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检索条件"机构=Microelectronics in the Electronics and Computer Engineering ECE Department"
1563 条 记 录,以下是1451-1460 订阅
排序:
High-level partitioning of digital systems based on dynamically reconfigurable devices
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作者: Kielbik, Rafal Moreno, Juan Manuel Napieralski, Andrzej Jablonski, Grzegorz Szymanski, Tomasz Department of Microelectronics and Computer Science Technical University of Lodz Al. Politechniki 11 93-590 Lodz Poland Department of Electronics Engineering Technical University of Catalunya c/ Gran Capita s/n 08034 Barcelona Spain
This paper presents a high-level temporal partitioning algorithm, which is able to split the VHDL description of a digital system into two equivalent subdescriptions. The primary goal of the algorithm is to obtain two... 详细信息
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A method of static test compaction based on don't care identification
A method of static test compaction based on don't care ident...
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IEEE International Workshop on Electronic Design, Test and Applications (DELTA)
作者: K. Miyase S. Kajihara S.M. Reddy Department of Computer Sciences and Electronics Kyushu Institute of Technology Japan Department of Computer Sciences and Electronics Center for Microelectronics Systems Kyushu Institute of Technology Japan Electrical and Computer Engineering Department University of Iowa USA
In this paper, we propose a procedure to compact a test set for a combinational circuit. Given a test set in which all input values are specified, the procedure first identifies don't care inputs of the test set, ... 详细信息
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On test data volume reduction for multiple scan chain designs
On test data volume reduction for multiple scan chain design...
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VLSI Test Symposium
作者: S.M. Reddy K. Miyase S. Kajihara I. Pomeranz Electrical and Computer Engineering Department University of Iowa USA Department of Computer Sciences and Electronics Kyushu Institute of Technology Japan Center for Microelectronics Systems Kyushu Institute of Technology Japan School of Electrical and Computer Engineering Purdue University USA
We consider issues related to the reduction of scan test data in designs with multiple scan chains. We propose a metric that can be used to evaluate the effectiveness of procedures for reducing the scan data volume. T... 详细信息
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High frequency optical integrated circuit design and first iteration realisation in standard silicon CMOS integrated circuitry
High frequency optical integrated circuit design and first i...
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International Symposium on Electron Devices for Microwave and Optoelectronic Applications (EDMO)
作者: L.W. Snyman A. Bogalecki L.M. Canning M. Du Plessis H. Aharoni Currently at the Department of Electronic Engineering and the French South African Tcchnical Institute in Electronics Pretoria South Africa Carl and Emily Fuchs Institute for Microelectronics Department of Electrical Electronic and Computer Engineering University of Pretoria Pretoria South Africa Department of Electrical and Computer Engineering Carl and Emily Fuchs Institute for Microelectronics Beersheba Israel
A prototype silicon CMOS optical integrated circuit (Si CMOS OEIC) was designed and simulated using standard 0.8 /spl mu/m Bi-CMOS silicon integrated circuit technology. The circuit consisted of an integrated silicon ... 详细信息
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Modelling and analysis of power dissipation in single electron logic
Modelling and analysis of power dissipation in single electr...
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International Electron Devices Meeting (IEDM)
作者: S. Mahapatra A.M. Ionescu K. Banerjee M.J. Declercq Electronics Laboratory (LEG) Institute of Microelectronics and Microsystems Imm. Swiss Federal Institute of Technology Lausanne Switzerland Department of Electrical and Computer Engineering University of California Santa Barbara CA USA Electronics Laboratory (LEG) Institute of Microelectronics and Microsystems Imm Swiss Federal Institute of Technology Lausanne Switzerland
A new analytical model for Single Electron Transistors (SETs) that can be used for co-simulation with CMOS is developed and validated with Monte Carlo simulation. The model includes temperature dependence, device asym... 详细信息
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Guest editorial special section on issues related to semiconductor manufacturing at technology nodes below 70 nm
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IEEE Transactions on Semiconductor Manufacturing 2002年 第2期15卷 133-136页
作者: R. Singh R.R. Doering H. Koike Kinam Kim M. Heyns Department of Electrical and Computer Engineering Clemson University Clemson SC USA Texas Instruments Incorporated Dallas TX USA Toshiba Corporation Semiconductor Company Advanced Microelectronics Center Yokohama Japan Samsung Electronics Kyunggi-Do Korea IMEC Leuven Belgium
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Innovative nitride passivation for pseudomorphic GaAs HEMTs and impact on device performance
Innovative nitride passivation for pseudomorphic GaAs HEMTs ...
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Annual International Symposium on Reliability Physics
作者: Y.C. Chou P. Nam G.P. Li L.K. Kim R. Grundbacher E. Ahlers Y. Ra Q. Xu M.B. Biedenbender A. Oki Microelectron. Products & Processes TRW Space & Electron. Redondo Beach CA USA Department of Electrical and Computer Engineering University of California Irvine CA TRW Space and Electronics Microelectronics Products and Processes Redondo Beach CA Bethel Material Research Placentia CA
A novel low temperature nitride deposition technique using high-density inductively coupled plasma chemical vapor deposition (HD-ICP-CVD) to passivate 0.15 /spl mu/m pseudomorphic GaAs HEMTs has been developed for the... 详细信息
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Raman and photoluminescence characterization of Ge nanocrystals in co-sputtered Ge + SiO2 system
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Materials Science and engineering C 2001年 第1-2期16卷 135-138页
作者: Choi, W.K Ng, V. Ho, Y.W Ng, S.P Chen, T.B Yu, M.B Rusli Yoon, S.F Cheong, B.A Chen, G.L Microelectronics Laboratory Department of Electrical and Computer Engineering National University of Singapore 4 Engineering Drive 3 Singapore 117576 Singapore School of Electrical and Electronics Engineering Nanyang Technological University Nanyang Avenue Singapore 639798 Singapore Data Storage Institute 5 Engineering Drive 1 Singapore 117608 Singapore
Raman and photoluminescence (PL) results of Ge nanocrystals prepared from co-sputtered Ge + SiO2 samples under rapid-thermal annealling (RTA) with different annealing conditions are presented. The Raman results showed... 详细信息
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An automated tool for analysis and design of MVL digital circuits
An automated tool for analysis and design of MVL digital cir...
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Symposium on Integrated Circuits and Systems Design (SBCCI)
作者: L.P. Nascimento Department of Electronics and Microelectronics School of Electrical and Computer Engineering State University of Campinas-UNICAMP Brazil
In the development of logical circuits projects in Multivalued Logic, it is necessary to obtain the result of logical expressions that sometimes are very large and complex. A software called ELOmv, that is capable of ... 详细信息
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A system for tracking laboratory animals based on optical flow and active contours
A system for tracking laboratory animals based on optical fl...
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International Conference on Image Analysis and Processing
作者: Z. Kalafatic S. Ribaric V. Stanisavljevic Faculty of Electrical Engineering and Computing Department of Electronics Microelectronics Computer and Intelligent Systems Zagreb Croatia
We present a working system for real-time tracking of multiple laboratory animals. As it is usually possible to ensure good contrast between the animals and the background, the tracking of a single animal or several p... 详细信息
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