN Denggui WANG Jianjun ZHOU Sheng LI Jiaxing WEI Long ZHANG Siyang LIU Weifeng SUN National ASIC System Engineering Research Center School of Integrated Circuits Southeast University National Center of Technology Innovation for Electronic Design Automation Southeast University National Key Laboratory of Solid-State Microwave Devices and Circuits
The drain current (ID) of the n-channel GaN field-effecttransistor (n-FET) is influenced by the substrate-to-source bias voltage (VBS)(substrate bias effect)[1].Actually,nonzero VBSis also likely to occur in p-F... 详细信息
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A High-Efficiency Double Step Down Converter with Dual-Mode Control and Seamless Mode Transition in A Wide Load Current Range  56
A High-Efficiency Double Step Down Converter with Dual-Mode ...
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56th IEEE International Symposium on Circuits and Systems, ISCAS 2023
作者: Xue, Weidong Zhang, Yiseng Lai, Rongxing Zhao, Yutong Fang, Jian Ren, Junyan School of Microelectronics Fudan University Shanghai China State Key Laboratory of Electronic Thin Films and Integrated Devices University of Electronic Science and Technology of China Chengdu China
This paper presents a high-efficiency double step-down power converter with a dual-mode control scheme in a wide load range. A voltage-mode control scheme with an instant Tzcd and \text{Tsw}/2 mirror is employed in di... 详细信息
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A Systematic Characterization Method for Time-resolved Stability and Reliability Issues on Lateral GaN Power devices  35
A Systematic Characterization Method for Time-resolved Stabi...
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35th International Symposium on Power Semiconductor devices and ICs, ISPSD 2023
作者: Huang, Yifei Jiang, Qimeng Huang, Sen Liu, Xinyu University of Chinese Academy of Sciences Beijing100049 China Institute of Microelectronics The Chinese Academy of Sciences Key Laboratory of Microelectronic Devices & Integrated Technology Beijing100029 China
In this work, three testing modes, including continuous hard switching testing (HSW), high-voltage DC stress testing (DC) and recovery testing (RE), are implemented to characterize time-resolved dynamic RON behaviors ... 详细信息
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Simulation and optimization of dopant-free asymmetric heterojunction solar cells
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Optoelectronics Letters 2023年 第6期19卷 337-346页
作者: ZHENG Qiaoqiao YUAN Yujie HOU Guofu LI Wei TAO Ke PENG Zhuo Tianjin Key Laboratory of Film Electronic and Communication Devices School of Integrated Circuit Science and EngineeringTianjin University of TechnologyTianjin 300384China Institute of Photoelectronic Thin Film Devices and Technology Nankai UniversityTianjin 300350China
In order to further study doping-free asymmetric heterojunction(DASH) solar cells,we used AFORS-HET software to optimize the structure of Al/SnO_(2)/a-Si:H(i)/c-Si(p)/a-Si:H(i)/NiO_(x)/*** a certain adjustment range,a... 详细信息
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