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检索条件"机构=R&D STMicroelectronics"
843 条 记 录,以下是41-50 订阅
排序:
Long-Term High-Temperature dynamic Gate Stress reliability of a Last-Generation, Automotive-Grade, Planar 1200 V SiC MOSFET  14
Long-Term High-Temperature Dynamic Gate Stress Reliability o...
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14th Annual IEEE Applied Power Electronics Conference and Exposition, APEC 2025
作者: Mauromicale, Giuseppe Sitta, Alessandro Fiore, Michele Calabretta, Michele Iannuzzo, Francesco STMicroelectronics Quality Manufacturing and Technology R&d Catania Italy University of Aalborg Department of Energy Technology Aalborg Denmark
In this work, the dynamic gate stress (dGS) on a planar-gate silicon carbide MOSFET is performed based on an automotive mission profile. An extensive characterization was performed, even beyond automotive qualificatio... 详细信息
来源: 评论
Understanding the role of encapsulation layers under wet conditions on the reliability of power devices  8
Understanding the role of encapsulation layers under wet con...
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8th Electron devices Technology & Manufacturing Conference (EdTM)
作者: reggiani, Susanna Balestra, Luigi Gnani, Elena rossetti, Mattia depetro, riccardo Univ Bologna ARCES Bologna Italy Univ Bologna DEI Bologna Italy STMicroelectronics Smart Power R&D Cornaredo Italy
recent characterizations of epoxy-based molding compounds under wet conditions were carried out to understand the role of charge spreading in integrated high-voltage devices. Space-charge injection at high electric fi... 详细信息
来源: 评论
Competitors-Aware Stochastic Lap Strategy Optimisation for race Hybrid Vehicles
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IEEE TrANSACTIONS ON VEHICULAr TECHNOLOGY 2023年 第3期72卷 3074-3089页
作者: Paparusso, Luca riani, Manuel ruggeri, Fabio Braghin, Francesco Politecn Milan Dept Mech Engn I-20133 Milan Italy STMicroelectronics R&D Div Cornaredo MI Italy Philip Morris Int Bologna Italy
World Endurance Championship (WEC) racing events are characterised by a relevant performance gap among competitors. The fastest vehicles category, consisting in LMP1 race hybrid vehicles, has to respect energy usage c... 详细信息
来源: 评论
A compact 6-axis IMU combining low-power operation with high stability and low noise  9
A compact 6-axis IMU combining low-power operation with high...
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9th IEEE International Symposium on Inertial Sensors and Systems (IEEE INErTIAL)
作者: Valzasina, Carlo rizzini, Francesco Guerinoni, Luca Falorni, Luca Garbarino, Marco Polesel, Stefano Milani, Marco Quartiroli, Matteo Mecchia, Alessandro rizzo, Alessandra STMicroelectronics AMS R&D Milan Italy STMicroelectronics AMS MEMS sGRP Milan Italy
This paper presents design, architecture and characterization results of stmicroelectronics LSM6dSV16X 6-axis Inertial Measurement Unit (IMU). Traditional consumer-grade IMUs have been split into low-power sensors int... 详细信息
来源: 评论
deep Learning Algorithm for Advanced Level-3 Inverse-Modeling of Silicon-Carbide Power MOSFET devices
Deep Learning Algorithm for Advanced Level-3 Inverse-Modelin...
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2023 Workshop on Electronics Communication Engineering, WECE 2023
作者: Spata, Massimo Orazio Battiato, Sebastiano Ortis, Alessandro rundo, Francesco Calabretta, Michele Pino, Carmelo Messina, Angelo Dipartimento di Matematica ed Informatica University of Catania Italy STMicroelectronics ADG R&D Division Catania Italy
Inverse modelling with deep learning algorithms involves training deep architecture to predict device’s parameters from its static behaviour. Inverse device modelling is suitable to reconstruct drifted physical param... 详细信息
来源: 评论
A BASELINE ON CONTINUAL LEArNING METHOdS FOr VIdEO ACTION rECOGNITION  30
A BASELINE ON CONTINUAL LEARNING METHODS FOR VIDEO ACTION RE...
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30th IEEE International Conference on Image Processing (ICIP)
作者: Castagnolo, Giulia Spampinato, Concetto rundo, Francesco Giordano, daniela Palazzo, Simone Univ Catania PeRCeiVe Lab Catania Italy STMicroelectronics R&D Power & Discretes ADG Catania Italy
Continual learning has recently attracted attention from the research community, as it aims to solve long-standing limitations of classic supervised-trained models. However, most research on this subject has tackled c... 详细信息
来源: 评论
Phase Change Memory: A review on Electrical Behavior and Use in Analog In-Memory-Computing (A-IMC) Applications
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AdVANCEd ELECTrONIC MATErIALS 2024年 第12期10卷
作者: Boniardi, Mattia Baldo, Matteo Allegra, Mario redaelli, Andrea STMicroelectronics Technol R&D I-20864 Agrate Brianza Italy
recent development and progress of Artificial Intelligence (AI) algorithms made clear that this topic is a paradigm shift with respect to the past. High throughput and ability to do complex tasks makes AI a great fiel... 详细信息
来源: 评论
Simulation Analysis of the Bit Error Induced by EMI on Galvanically Isolated data-Link Embedded in an Automotive Battery Management IC  25
Simulation Analysis of the Bit Error Induced by EMI on Galva...
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24th International Conference on Electromagnetics in Advanced Applications (ICEAA) / 12th IEEE-APS Topical Conference on Antennas and Propagation in Wireless Communications (IEEE APWC)
作者: Ahmadi, Amirhossein Serratoni, Claudio Bendotti, Valerio Crovetti, Paolo S. Politecn Torino Dept Elect & Telecommun Turin Italy STMicroelectronics ADG Smart Power R&D Milan Italy
In this paper, the susceptibility to electromagnetic interference (EMI) of a battery management system (BMS) used in electric vehicles is addressed. In particular, the effects of EMI on the BMS vertical interface (VIF... 详细信息
来源: 评论
Frequency Stop-Band Management System for dC-dC Converters
Frequency Stop-Band Management System for DC-DC Converters
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Annual IEEE Conference on Applied Power Electronics Conference and Exposition (APEC)
作者: Alessandro Bertolini Alberto Cattani Claudio Luise Alessandro Gasparini APMS R&D STMicroelectronics Milan
Ever complex electronic systems have pushed the requirements on power management to new limits, with applications needing to satisfy stringent operating frequency constraints while maintaining high efficiency. This ar... 详细信息
来源: 评论
A Comparative Study on Hall Plate Topologies in p-GaN Technology
IEEE SENSORS LETTERS
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IEEE SENSOrS LETTErS 2023年 第10期7卷 1页
作者: Crescentini, Marco Marchesi, Marco Gibiino, Gian Piero Ion, Lucian Petrisor Castagna, Eloisa Iucolano, Ferdinando Univ Bologna Dept Elect Elect & Informat Engn I-40136 Bologna Italy Univ Bologna Adv Res Ctr Elect Syst I-40136 Bologna Italy STMicroelectronics Analog & Smart Power Technol R&D I-20007 Cornaredo Italy STMicroelectronics Automot & Power Discrete Grp R&D I-95121 Catania Italy
Gallium nitride (GaN) power transistors are being increasingly used in high-power and high-frequency electronic systems due to their high breakdown field, high carrier density, and good thermal conductivity. despite t... 详细信息
来源: 评论