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检索条件"机构=Package and Test Automation Metrology Systems"
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Flux Real-Time Imaging System: High-Speed, High-Throughput Automated Visual Inspection and Defect Detection for Monitoring Flux Dispense  34
Flux Real-Time Imaging System: High-Speed, High-Throughput A...
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34th Annual SEMI Advanced Semiconductor Manufacturing Conference, ASMC 2023
作者: Edwards, Chris Wilcox, Robin Vance, Darren Swamy, Meghana Xu, Nancy Analytics & Technology Automation Package and Test Automation Metrology Systems ChandlerAZ United States
We present our new Flux Real-Time Imaging System which includes a new machine vision system, calibration utility, user interface, and inspection algorithm. The machine vision system was designed to optimize contrast b... 详细信息
来源: 评论
Flux Real-Time Imaging System: High-Speed, High-Throughput Automated Visual Inspection and Defect Detection for Monitoring Flux Dispense
Flux Real-Time Imaging System: High-Speed, High-Throughput A...
收藏 引用
IEEE/SEMI Conference and Workshop on Advanced Semiconductor Manufacturing
作者: Chris Edwards Robin Wilcox Darren Vance Meghana Swamy Nancy Xu Package and Test Automation Metrology Systems Analytics & Technology Automation Chandler Arizona Thermal Compression Bond Equipment Assembly & Test Technology Development Chandler Arizona
We present our new Flux Real-Time Imaging System which includes a new machine vision system, calibration utility, user interface, and inspection algorithm. The machine vision system was designed to optimize contrast b... 详细信息
来源: 评论