检索结果-内蒙古大学图书馆

您好，读者！请登录

内蒙古大学图书馆

首页
概况
党建
资源
服务
科研支持
- 论文收录引用证明
- 科技查新
知识产权
档案馆
帮助

咨询与建议

建议与咨询留下您的常用邮箱和电话号码，以便我们向您反馈解决方案和替代方法

您的常用邮箱：*

您的手机号码：*

问题描述：

当前已输入0个字，您还可以输入200个字

全部搜索
期刊论文
图书
学位论文
标准
纸本馆藏
外文资源发现
数据库导航
超星发现

高级检索

时间限定

出版年份：

文献类型

图书期刊文献学位论文多媒体

馆藏选择

电子馆藏纸本馆藏

核心期刊

全部期刊 SCI 收录期刊 SSCI 收录期刊 EI 收录期刊 CSCD 收录期刊 CSSCI 收录期刊

语言

中文英文

文献类型

期刊文献图书学位论文标准纸本馆藏

帮助

文字说明：

T=题名（书名、题名），A=作者（责任者），K=主题词，P=出版物名称，PU=出版社名称，O=机构（作者单位、学位授予单位、专利申请人），L=中图分类号，C=学科分类号，U=全部字段，Y=年（出版发行年、学位年度、标准发布年）

检索规则说明：

AND代表“并且”；OR代表“或者”；NOT代表“不包含”；(注意必须大写,运算符两边需空一格)

检索范例：

范例一：(K=图书馆学 OR K=情报学) AND A=范并思 AND Y=1982-2016
范例二：P=计算机应用与软件 AND (U=C++ OR U=Basic) NOT K=Visual AND Y=2011-2016

分类表

所选分类

>> <<

限定检索结果

文献类型

400 篇 会议
94 篇 期刊文献

馆藏范围

494 篇 电子文献
0 种 纸本馆藏

日期分布

学科分类号

223 篇 工学
- 150 篇 电子科学与技术（可...
- 69 篇 电气工程
- 67 篇 材料科学与工程（可...
- 42 篇 计算机科学与技术...
- 37 篇 化学工程与技术
- 31 篇 冶金工程
- 30 篇 软件工程
- 29 篇 仪器科学与技术
- 27 篇 机械工程
- 21 篇 光学工程
- 19 篇 动力工程及工程热...
- 16 篇 力学（可授工学、理...
- 16 篇 信息与通信工程
- 14 篇 控制科学与工程
- 12 篇 核科学与技术
- 11 篇 安全科学与工程
- 8 篇 交通运输工程
- 8 篇 航空宇航科学与技...
- 5 篇 轻工技术与工程
- 3 篇 土木工程
126 篇 理学
- 91 篇 物理学
- 38 篇 化学
- 31 篇 数学
- 7 篇 统计学（可授理学、...
- 3 篇 生物学
- 2 篇 地质学
23 篇 管理学
- 21 篇 管理科学与工程(可...
- 3 篇 工商管理
2 篇 经济学
- 2 篇 应用经济学
2 篇 医学
1 篇 军事学

主题

65 篇 reliability
32 篇 stress
31 篇 degradation
20 篇 failure analysis
18 篇 soldering
17 篇 logic gates
15 篇 junctions
14 篇 electromigration
12 篇 packaging
12 篇 thermal resistan...
12 篇 gallium nitride
12 篇 mathematical mod...
11 篇 resistance
11 篇 lead
11 篇 light emitting d...
11 篇 heating
10 篇 simulation
10 篇 vibrations
10 篇 mosfet
10 篇 silicon

机构

64 篇 science and tech...
63 篇 science and tech...
23 篇 school of electr...
21 篇 science and tech...
18 篇 science and tech...
18 篇 science and tech...
18 篇 school of mechan...
12 篇 science and tech...
12 篇 moe key lab of d...
11 篇 china electronic...
10 篇 science and tech...
9 篇 university of ch...
8 篇 reliability phys...
8 篇 the science and ...
7 篇 school of electr...
7 篇 school of materi...
7 篇 ceprei science a...
7 篇 school of inform...
6 篇 south china univ...
6 篇 beijing universi...

作者

36 篇 yunfei en
35 篇 bin zhou
34 篇 yun huang
23 篇 wei su
20 篇 huang yun
19 篇 guoguang lu
17 篇 shaohua yang
16 篇 yuan liu
16 篇 si chen
16 篇 yang shaohua
16 篇 lei zhifeng
15 篇 fangfang song
15 篇 zhiyuan he
15 篇 ping lai
15 篇 lu guoguang
15 篇 en yunfei
14 篇 renhuai liu
13 篇 yuan chen
13 篇 xiaoqi he
13 篇 bin yao

语言

477 篇 英文
11 篇 中文
6 篇 其他

检索条件"机构=Reliability Physics and Application Technology of Electronic Component Key Laboratory"

共 494 条记录，以下是51-60 订阅

全选清除本页清除全部题录导出标记到"检索档案"

详细简洁

排序：

Enhanced Inverter Hybrid Fault Diagnosis through RAM and CNN Integration 14

Enhanced Inverter Hybrid Fault Diagnosis through RAM and CNN...

引用

14th International Conference on reliability, Maintainability and Safety, ICRMS 2023

作者： Meng, Linghui Li, Lin Jiang, Yuanyuan Science and Technology on Reliability Physics and Application of Electronic Component Laboratory China Electronic Product Reliability and Environmental Testing Research Institute Guangdong Guangzhou China Anhui University of Science and Technology School Institute of Artificial Intelligence Anhui Huainan China

ISBN: (纸本)9798350329988

Deep learning has been widely used in inverter open-circuit fault diagnosis;however, traditional neural networks only extract signal features of inverter faults without distinguishing between significant and minor features. To address this limitation, this paper proposes a diagnostic method for inverter hybrid faults that combine reverse attention mechanism (RAM) and convolutional neural networks. The proposed method highlights important features by utilizing RAM to reverse the attention and prune the minor features. In addition, long short-term memory is used to learn temporal information between the features. Finally, fault classification is performed using fully connected layers. Simulation experiments indicate that the proposed diagnostic method significantly improves fault diagnosis accuracy. Compared to traditional neural network fault diagnosis methods, our proposed method achieves up to 8.07% higher diagnosis accuracy, thereby validating its effectiveness. © 2023 IEEE.

关键词： Convolutional neural networks

来源：评论

学校读者我要写书评

暂无评论

A novel learning approach to MIMO networked control systems with uncertain parameters 14

A novel learning approach to MIMO networked control systems ...

引用

14th IEEE Global reliability and Prognostics and Health Management Conference, PHM-Hangzhou 2023

作者： Jia, Hanguang School of Automation Science and Engineering South China University of Technology National Key Laboratory of Science and Technology on Reliability Physics and Application of Electronic Component The Fifth Electronics Research Institute of the Ministry of Industry and Information Technology Guangzhou China

ISBN: (纸本)9798350301359

This paper proposes a new learning approach to solve control design problems involving uncertain parameters in MEMO networked control systems. This approach combines neural network technology with control system modeling in real-time through learning and adaptation of data, thereby achieving stability and optimization of network-based control systems. The authors first establish a network-based control model and then improve it by replacing the linear parameters with nonlinear ones. To ensure real-time and stable communication between devices, this method also uses adaptive iterative learning control (AILC) technology and error feedback control technology. A network-based control system is used to verify the effectiveness of the proposed approach. The results show that this approach is effective in achieving sufficient communication between devices, adapting to uncertain parameters, and improving control performance. © 2023 IEEE.

关键词： AILC communication error feedback control MIMO networked control systems uncertain parameters

来源：评论

学校读者我要写书评

暂无评论

New Diagnostics for Inferring Multiple Fault Scenarios and Accurate Fault Localization

New Diagnostics for Inferring Multiple Fault Scenarios and A...

引用

2024 IEEE Global Communications Conference, GLOBECOM 2024

作者： Zhou, Huisi Hu, Wei Zhu, Dan Wang, Liwei Northwestern Polytechnical University School of Cybersecurity Xi'an710072 China Research & Development Institute Northwestern Polytechnical University Shenzhen China Science and Technology on Reliability Physics and Application Technology of Electronic Component Laboratory Guangzhou430070 China

ISBN: (纸本)9798350351255

For many high-tech fields such as mobile communication systems, network management, and satellite and space applications, it is vital to discover faulty components of manufactured devices in a timely manner to ensure safety. Model-based diagnosis is a crucial element in fault diagnosis. It aims to find the possible causes of the observed unexpected behaviors of a system when assuming all of its components work correctly. In this paper, we propose two diagnostics, namely, the Improved Model-Based Diagnosis (IMBD) and the Localization-Based Diagnosis (LBD), to address the research challenge that massive candidate diagnoses are needed in the traditional model-based diagnosis approach for repairing the faulty system. Our diagnostics realizes a simulator to simulate the single-fault scenarios, through which we can reason about the scenarios where multiple faults occur and find which components are more likely to fail in the multiple-fault system. Experiments using the ISCAS-85 benchmarks indicate that LBD is superior to IMBD and SAT-based approaches for accurate fault localization. © 2024 IEEE.

关键词： Satellite communication systems

来源：评论

学校读者我要写书评

暂无评论

A Single-Loop Narrow-Band Force Rebalance Control Method with Temperature Self-Compensation for a MEMS Gyroscope 38

A Single-Loop Narrow-Band Force Rebalance Control Method wit...

引用

38th IEEE International Conference on Micro Electro Mechanical Systems, MEMS 2025

作者： He, Chunhua Xu, Yingyu Wu, Heng Huang, Qinwen Zhao, Qiancheng Yan, Guizhen Guangdong University of Technology School of Computer China Ceprei Science and Technology on Reliability Physics and Application Technology of Electronic Component Laboratory China Guangdong University of Technology School of Automation China Peking University School of Integrated Circuits Beijing China National Key Lab of Micro/Nano Fabrication Technology Beijing China

ISBN: (纸本)9798331508890

This paper presents a novel single-loop narrow-band force rebalance control method with temperature self-compensation for a MEMS gyroscope. The narrow-bandwidth force rebalance control for the sense mode is achieved using a simple bandpass filter (BPF) and without modulation or demodulation. The center frequency of the BPF is adjusted automatically to match the resonant frequency of the sense mode. Meanwhile, its gain is tuned based on the real-time quality factor of the sense mode. Experimental results demonstrate that the bias drift of the gyroscope with self-compensation is reduced from 1320 deg/h to 16 deg/h, while the scale factor drift is reduced from 0.616 mV/deg/s to 0.075 mV/deg/s. © 2025 IEEE.

关键词： Gyroscopes

来源：评论

学校读者我要写书评

暂无评论

Degradation mechanism of 1310nm vertical cavity surface emission laser

Degradation mechanism of 1310nm vertical cavity surface emis...

引用

2023 Applied Optics and Photonics China: AI in Optics and Photonics, AOPC 2023

作者： Liao, Wenyuan Zhang, Jide Liu, Yuebo Li, Shuwang Yang, Shaohua Lai, Canxiong Lu, Guoguang Science and Technology on Reliability Physics and Application of Electronic Component Laboratory The Fifth Electronic Research Institute of the Ministry of Industry and Information Technology Guangzhou511370 China State Key Laboratory of High Power Semiconductor Laser Changchun University of Science and Technology Jilin Province Changchun130013 China

ISBN: (纸本)9781510672383

1310nm long-wavelength vertical-cavity surface-emitting lasers (VCSELs) have a wide application prospect in optical data transmission over long distances, in particular for hybrid integration with silicon photonics. With the wide application of 1310nm VCSEL, the reliability requirement is becoming more and more high. In this paper, the degradation mechanism of 1310nm VCSEL is studied by accelerated stress aging experiment. The device accelerates aging for 4000 hours at 8 mA, the maximum output power decreases by 0.04 mW, and the power saturation current and V-I curve remain basically unchanged. Leakage current of the device increases and reverse bias breakdown voltage decreases. Current noise power spectral density of the device is an order of magnitude higher than before aging. In addition, the device with degraded performance is characterized by optical emission microscopy. When the device is forward biased, dark spot defect is found on the edge of the light-emitting hole of the device after burnin. The internal topography of the device is characterized by FIB-SEM, and the oxide layer warpage is found. This is due to the increase of heat inside the device and the increase of stress in oxide layer, resulting in degradation of device's performance. © COPYRIGHT SPIE. Downloading of the abstract is permitted for personal use only.

关键词： Surface emitting lasers

来源：评论

学校读者我要写书评

暂无评论

A New Five-layer Differential Magnetic-Field Probe With High Sensitivity

A New Five-layer Differential Magnetic-Field Probe With High...

引用

IEEE International Wireless Symposium (IWS)

作者： Yuan Chi Lei Wang Guoguang Lu Science and Technology on Reliability Physics and Application of Electronic Component Laboratory China Electronic Product Reliability and Environmental Testing Research Institute GuangZhou China

ISBN: (数字)9798350389999

ISBN: (纸本)9798350390001

This work introduces a novel differential magnetic-field probe that incorporates parasitic elements. The probe features a pair of shorted differential loops as the parasitic components, which significantly boost detection sensitivity due to the expanded detection area. The construction of the proposed probe includes a U-shaped loop with dual outputs serving as the primary element, supplemented by a pair of shorted differential loops acting as parasitic elements, a set of shorted vias, a set of connected vias, and numerous shielded vias. First, the usual single-loop probe is applied to measure the electric and magnetic field components at the same time. Subsequently, a pair of shorted loops are integrated into the differential single-loop probe to function as parasitic elements, thereby increasing the reception of magnetic flux. To demonstrate the design rationality, the correspondingly simulated results are given in this work. Ultimately, the probe with integrated parasitic elements is crafted, printed, and assessed. The simulation results indicate that the developed probe exhibits high detection sensitivity.

关键词： Wireless communication Magnetic flux Wireless sensor networks Sensitivity Simulation Magnetic noise Feature extraction Magnetic fields Probes Magnetic shielding

来源：评论

学校读者我要写书评

暂无评论

Vias electromigration lifetime reliability evaluation by using focus ion beam method 24

Vias electromigration lifetime reliability evaluation by usi...

引用

24th electronics Packaging technology Conference, EPTC 2022

作者： Wen, Zhang Xiao Ling, Lin Xiao Dai, Zongbei Rui, Gao Science and Technology on Reliability Physics and Application of Electronic Component Laboratory 78 west of ZhuCun Avenue ZengCheng district Guangzhou511370 China

ISBN: (纸本)9798350398854

The FIB (Focus Ion Beam) Construction analysis is widely used in FA field, such as evaluating process limitations, debugging, and root cause demonstration. In this paper, we describe the reliability check method of the via by using FIB. Based on the electromigration (EM) test of the vias, the reliability check method of the vias is studied through the influence of void area ratio in the via on the EM lifetime of the via. The results showed that under different operating conditions, the same void area ratio has almost the same influence on the EM lifetime, and with the increase of void area ratio in the via, the EM lifetime of the via decreases, when the lifetime decreases by 20%, the corresponding void area ratio is about 12%, which can be used as the check criteria of the via. © 2022 IEEE.

关键词： Electromigration

来源：评论

学校读者我要写书评

暂无评论

Evaluation of p-GaN HEMTs degradation under high temperatures forward and reverse gate bias stress 2

Evaluation of p-GaN HEMTs degradation under high temperature...

引用

2023 2nd International Symposium on Semiconductor and electronic technology

作者： Jiang, Kun Deng, Jing Ni, Yiqiang Liu, Jun Liu, Xin He, Zhiyuan He, Liang School of Electrical Engineering University of South China Hunan Province Hengyang421001 China Science and Technology on Reliability Physics and Application of Electronic Component Laboratory China Electronic Product Reliability and Environmental Testing Research Institute Guangdong Province Guangzhou510610 China

In this study, the degradation behavior and physical mechanism of the p-GaN HEMT devices under high-temperature gate bias (HTGB) with +5 V and -5 V were investigated. The DC characteristics show that the device after forward HTGB stress exhibits an obvious negative threshold voltage (Vth) shift, while the device after reverse HTGB exhibits a negligible shift. The following explanations could be given for the deterioration mechanism: a portion of the two-dimensional hole gas (2DHG) accumulated in the p-GaN layer at the p-GaN/AlGaN interface under long-term forward bias may fill the trap in the AlGaN layer through the tunneling effect. In addition, the drain-source on-resistance of the device had increased after +5 V HTGB stress, and a distinct decrease of accumulated capacitance was observed in the Cg-Vg curve. It indicates a degradation of the gate quality of the device after applying a forward-biased HTGB stress. © 2023 Institute of physics Publishing. All rights reserved.

关键词： Aluminum gallium nitride

来源：评论

学校读者我要写书评

暂无评论

Logo Detection of Integrated Circuit Based on CycleGAN Method and Improved YOLO-v4-tiny Model

Logo Detection of Integrated Circuit Based on CycleGAN Metho...

引用

International Conference on (ICEPT) electronic Packaging technology

作者： Yue Zhao Zhizhe Wang Jun Luo Qiuzhen Zhang Science and Technology on Reliability Physics and Application of Electronic Component Laboratory China Electronic Product Reliability and Environmental Testing Research Institute Guangzhou China

ISBN: (数字)9798350353808

ISBN: (纸本)9798350353815

Focusing on the application requirements for precise detection of Integrated Circuit (IC) logos, and aiming at the problems of difficulty in obtaining database samples, uneven sample sizes, and low detection accuracy, a logo detection of IC Based on cycle-GAN method and improved YOLO-v4-tiny model is proposed. This article uses the cycle-GAN method to amplify small sample images in the IC logo image dataset. Next, the Coordinate Attention (CA) attention mechanism is embedded in the YOLO-v4-tiny model to improve the accuracy of feature representation in lightweight networks, thereby improving detection accuracy. The experimental results show that the cycle-GAN data augmentation method can effectively expand the dataset, and it has been validated on commonly used networks that the enhanced dataset can effectively improve the accuracy of integrated circuit logo detection. In addition, the improved YOLO-v4-tiny model achieved a mAP index of 98.17% on the augmented dataset, which can meet the accuracy index of the integrated circuit logo detection system and reduce the computational resources required for deployment.

关键词： Accuracy Attention mechanisms Databases Computational modeling Focusing Object detection Data augmentation

来源：评论

学校读者我要写书评

暂无评论

IC-LOGO: A Custom Dataset and Benchmark for Integrated Circuit Logo Detection Task

IC-LOGO: A Custom Dataset and Benchmark for Integrated Circu...

引用

IEEE International Conference on Artificial Intelligence and Computer applications (ICAICA)

作者： Yue Zhao Jun Luo Zhizhe Wang Qiuzhen Zhang Science and Technology on Reliability Physics and Application of Electronic Component Laboratory China Electronic Product Reliability and Environmental Testing Research Institute Guangzhou China

ISBN: (数字)9798350377255

ISBN: (纸本)9798350377262

In order to enable computers to automatically detect the logo information of Integrated Circuit (IC) images and assist users in searching for the required IC manufacturer information based on the logo images, this article conducted research and analysis on the existing public datasets in the field of logo detection, and found that the existing public datasets cannot meet the specific research and application needs of this article. Therefore, the Integrated Circuit Logo (IC-LOGO) image dataset is presented in this article. The dataset contains 971 internal logo images from 17 manufacturers and 2091 external logo images from 30 manufacturers. Furthermore, the logo images were precisely positioned and annotated. Finally, a benchmark containing 8 different object detection networks was used to test the IC-LOGO dataset. The results show that all detectors trained on the dataset could detect the region and category of LOGO precisely and robustly.

关键词： Training Surveys Image recognition Computational modeling Object detection Benchmark testing Data models Software Robustness Integrated circuit modeling

来源：评论

学校读者我要写书评

暂无评论

没有更多数据了...

全选清除本页清除全部题录导出标记到“检索档案”

共50页 << < 2 3 4 5 6 7 8 9 10 11 > >>

检索报告对象比较合并检索0

隐藏清空

合并搜索

回到顶部

执行限定条件

内容：

评分：

请选择保存的检索档案：

请选择收藏分类：

订阅名称：

通借通还

温馨提示：

图书名称：

借书校区：

取书校区：

手机号码：

邮箱地址：

一卡通帐号：

电话和邮箱必须正确填写，我们会与您联系确认。

联系人：

所在院系：

联系邮箱：

联系电话：

内蒙古自治区呼和浩特市赛罕区大学西街235号邮编: 010021

建议与咨询 留下您的常用邮箱和电话号码，以便我们向您反馈解决方案和替代方法

时间限定

文献类型

馆藏选择

核心期刊

语言

文献类型

帮助

文字说明：

检索规则说明：

检索范例：

分类表

所选分类

限定检索结果

文献类型

馆藏范围

日期分布

学科分类号

主题

机构

作者

语言

请选择保存的检索档案： 新增检索档案 确定 取消

请选择收藏分类： 新增自定义分类 确定 取消

通借通还

建议与咨询留下您的常用邮箱和电话号码，以便我们向您反馈解决方案和替代方法

请选择保存的检索档案：

请选择收藏分类：