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检索条件"机构=Optical Science and Engineering Program"
156 条 记 录,以下是151-160 订阅
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Fracture and deformation of thermal oxide films on Si (100) using a femtosecond pulsed laser
Fracture and deformation of thermal oxide films on Si (100) ...
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2005 Materials Research Society Spring Meeting
作者: McDonald, Joel P. Mistry, Vanita R. Ray, Katherine E. Yalisove, Steven M. Applied Physics Program University of Michigan 2477 Randall Laboratory Ann Arbor MI 48109-1120 College of Engineering University of Michigan Lurie Engineering Center 1221 Beat Avenue Ann Arbor MI 48109-2102 Department of Materials Science and Engineering University of Michigan 2200 Hayward Ave Ann Arbor MI 48109 Center for Ultrafast Optical Science University of Michigan 1006 Gerstacker Building 2200 Bonisteel Avenue Ann Arbor MI 48109
Femtosecond pulsed laser damage of Silicon (100) with thermal oxide thin films was studied in order to further understand the optical and electrical properties of thin films and to evaluate their influence on the dama... 详细信息
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Self-Limited Photo-Assisted Synthesis of Silicon Nanocrystals
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MRS Online Proceedings Library 2005年 第1期832卷 75-80页
作者: C.Y. Chen S. Kimura S. Sen S. Nozaki H. Ono K. Uchida H. Monsaki Department of Electronic Engineering The University of Electro-Communications Chofu-Shi Tokyo Japan The 21st Century COE Program: Coherent Optical Science The University of Electro-Communications Chofu-Shi Tokyo Japan
Anomalous growth of silicon (Si) nanocrystals (NCs) was observed during Raman scattering measurements of nanosilica SiOx (x=0.9) powder with an average diameter of 40 nm. It was found that Si NCs were formed by exposu...
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A nanoscale approach to stamp fabrication in hard materials using high intensity ultrafast lasers
A nanoscale approach to stamp fabrication in hard materials ...
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2003 MRS Fall Meeting
作者: McDonald, Joel P. Picard, Yoosuf N. Yalisove, Steven M. Liu, Hsiao-Hua Blaszczak, Joseph Guo, Lingji J. Dept. of Materials Science and Engineering University of Michigan Ann Arbor MI 48109-2176 United States Center for Ultrafast Optical Science University of Michigan Ann Arbor MI 48109-2099 United States Applied Physics Program University of Michigan Ann Arbor MI 48109-1120 United States Dept. of Electrical Engineering and Computer Science University of Michigan Ann Arbor MI 48109-2122
Nanomorphing with ultrafast lasers may have a significant role in direct write stamp production. Surface conditions play a critical role in the ablative properties of materials. We have conducted femtosecond laser (pu... 详细信息
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Cutting reactive foils without igniting them (a femtosecond laser machining approach)
Cutting reactive foils without igniting them (a femtosecond ...
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Synthesis, Characterization and Properties of Energetic/Reactive Nanomaterials
作者: Picard, Yoosuf N. Liu, Hsiao-Hua Speys, Stephen J. McDonald, Joel P. Adams, David P. Weihs, Timothy P. Yalisove, Steven M. Dept. of Mat. Sci. and Engineering University of Michigan Ann Arbor MI 48109-2176 United States Center for Ultrafast Optical Science University of Michigan Ann Arbor MI 48109-2099 United States Dept. of Mat. Sci. and Engineering Johns Hopkins University Baltimore MD 21218-2686 United States Applied Physics Program University of Michigan Ann Arbor MI 48109-1120 United States Advanced Manufacturing Processes Lab Sandia National Laboratories Albuquerque NM 87185-0959 United States
Ni/Al nanostructured multilayer foils were machined with femtosecond pulse-length laser irradiation at various fluences. Scanning electron microscopy, back-scattered electron detection, and atomic force microscopy wer... 详细信息
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Introduction
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International Journal of High Speed Electronics and Systems 1997年 第4期8卷 iii-vi页
作者: Sien Chi Tien Pei Lee Institute of Electro-Optical Engineering National Chiao Tung University Hsinchu Taiwan R.O.C. Optoelectronic Technology Research Bell Communications Research (Bellcore) Red Bank New Jersey 07701-5699 U.S.A. Dr. Lee retired from Bellcore in February 1997. He is currently the Program Director at the National Science Foundation Arlington Virginia.
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AUTOMATION OF PROPELLER INSPECTION AND FINISHING
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NAVAL ENGINEERS JOURNAL 1985年 第4期97卷 124-131页
作者: STERN, H METZGER, R Howard K. Stern:is presently vice president of Robotic Vision Systems Inc. He received a bachelor of electrical engineering degree from College of the City of New York in 1960. Mr. Stern joined Dynell Electronics Corporation in 1971 and became part of the Robotic Vision Systems Inc. staff at the time of its spin-off from Dynell. He was program manager of the various three-dimensional sensing and replication systems constructed by Dynell and Robotic Vision Systems. As program manager his responsibilities encompassed technical administrative and operational areas. The first two portrait sculpture studio systems and the first three replication systems built by Robotic Vision Systems Inc. were designed manufactured and operated under his direction. Before joining Dynell Mr. Stern was a senior engineer at Instrument Systems Corporation and chief engineer of the Special Products Division of General Instrument Corporation. Prior to these positions Mr. Stern was chief engineer of Edo Commercial Corporation. At General Instrument and Edo Commercial he was responsible for the design and manufacture of military and commercial avionics equipment. Mr. Stern is presently responsible for directing the systems design and development for all of the company's programs. Robert J. Metzger:is currently engineering group leader at Robotic Vision Systems Inc. He graduated summa cum laude from the Cooper Union in 1972 with a bachelor of electrical engineering degree. Under sponsorship of a National Science Foundation graduate fellowship he graduated from the Massachusetts Institute of Technology in 1974 with the degrees of electrical engineer and master of science (electrical engineering). In 1979 Mr. Metzger graduated from Polytechnic Institute of New York with the degree of master of science (computer science). Since 1974 Mr. Metzger has been actively engaged in the design of systems and software for noncontact threedimensional optical measurement for both military and commercial applications. Of particular note are his c
Ship's propellers are currently measured by manual procedures using pitchometers, templates and gauges. This measurement process is extremely tedious, labor intensive and time consuming. In an effort to provide in... 详细信息
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