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This study evaluated the adhesion behavior and efficiency of p-Terphenyl (PTP) films subjected to annealing at various temperatures. After substrate cleaning and vacuum thermal evaporation, the samples were annealed in a muffle furnace with a temperature ramp rate of 10 °C/min. The minimum annealing temperature was determined through thermogravimetric analysis. The samples were characterized morphologically and structurally, both before and after annealing, to investigate how these properties were influenced by the thermal process. The VUV light transmission efficiency variation of the PTP film was measured using a monochromator, while adhesion to the substrate was assessed using Scratch Test. The results indicated significant improvements in the optimization of X-ARAPUCA devices. Specific annealing processes were found to enhance the crystallinity and structural order of the films. At moderate annealing temperatures (up to 70 °C), both adhesion and efficiency improved. Conversely, higher temperatures led to material degradation and increased surface roughness. At 70 °C, efficiency increased by approximately 10%, and adhesion was optimized, as evidenced by an increase in the critical supported load, which reached 75 mN.
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版权所有:内蒙古大学图书馆 技术提供:维普资讯• 智图
内蒙古自治区呼和浩特市赛罕区大学西街235号 邮编: 010021
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