检索结果-内蒙古大学图书馆

Frontiers in Optics, FIO 2012

作者： Li, Heng Wan, Chenchen Chong, Andy Wise, Frank W. CLASSE Department of Physics Cornell University Ithaca NY 14853 United States Electro-Optic Program University of Dayton Dayton OH 45469 United States Department of Physics University of Dayton Dayton OH 45469 United States Department of Applied Physics Cornell University Ithaca NY 14853 United States

We measured the three-dimensional intensity profile of the Airy-Bessel linear light bullet clearly resolving its complicated three-dimensional structures. The measurement also retrieved its step-function-like temporal... 详细信息

ISBN: (纸本)9781557529565

关键词： Phase measurement

来源：评论

学校读者我要写书评

暂无评论

Photoresponse Characteristics of Archetypal Metal-Organic Frameworks (vol 116, pg 3112, 2012)

引用

JOURNAL OF PHYSICAL CHEMISTRY C 2012年第15期116卷 8858-8858页

作者： Feldblyum, Jeremy I. Keenan, Elizabeth A. Matzger, Adam J. Maldonado, Stephen Macromolecular Science and Engineering University of Michigan Ann Arbor MI 48109-2136 2300 Hayward Avenue United States Department of Chemistry University of Michigan Ann Arbor MI 48109-1055 930 North University United States Program in Applied Physics University of Michigan Ann Arbor MI 48109-1040 450 Church Street United States

The photoelectrochemical responses of two archetypal metal–organic frameworks (MOFs), MOF-5 and MOF-177, have been assessed. Films of MOF-5 and MOF-177 were grown on carboxylic-acid-terminated conductive fluorine-doped tin oxide substrates. Separate analyses by powder X-ray diffraction, Raman spectroscopy, and fluorescence spectroscopy collectively indicated these films prepared via a solvothermal method in diethylformamide were free of residual impurities such as ZnO clusters and residual organics. Exposure of these films to white light illumination while immersed in acetonitrile electrolytes elicited measurable photocurrents. Wavelength-dependent analysis of the photoresponses showed that the measured photocurrents were induced by ultraviolet light and that the spectral response profiles followed closely the light absorption profiles of each respective material. Attenuation of the induced photocurrents was noted after prolonged ultraviolet light illumination and/or exposure of the films to H2O(l), indicating that the observed photoresponse properties are directly related to the structural integrity of these MOFs. The cumulative data illustrate that such MOFs have innately light-sensitive properties that are atypical in high surface area materials.

关键词： Photonics Photoresponse Metal organic frameworks Quantum mechanics Materials

来源：评论

学校读者我要写书评

暂无评论

Flash-lamp-induced lateral solidification of thin Si films

引用

2011 MRS Spring Meeting

作者： Omori, K. Ganot, G.S. Chung, U.J. Chitu, A.M. Limanov, A.B. Im, James S. Program in Materials Science and Engineering Department of Applied Physics and Applied Mathematics Columbia University New York NY United States Technical Development Department Japan Steel Works LTD. Yokohama Japan Department of Materials Science and Engineering College of Engineering Korea Advanced Institute of Science and Technology Korea Republic of

ISBN: (纸本)9781605112985

In this paper we show that a flash lamp can be employed to induce controlled lateral solidification of a-Si thin films. Specifically, a dual xenon-arc-lamp-based system was utilized to induce location-controlled complete melting by shaping the incident beam using a contact mask. The resulting laterally solidified microstructure consisted of exceptionally long grains (∼10s to ∼100s of μm) that were relatively free of intragrain-defects. With further development and optimization, the approach may lead to cost-effective/high-throughput processes and systems that can capture and enhance the advantages of laser-based/melt-mediated crystallization techniques. © 2011 Materials Research Society.

关键词： Cost effectiveness

来源：评论

学校读者我要写书评

暂无评论

Conditions of the fuzzy internet mortgage market submodels implementation

Frontiers in Artificial Intelligence and Applications

引用

Frontiers in Artificial Intelligence and Applications 2012年 243卷 1470-1479页

作者： Orlowski, Aleksander Szczerbicki, Edward Gdansk University of Technology Faculty of Applied Physics Mathematics PhD Program Poland Gdansk University of Technology Faculty of Management and Economics Poland

ISBN: (纸本)9781614991045

The paper introduces some challenges of the fast growing mortgage market in Poland, being also the next step of research presented in previous publications, showing the complete process of building and verifying three submodels for the internet mortgage market. The sub-models are described for three market situations, i.e. stable market, crisis, and boom, then the variables within the models are analyzed statistically (e.g. correlation level) and finally the models are verified. The paper presents the process of verification of submodel nr 3 (fast growing market) as an example of the verification process that was applied. The paper concludes with directions for further research in this area leading to the ultimate application of the proposed model in a real life prognosis process. © 2012 The authors and IOS Press. All rights reserved.

关键词： Fuzzy logic

来源：评论

学校读者我要写书评

暂无评论

Excimer-laser-induced melting and solidification of PECVD a-Si films under partial-melting conditions

引用

2011 MRS Spring Meeting

作者： Hu, Q. Lee, Catherine S. Li, T. Deng, Y. Chung, U.J. Limanov, A.B. Chitu, A.M. Thompson, M.O. Im, James S. Program in Materials Science and Engineering Department of Applied Physics and Applied Mathematics Columbia University New York NY United States Department of Materials Science and Engineering College of Engineering Korea Advanced Institute of Science and Technology Daejeon Korea Republic of Department of Materials Science and Engineering College of Engineering Cornell University Ithaca NY United States

ISBN: (纸本)9781605112985

This paper reports on new experimental findings and conclusions regarding the pulsed-laser-induced melting-and-solidification behavior of PECVD a-Si films. The experimental findings reveal that, within the partial-melting regime, these a-Si films can melt and solidify in ways that are distinct from, and more complex than, those encountered in microcrystalline-cluster-rich LPCVD a-Si films. Specifically (1) spatially dispersed and temporally stochastic nucleation of crystalline solids occurring relatively effectively at the moving liquid-amorphous interface, (2) very defective crystal growth that leads to the formation of fine-grained Si proceeding, at least initially after the nucleation, at a sufficiently rapidly moving crystal solidification front, and (3) the propensity for local preferential remelting of the defective regions and grain boundaries (while the beam is still on) are identified as being some of the fundamental factors that can participate and affect how these PECVD films melt and solidify. © 2011 Materials Research Society.

关键词： Nucleation

来源：评论

学校读者我要写书评

暂无评论

Mie scattering of purely azimuthal Laguerre-Gauss beams: Angular-momentum-induced transparency

引用

Physical Review A 2012年第5期86卷 053830-053830页

作者： Aaron S. Rury Richard Freeling Applied Physics Program University of Michigan 450 Church Street Ann Arbor Michigan 48109 USA SRI International Inc. Ann Arbor Michigan 48105 USA

The Mie scattering of a circularly polarized, purely azimuthal Laguerre-Gauss beam carrying orbital angular momentum from a particle small compared with the incident wavelength is treated analytically. Using the vector spherical harmonics, we show angular momentum conservation leads to two physical mechanisms that cause vanishingly small scattering intensity when the dipole moment dominates the response of the particle. The application of this angular-momentum-induced transparency is discussed in the case of a plasmonic crystal whose collective modes possess a well-defined angular momentum content.

关键词： MIE scattering LAGUERRE-Gaussian beams ANGULAR momentum (Mechanics) WAVELENGTHS SPHERICAL harmonics

来源：评论

学校读者我要写书评

暂无评论

Phase transition behavior in microcantilevers coated with M 1-phase VO2 and M2-phase VO2:Cr thin films

Phase transition behavior in microcantilevers coated with M ...

引用

作者： Rúa, Armando Cabrera, Rafmag Coy, Horacio Merced, Emmanuelle Sepúlveda, Nelson Fernández, Félix E. Department of Physics University of Puerto Rico Mayagüez 00681-9000 Puerto Rico Doctoral Program in Physics Graduate Center City University of New York New York 10016 United States Applied Materials Group Electrical and Computer Engineering Department Michigan State University E. Lansing MI 48824 United States

Silicon microcantilevers were coated by pulsed laser deposition with vanadium dioxide (VO2) (monoclinic M1 phase) and V 1-xCrxO2 with x near 0.024 (monoclinic M 2 phase), and their mechanical characteristics were studied as a function of temperature through the films' insulator-to-metal transition (IMT). The undoped VO2 films grew with (011)M1 planes parallel to the substrate, while Cr-doped VO2 films grew oriented with (201)M2 and (2 01)M2 planes parallel to the substrate. In both cases, the films transformed reversibly through the IMT to the tetragonal (rutile, R) phase, with film (110)R planes oriented parallel to the substrate. The fundamental resonant frequencies of the cantilevers were measured as the temperature was cycled from ambient temperature, through the IMT, and up to 100 °C. Very high resonant frequency changes were observed through the transition for both types of samples, with increases during heating of over 11 and over 15 for the cantilevers coated with pure and Cr-doped VO2, respectively. From the resonant frequencies measured at room temperature for the bare and coated cantilevers in each case, the effective Young's moduli of the films were determined. The values obtained, assuming bulk densities for the films, are 156 ± 7.5 GPa for VO2 (M1 phase) and 102 ± 3 GPa for Cr-doped VO2 (M2 phase). Strong curvature changes during the transition to the R phase were also observed for cantilevers coated with both types of films, but these were significantly higher in the case for the Cr-doped film. Curvature changes for temperature ranges outside the IMT region were small and attributed to differential thermal expansion between film and silicon substrate. From measured cantilever tip displacements in this post-transition range-for the undoped VO 2-coated microcantilevers-a rough estimate of 110 GPa was obtained for the effective Young's modulus for R-phase VO2. The substantially higher changes in resonant frequency and curvature for V1-xCr xO2-coated cant

关键词： Thin films

来源：评论

学校读者我要写书评

暂无评论

Effect of Film Thickness Variation on (100)-Surface Texturing of MPS Processed Polycrystalline Si Films

引用

MRS Online Proceedings Library 2012年第1期1426卷 257-262页

作者： Monica Chahal P. C. van der Wilt D. Van Gestel A. B. Limanov A. M. Chitu James S. Im Program in Materials Science and Engineering Department of Applied Physics and Applied Mathematics Columbia University New York USA IMEC Solar Cell Tech. Group Leuven Belgium WCU Program Department of Materials Science and Engineering College of Engineering Korea Advanced Institute of Science and technology (KAIST) Korea

We have investigated the effect of varying the film thickness on the surface orientation texturing in polycrystalline Si films obtained via mixed-phase solidification (MPS) of initially a-Si precursor films on SiO2. It is found that, for a given number of MPS exposure cycles, the degree of (100)-surface texturing is reduced as the film thickness is increased. We discuss how this trend can be accounted for by the previously proposed thermodynamic model of MPS, wherein a decreasing local solid/liquid interface curvature with increasing film thickness is identified as the primary cause for decreasing the influence which anisotropic solid-Si/SiO2 interfacial energies have on the survivability of the grains. This, in turn, leads to other factors becoming more significant in determining the grains that survive the MPS cycle, thereby reducing the degree of (100)-surface texturing in the resulting films.

关键词： Si microstructure texture

来源：评论

学校读者我要写书评

暂无评论

Inside Cover: Out-of-Cell Oxygen Diffusivity Evaluation in Lithium–Air Batteries (ChemElectroChem 12/2014)

引用

ChemElectroChem 2014年第12期1卷 2032-2032页

作者： Prof. Weidong He Xiaoning Wang Luhan Ye Yu Pan Yuanqiang Song Aifang Liu Wei Wang Hongping Zhang Hongxue Qi Ming Zhou Zhiguo Wang Kelvin H. L. Zhang James H. Dickerson School of Energy Science and Engineering University of Electronic Science and Technology (UESTC) Chengdu Sichuan 611731 (P. R. China) Interdisciplinary Program in Materials Science Vanderbilt University Nashville Tennessee 37234-0106 (USA) Vanderbilt Institute of Nanoscale Science and Engineering Vanderbilt University Nashville Tennessee 37234-0106 (USA) Shenzhen Key Laboratory for Advanced Materials Department Material Science and Engineering Shenzhen Graduate School Harbin Institute of Technology University Town Shenzhen 518055 (P. R. China) School of Materials Science and Engineering Southwest University of Science and Technology Mianyang Sichuan 621010 (P. R. China) Department of Chemistry The University of Hong Kong Pokfulam Road (Hong Kong) Department of Applied Physics University of Electronic Science and Technology of China Chengdu 610054 (P. R China) Department of Chemistry Chemistry Research Laboratory University of Oxford Mansfield Road Oxford OX1 3TA (UK) Department of Physics Brown University Providence RI 02912 (USA)

来源：评论

学校读者我要写书评

暂无评论

Estimation Theoretic Measure of Resolution for Stochastic Localization Microscopy

引用

Physical Review Letters 2012年第4期109卷 048102-048102页

作者： James E. Fitzgerald Ju Lu Mark J. Schnitzer Department of Physics Stanford University Stanford California 94305 USA Department of Biology Stanford University Stanford California 94305 USA Department of Applied Physics the CNC Program and the Howard Hughes Medical Institute Stanford University Stanford California 94305 USA

One approach to super-resolution fluorescence microscopy, termed stochastic localization microscopy, relies on the nanometer scale spatial localization of individual fluorescent emitters that stochastically label specific features of the specimen. The precision of emitter localization is an important determinant of the resulting image resolution but is insufficient to specify how well the derived images capture the structure of the specimen. We address this deficiency by considering the inference of specimen structure based on the estimated emitter locations. By using estimation theory, we develop a measure of spatial resolution that jointly depends on the density of the emitter labels, the precision of emitter localization, and prior information regarding the spatial frequency content of the labeled object. The Nyquist criterion does not set the scaling of this measure with emitter number. Given prior information and a fixed emitter labeling density, our resolution measure asymptotes to a finite value as the precision of emitter localization improves. By considering the present experimental capabilities, this asymptotic behavior implies that further resolution improvements require increases in labeling density above typical current values. Our treatment also yields algorithms to enhance reliable image features. Overall, our formalism facilitates the rigorous statistical interpretation of the data produced by stochastic localization imaging techniques.

关键词： RESOLUTION (Optics) STOCHASTIC processes LOCALIZATION theory FLUORESCENCE microscopy ESTIMATION theory IMAGING systems

来源：评论

学校读者我要写书评

暂无评论

建议与咨询留下您的常用邮箱和电话号码，以便我们向您反馈解决方案和替代方法

时间限定

文献类型

馆藏选择

核心期刊

语言

文献类型

帮助

文字说明：

检索规则说明：

检索范例：

分类表

所选分类

限定检索结果

文献类型

馆藏范围

日期分布

学科分类号

主题

机构

作者

语言

请选择保存的检索档案：

请选择收藏分类：

通借通还

建议与咨询 留下您的常用邮箱和电话号码，以便我们向您反馈解决方案和替代方法

时间限定

文献类型

馆藏选择

核心期刊

语言

文献类型

帮助

文字说明：

检索规则说明：

检索范例：

分类表

所选分类

限定检索结果

文献类型

馆藏范围

日期分布

学科分类号

主题

机构

作者

语言

请选择保存的检索档案： 新增检索档案 确定 取消

请选择收藏分类： 新增自定义分类 确定 取消

通借通还

建议与咨询留下您的常用邮箱和电话号码，以便我们向您反馈解决方案和替代方法

请选择保存的检索档案：

请选择收藏分类：