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Annual IEEE Conference on Applied Power Electronics Conference and Exposition (APEC)

作者： T. Zaitsu Y. Fuda Y. Okabe T. Ninomiya S. Hamamura M. Katsuno Transmission Device Development Department 2nd Transmission Division Transmission Operations Unit NEC Corporation Limited Kawasaki Japan Department of Electrical and Electronics Systems Engineering Kyushu University Fukuoka Japan R&D center TOKIN Corporation Sendai Japan Device Technology Department Transmission and Terminals Division NEC Engineering Limited Kawasaki Japan

A new piezoelectric transformer (PT) converter which functions as an AC-adapter is proposed. The device's PT operates in longitudinal-vibration mode and features good isolation, incombustibility and compact size. The PT was implemented as a part of the new AC-adapter and a significant reduction in size was achieved as a result. Experimental evaluation of the new adapter confirms that good performance was successfully obtained in spite of the need to comply with strict safety and noise standards.

关键词： Power transformer insulation Safety National electric code Vibrations Application software Inverters Commercialization Power generation Magnetic materials research and development

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Impedance Spectra of Solid Oxide Fuel Cell

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ECS Proceedings Volumes 1997年第1期1997-40卷

作者： H. Kuboyama T. Shoho M. Matsunaga R&D Center Aso Cement 2648 Nakabaru Kasuya-machi Kasuya-gun Fukuoka 811-23 Japan Department of Applied Chemistry Faculty of Engineering Kyushu Institute of Technology Sensui-cho Tobata-ku Kitakyushu 804 Japan

The reaction mechanism of oxygen electrode has been studied by impedance spectroscopy in order to improve the performance of a solid oxide fuel cell. reproducible impedance spectra was confirmed by using the improved cell, consisting of a thin YSZ disk and sintered platinum electrodes. The spectra measured for an O2 / O2 cell at 1173 K were composed of three depressed arcs at least. The partial pressure of oxygen influenced the impedance values. For two large semi-circles at frequencies less than 100k Hz, the time constants evaluated by complex nonlinear least squares fitting are independent of the partial pressure of oxygen. These results suggest no influence of the oxygen content on the reaction mechanism of oxygen reduction. Since the resistance of the semi-circle at frequencies between 300 and 100k Hz, however, increases with reducing the oxygen content, this arc corresponds to the charge transfer of an adsorbed oxygen atom.

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Abstracts of Papers Presented at the Japan-Israel Workshop on Novel Approaches for Controlling Insect Pests and Plant diseases Binational Plant Protection Cooperation

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Phytoparasitica 1997年第4期25卷 345-366页

作者： I. Yamamoto I. Ishaaya A. r. Horowitz Shinzo Kagabu Akinori Hirashima E. Shaaya M. Kostjukovsky K. r. S. Ascher d. Veierov N. Aharonson E. Kleter Miriam Eliyahu Annie Fenigstein Yoel Sasson E. Gershburg d. Stockholm H. rivkin N. Zilberberg M. Gurevitz N. Chejanovsky Yechiel Shai Ehud Gazit M. Keller B. Sneh N. Strizhov Avital regev Szuszanna Koncz-Kaiman C. Koncz J. Schell Aviah Zilberstein Galina Gindin I. Barash B. raccah I. S. Ben-Ze’ev Itamar Glazer A. Navon Ephraim Cohen Satoshi Nakamura Takane Fujimori Ezra dunkelblum Moshe Kehat Tetsu Ando Miriam Altstein Orna Ben-Aziz Irit Schafler I. Seltzer C. Gilon Ada rafaeli Carina Gileadi K. Ohsawa Yael Heifetz Shalom W. Applebaum A. Shani I. Yamaguchi T. Motoyama T. Yoshimoto T. Fujita Yigal Cohen Alexander Baider Sonja Farkash Shlomit Klopman dvir Taler Shinkichi Tawata Baruch Sneh Y. Elad Abraham Sztejnberg S. droby E. Chalutz Yeheskel Antignus Moshe Lapidot Mitsuro Hyakumachi Uri Hanania Noa Furman Adi Avni Vivian Fridman Shai Morin Mohammad Zeidan Hanokh Czosnek Toshihiro Kajiwara Dept. of Agricultural Chemistry Tokyo University of Agriculture Tokyo Japan Dept. of Entomology ARO The Volcani Center Bet Dagan Israel Dept. of Chemistry Faculty of Education Gifu University Gifu Japan Dept. of Agricultural Chemistry Kyushu University Fukuoka Japan Dept. of Stored Products ARO The Volcani Center Bet Dagan Israel Inst. of Plant Protection ARO The Volcani Center Bet Dagan Israel R&D Division Makhteshim Chemical Works Be’er Sheva Casali Inst. of Applied Chemistry The Hebrew University of Jerusalem Jerusalem Israel Inst. of Plant Protection ARO The Volcani Center Bet Dagan Dept. of Botany Tel-Aviv University Tel Aviv Israel Dept. of Membrane Research and Biophysics The Weiztnann Institute of Science Rehovot Israel Dept. of Plant Sciences Tel-Aviv University Tel Aviv Israel Max Planck Institute for Plant Breeding Research Köln Germany Dept. of Botany Tel-Aviv University Tel Aviv Plant Protection and Inspection Services Ministry of Agriculture and Rural Development Bet Dagan Israel Dept. of Nematology ARO The Volcani Center Bet Dagan Israel Dept. of Entomology The Hebrew University of Jerusalem Faculty of Agricultural Food and Environmental Quality Sciences Rehovot Israel Japan International Research Center for Agricultural Sciences Ministry of Agriculture Forestry and Fisheries Tsukuba 305 Japan Plant Protection Research Laboratory Japan Tobacco Inc. Yokohama 227 Japan Graduate School of Bio-Applications and Systems Engineering (BASE) Tokyo University of Agriculture and Technology Koganei Tokyo 184 Japan Inst. of Plant Protection ARO The Volcani Center BetDagan Dept. of Organic Chemistry The Hebrew University of Jerusalem Jerusalem Israel Dept. of Stored Products ARO The Volcani Center BetDagan Israel NODAI Research Inst. Setagaya-ku Tokyo 156 Dept. of Chemistry Ben-Gurion University of the Negev Be’er Sheva Israel The Inst. of Physical and Chemical Research (RIKEN) Saitama 351-01 Japan Mitsui Toatsu Agricultural Ch

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Influence of human engineering on manning levels and human performance on ships

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NAVAL ENGINEErS JOUrNAL 1997年第5期109卷 67-76页

作者： Anderson, dE Oberman, Fr Malone, TB Baker, CC David E. Anderson:has a bachelor of science degree in environmental engineering from Florida Technological University and a master's degree in environmental engineering from the University of Central Florida. He is a graduate of the Naval Sea Systems Command's Engineer-In-Training (EIT) Program. Mr. Anderson was instrumental in introducing the collective protection system (CPS) in the U.S. Navy developing the initial forward-fit package for the USS Gunston Hall and the engineering change proposal (ECP) for the USS Wasp. In 1990 he joined the Human Systems Integration (HSI) Division (SEA 55W5) where he was task leader for auxiliary ships. He is currently the HSI manager for the future technology variant of the SeaLift ship and the future carrier. Association of Scientists and Engineers 33rdAnnual Technical Symposium 26 April 1996. Fred R. Oberman:has B.A. and M.A. degrees from the University of Chicago and Loyola University (experimental psychology) and an M.S. degree in industrial engineering and operations research from Virginia Polytechnic Institute (VPI). He has more than 30 years experience in HSI management planning research analysis design and testing in government and private sector positions. He is currently responsible for NavSea HSI generic research and tool development efforts. He is responsible for Human Engineering Specifications and Standards (Commercial Hypertext) and is the NavSea 03D7 representative on HSI in Performance Specifications and for integration of HSI within Integrated Logistic Support (ILS). He has served as DoD HSI SubTAG chair and member of the Simulation and Modeling Test and Evaluation Display and Control Systems Human Computer Interaction Specifications and Standards and Systems Design Sub Tags as a member of the Society of Naval Architects and Marine Engineers (SNAME) Systems Safety Panel and a member of NATO RSG 14 on man-machine analysis. Thomas B. Malone: CHFEP received a Ph.D. in experimental psychology from Fordham University in 1964. He is president of Carlow

The objectives of Human engineering (HE) are generally viewed as increasing human performance, reducing human error, enhancing personnel and equipment safety, and reducing training and related personnel costs. There are other benefits that are thoroughly consistent with the direction of the Navy of the future, chief among these is reduction of required numbers of personnel to operate and maintain Navy ships. The Naval research Advisory Committee (NrAC) report on Man-Machine technology in the Navy estimated that one of the benefits from increased application of man-machine technology to Navy ship design is personnel reduction as well as improving system availability, effectiveness, and safety The objective of this paper is to discuss aspects of the human engineering design of ships and systems that affect manning requirements, and impact human-performance and safety The paper will also discuss how the application of human engineering leads to improved performance, and crew safety, and reduced workload, all of which influence manning levels. Finally, the paper presents a discussion of tools and case studies of good human engineering design practices which reduce manning.

关键词： Human engineering

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Modification of field emitter array tip shape by focused ion-beam irradiation

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Journal of Vacuum Science & technology B: Microelectronics Processing and Phenomena 1996年第3期14卷 1973-1973页

作者： Takai, M. Kishimoto, T. Yamashita, M. Morimoto, H. Yura, S. Hosono, A. Okuda, S. Lipp, S. Frey, L. ryssel, H. Faculty of Engineering Science and Research Center for Extreme Materials Osaka University Toyonaka Osaka 560 Japan Advanced Technology R&D Center Mitsubishi Electric Corporation 1‐1 Tsukaguchi‐Honmachi 8 Amagasaki Hyogo 661 Japan Fraunhofer Institut für Integrierte Schaltungen Lehrstuhl für Elektronische Bauelemente Universität Erlangen Schottkystrasse 10 D‐91058 Erlangen Germany

Tip shapes of Si field emitter arrays, fabricated by a conventional dry etching process, have been modified by focused ion‐beam (FIB) irradiation to obtain a sharp cone shape. Flat‐topped Si tips could be sharpened by localized sputtering using FIBs for a short time. Tip shape inspections and repairs were also performed using a FIB system combined with an electron‐beam column to remove metal residues and melted emitters.

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One-dimensional processing architecture for gray-scale morphology

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SYSTEMS ANd COMPUTErS IN JAPAN 1996年第12期27卷 1-9页

作者： Kojima, S Miyakawa, T The Graduate School of Electronics and Technology Shizuoka University 3-5-1 Jyohoku Hamamatsu Japan 432 Shoji Kojima:graduatedin 1989 from the Department of Mechanical Engineering Numazu College of Technology and received his M.S. from the Department of Optoelectronic and Mechanical Engineering Shizuoka University in 1991. He received a Ph.D. in Engineering from the Graduate School of Electronic Science and Technology Shizuoka University in 1996. He is now working in the R&D center at ADVANTEST Corporation as a leader in VLSI test systems.

Mathematical morphology is logically very clear, and has many applications because of its adaptability. They are two types of morphology - binary and gray-scale. The mathematical base of binary morphology is expressed in logical ANd/Or notation. Gray-scale morphology is based on the addition and comparison of gray-scale values. However, in this type of processing, the computational cost is proportional to the area of both the original image and the structuring element. Therefore, the computational cost increases very rapidly when a large-scale structuring element is required. For this reason, specialized architecture, e.g. a Cytocomputer, had been built for fast morphological processing, but large-scale structuring elements are difficult to build by this method because it requires a large number of devices. In this paper, we describe an efficient architecture for gray-scale morphological processing, in which we decompose the gray-scale structuring element to one dimension, thereby efficiently reducing computational cost. We also propose the architecture for a pipelined parallel processor that calculates the gray-scale dilation. This method greatly reduces the size of the hardware and maximizes the processing speed.

关键词： morphology gray-scale architecture hardware

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A flexible decision method for transmission system expansion planning considering power interruption cost

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ELECTrICAL engineering IN JAPAN 1996年第4期117卷 10-18页

作者： Yamashiro, S Kinoshita, H Nakamura, K Kimura, M Fukushima, T Kitami Institute of Technology Hokkaido Electric Power Co. [?]Graduated in 1963 from Hokkaido University Electrical Eng. Dept. and in 1967 received his Ph.D. degree. In 1971 he was an Assistant Professor at Kitami Institute of Technology where he was promoted to Professor in 1976. Since 1989 he has been Head of Information Processing Center. He is engaged in R&D in power systems engineering. He is a member of IEEE Information Processing Society of Japan Japan Solar Energy Society and the Thermal and Nuclear Power Engineering Society of Japan.

Under the current deregulation of the electric utility industry, power system planning has become more complex. System planners are required to study how to use available resources to meet customer's demand economically with acceptable reliability and quality. Integrated resource planning has emerged recently as one effective approach for this problem, and the approach has been expanded to include the value of reliability, that is, power interruption cost. This paper is aimed at developing a flexible decision method to select a favorable plan among various transmission system expansion alternatives, not only from a power supplier's viewpoint, but also from the customer's perspective, including cost of interruption. Bellman-Zadeh's maximizing decision using a fuzzy decision set is applied as a flexible decision method which is able to reflect the planner's intentions. Numerical examples are given to ascertain the effectiveness of the proposed method.

关键词： power system planning interruption cost supply reliability fuzzy set theory integrated resource planning

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Error tracking mode AC current waveform control method for three-phase self-commutated voltage source power converters

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ELECTrICAL engineering IN JAPAN 1996年第5期117卷 95-109页

作者： Ohshima, M Tokyo Electric Power Co. Ltd. [?]Graduated from the Department of Electrical Engineering of the Faculty of Engineering University of Tokyo in March 1975. He joined Tokyo Electric Power Co. Ltd. in April of the same year. He was engaged in maintenance and inspection work of protective relays at Shinagawa and Ohi power stations from 1978 to 1980. After working on investigation of new technologies he was engaged in the research and development project of sodium sulfur battery systems for customers and networks. He is currently a Deputy Head of Power Electronics Department of Power Engineering R&D at Power Technology Center. He is a member of the IEEE EPE Association and Electrochemical Association.

A novel design theory for a three-phase self-commutated power conversion system (PCS) to perform as an ac current source is proposed. In this new ac current waveform control-method termed error tracking mode, the switching instructions of main devices are decided only by the error function of ac current at every data sampling time that comes in a constant period. The performance is theoretically evaluated. Simulation by SPICE also is executed and the characteristics are inspected. Error tracking mode has the following attractive features. It can treat two arbitrary current waveforms as target functions of two-phase arbitrary ac currents. The error between actual ac current value and the objective function value can be controlled and guaranteed to be less than an arbitrary value, which is given beforehand. All control components can be digitized. The minimum continuous on and off time of main devices is guaranteed in advance. No special starting control is necessary because actual ac currents are guaranteed to start tracking the target functions automatically. Error tracking mode makes contributions to improve precision in current control and to reduce current harmonics of self-commutated voltage source power converters.

关键词： three-phase ac-dc converter three-phase PCS PWM control dispersed power sources current regulation decoupled control

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MAGNETIC FIELd ANd ITS ErrOr dISTrIBUTION PrEdICTEd BY INVErSE-FOrWArd ANALYSIS

MAGNETIC FIELD AND ITS ERROR DISTRIBUTION PREDICTED BY INVER...

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1996 rOMA International Symposium on Electromagnetic Compatibility, EMC 1996

作者： Hayashi, Shose Masuda, Koichiro Hatakeyama, Ken-Ichi Shu, Eimei Scientific & Engineering Analysis Dept. NEC Informatec Systems Ltd. KSP R&D Bldg. 2-1Sakado 3-ChomeTakatsu Ku Kawasaki Kanagawa213 Japan EMC Engeering Center Resources & Environment Protection Research Labs NEC Corporation 1-1.Miyazaki 4-ChomeMiyamae Ku Kanagawa Kawasaki216 Japan Dept. of Electrical Engineering Faculty of Science & Technology Science University of Tokyo 2641 Yamazaki Chiba-ken Noda-shi278 Japan

ISBN: (纸本)9798331500009

Ifnear magnetic fields measured around a metallic plane are given, by utilizing inverse analysis such as the maximum likelihood estirnationfMl.E), surface current distribution on the metallic plane can be estimated. Using this estimated surface current distribution, magnetic fields can be predicted by forward analysis directly. However, the estimated surface current usually contains the error due to measurement error and the coefficient matrix defined by the measurement grid and the surface scheme. Such estimation error distribution will yield the predicted error distribution when magnetic fields are predicted. A model source is set up and the magnetic fields around a specific plane of this model were measured. The surface current distribution and its estimation error distribution were calculated. Then the magnetic fields and its prediction errors at about 3.0m from the plane were calculated. The analyzed results of this experimental example showed that if the magnitudes of the measurement error are smaller than those of the maximum measured magnetic field by a factor of 10-1, then the maximum magnitudes of the prediction error will be smaller than those of the predicted magnetic fields by a factor of 1/6. Therefore, if accurate magnetic fields at the designated distances are to be req uired, the prediction error has to be considered. © 1996 IEEE. All rights reserved.

关键词： Inverse problems

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A device simulation of the BBT effect in flash memory cells and implications for the development of high-reliability memory cells

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ELECTrONICS ANd COMMUNICATIONS IN JAPAN PArT II-ELECTrONICS 1996年第11期79卷 51-57页

作者： Hayashi, T Fukuda, K Ohno, M Nishi, K Kita, A VLSI R&D Center OKI Electric Industry Company Ltd. Hachioji-shi Japan 193 Graduated from the Science University of Tokyo Dept. of Applied Physics in 1986 and joined Oki Electric. Since then he has been engaged in research on the reliability of MOS transistors and silicon oxide films. Since 1994 he has been engaged in the development of flash memory. He is a member of the Applied Physics Society. Graduated from the University of Tokyo Dept. of Applied Physics in 1983 and joined Oki Electric in 1985. Since then he has been engaged in research on the semiconductor process and device simulation. In 1990 he participated in joint research at the Technical University of Aachen. He is a member of the Applied Physics Society. Graduated from the Tokyo University of Agriculture and Technology Dept. of Electrical Engineering in 1980 and completed an MS course in 1983. In 1986 he completed the doctoral course at Shizuoka University. He then joined Oki Electric where he has been engaged in research on ULSI processes. He is now a manager responsible for flash memory at the VLSI R&D Center. He holds a doctorate in engineering. He is a member of the Applied Physics Society. Graduated from the University of Tokyo Dept. of Applied Physics in 1973 and joined Oki Electric. He was engaged in the development of integrated circuit logic simulation technology and bipolar process technology and since 1980 he has been engaged in research on process/device simulation and modeling. Presently he is a senior manager at the VLSI R&D Center. In 1982–1984 he was a Visiting Scholar at MIT. He holds a doctorate in engineering. He is a member of the Applied Physics Society and a senior member of IEEE. Graduated from Tokyo Institute of Technology Dept. of Chemical Engineering in 1978 and completed the MS program in 1930. In that year he joined Oki Electric. Since then he has been engaged in CMOS process design for DRAM and flash memory. He is now a manager at the VLSI R&D Center. He is a member of the Applied Physics Society.

In order to analyze the BBT (band-to-band tunneling) phenomenon in flash memory cells by simulation, a new model is proposed, which improves on the BBT model by introducing the concept of ''average electric field.'' This model agrees well with the measured results in a wide drain N-concentration range. Using this model, the reliability of memory cells is analyzed. It is found that the difference of the amount of BBT generation does not directly affect the endurance characteristics but does affect the disturb characteristics. The same model can be used to analyze problem points of the present cells and to estimate the BBT current of next-generation devices accurately.

关键词： band-to-band tunneling flash memory simulation endurance characteristics

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