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检索条件"机构=School of Electrical and Computer Engineering Computing Systems Laboratory"
4521 条 记 录,以下是4511-4520 订阅
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The location of components in an automatic manufacturing process
The location of components in an automatic manufacturing pro...
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IEE Colloquium on computer Image Processing and Plant Control
作者: J.A. Ware R.A. Davies G. Roberts J.H. Williams Department of Mathematics and Computing Polytechnic of Wales Pontypridd Mid-Glamorgan UK Department of Computer Studies Polytechnic of Wales Pontypridd Mid-Glamorgan UK School of Electrical Electronic and Systems Engineering University of Wales Cardiff UK
The manipulation of objects by a robot within its workspace requires knowledge about each object's location and orientation. A 3D representation of the robot's workspace is thus required. This 3D representatio... 详细信息
来源: 评论
Diagnosing CMOS bridging faults with stuck-at fault dictionaries
Diagnosing CMOS bridging faults with stuck-at fault dictiona...
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IEEE International Test Conference
作者: S.D. Millman E.J. McCluskey J.M. Acken Motorola Inc. Mesa AZ USA Center for Reliable Computing Computer Systems Laboratory Departments of Electrical Engineering and Computer Science University of Stanford Stanford CA USA Schlumberger Technologies Palo Alto CA USA Intel Corporation Santa Clara CA USA
It is shown that the traditional approach to diagnosing stuck-at faults with fault dictionaries generated for stuck-at faults is not appropriate for diagnosing CMOS bridging faults. A novel technique for using stuck-a... 详细信息
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The critical path for multiple faults
The critical path for multiple faults
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IEEE International Conference on computer-Aided Design
作者: S. Makar E. McCluskey CENTER FOR RELIABLE COMPUTING Computer Systems Laboratory Depts. of Electrical Engineering and Computer Science University of Stanford CA USA
The critical path technique for determining the single stuck-at faults detected by a test is extended to multiple faults by defining masking paths. A masking tree is used to represent the masking relationships among i... 详细信息
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A self-test and self-diagnosis architecture for boards using boundary scans
A self-test and self-diagnosis architecture for boards using...
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European Test Conference
作者: L.-T. Wang M. Marhoefer E.J. McCluskey CENTER FOR RELIABLE COMPUTING ERL 460 Computer Systems Laboratory Departments of Electrical Engineering and Computer Science University of Stanford Stanford CA USA ZFE F2 DES 233 Siemens AG Munchen Germany
The authors present a low-cost self-test and self-diagnosis architecture for locating both defective chips and bad interconnects on a printed-circuit board. It is assumed that the boundary scan method developed by the... 详细信息
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Morphological based target enhancement algorithms to counter the hostile nuclear environment
Morphological based target enhancement algorithms to counter...
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IEEE International Conference on systems, Man and Cybernetics
作者: C.H.G. Wright E.J. Delp N.C. Gallagher HQ Space Systems Division Los Angeles Air Force Base Los Angeles CA USA Computer Vision and Image Processing Laboratory School of Electrical Engineering Purdue University West Lafayette IN USA
It is noted that a necessary requirement of a strategic defense system is the detection of incoming nuclear warheads in an environment that may include nuclear detonations of undetected or missed target warheads. A co... 详细信息
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CIRCUITS FOR PSEUDOEXHAUSTIVE TEST PATTERN GENERATION
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IEEE TRANSACTIONS ON computer-AIDED DESIGN OF INTEGRATED CIRCUITS AND systems 1988年 第10期7卷 1068-1080页
作者: WANG, LT MCCLUSKEY, EJ Center for Reliable Computing Computer Systems Laboratory Departments University of Stanford Stanford CA USA Center for Reliable Computing Computer Systems Laboratory Departments of Electrical Engineering and Computer Science University of Stanford Stanford CA USA
Implementation methods based on cyclic codes are presented for pseudoexhaustive testing of combinational logic networks with restricted output dependency. A modified linear-feedback shift register (LFSR) is used to ge... 详细信息
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Logic design education at Stanford University
Logic design education at Stanford University
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Annual Hawaii International Conference on System Sciences (HICSS)
作者: J.F. Wakerly E.J. McCluskey Center for Reliable Computing Computer Systems Laboratory Departments of Electrical Engineering and Computer Science University of Stanford Stanford CA USA
Recent developments in the logic design courses in the computer systems laboratory at Stanford University are described. The courses include an introductory undergraduate lecture and laboratory course, an advanced und... 详细信息
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OPTICAL SYMBOLIC computing
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Optics News 1988年 第12期14卷 40-41页
作者: W. THOMAS CATHEY GARRET R. MODDEL RODNEY A. SCHMIDT OPTOELECTRONIC COMPUTING SYSTEMS CENTER AND DEPARTMENT OF ELECTRICAL & COMPUTER ENGINEERING UNIVERSITY OF COLORADO BOULDER COLO. OPTOELECTRONIC COMPUTING SYSTEMS CENTER AND DEPARTMENT OF MATHEMATICS COLORADO SCHOOL OF MINES GOLDEN COLO.
No abstract available.
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Concurrent Error Detection and Testing for Large PLA's
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IEEE Journal of Solid-State Circuits 1982年 第2期17卷 386-394页
作者: Khakbaz, Javad McCluskey, Edward J. Center for Reliable Computing Computer Systems Laboratory Departments of Electrical Engineering and Computer Science Stanford University Stanford CA 94305 United States
A system of checkers is designed for concurrent error detection in large PLA's. This system combines concurrent error detection with off-line functional testing of the PLA by using the same checker hardware for bo... 详细信息
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NAVAL COASTAL systems laboratory - UNIQUE INSITU TEST AND EVALUATION SITE
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NAVAL ENGINEERS JOURNAL 1978年 第2期90卷 119-129页
作者: JOLLIFF, JV CALLAHAN, CM USN Capt. James V. Jolliff USNgraduated from the U. S. Naval Academy in 1954. Following graduation he served in the USS S. N. Moore (DD—747) and USS Cimarron (AO—22). He received his MS degrees in Naval Architecture from Webb Institute of Naval Architecture and in Financial Management from The George Washington University. He culminated his education at The Catholic University of America where he was awarded his Doctorate in Ocean Engineering in 1972. Capt. Jolliff has served in Naval Shipyards as Ship Superintendent Assistant Repair Officer and Assistant Planning & Estimating Superintendent and as such was primarily concerned with the repair and conversion of U. S. Navy skips. In addition he has served as Maintenance Officer Staff of Commander Mine Force U. S. Pacific Fleet as Co—Chairman of the Naval Engineering Division Engineering Department U. S. Naval Academy and as CV Design Manager in the Advanced Concepts Division and as Head Ship Survivability Office Naval Ship Engineering Center. An active member of ASNE since 1966 he has served as a member of the National Council and is currently the Chairman of the Journal Committee. He has had several papers presented at ASNE Day and published in the Journal and in 1976 was one of the recipients of the ASNE President's Award. At the present time he is assigned as the Commanding Officer Naval Coastal Systems Laboratory (NCSL) Panama City Fla. Mr. Casville M. Callahanis a native of Southwest Virginia where he attended Elementary and Secondary School prior to his three year's service in the U. S. Navy during World War II. He graduated from Lincoln Memorial University Harrogate Tenn. in 1950 receiving his BS degree in Mathematics. In 1952 he received his MS degree in Mathematics from Auburn University Auburn Ala. and taught mathematics at Lincoln Memorial University and at Florida State University Tallahassee Fla. prior to joining the staff of the Mine Defense Laboratory in 1955. He has progressed through a variety of assignments as the Labo
Test and Evaluation have become paramount in today's Department of Defense acquisition process. Therefore, the U. S. Navy requires both private and public facilities to accomplish the final goals of the “Fly befo...
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