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Optimization of Mixed Polarity Reed-Muller Functions using Genetic Algorithm

Optimization of Mixed Polarity Reed-Muller Functions using G...

2011 3rd IEEE International Conference on Computer Research and Development (ICCRD 2011)(2011第三届计算机研究与发展国际会议)

作者： M. Yang Hongying Xu A.E.A. Almaini State Key Lab of ASIC & System Fudan University Shanghai China Tianjin Vocational College of Mechanics and Electricity Tianjin China School of Engineering Napier University Edinburgh UK

In this paper, genetic algorithm (GA) using parallel tabular technique is presented for the optimization of mixed polarity Reed Muller and mixed polarity dual Reed Muller functions. The algorithm is to find optimal solution among 3" different solutions for large functions. To overcome the disadvantage of the traditional tabular technique, the cost function of GA is based on parallel tabular technique, in which new terms are generated at one time instead of generating in sequence. Without generating all the polarities, the proposed algorithm is efficient in terms of CPU time and achieves 8％ improvement in average.

关键词： logic synthesis genetic algorithm computer aided design

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A novel surface plasmon biosensor with imprinted waveguide metal gratings for protein detection

A novel surface plasmon biosensor with imprinted waveguide m...

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作者： Xu, Zhen-Cheng Dong, Biqin Lu, Bing-Rui Chen, Yifang Huq, Ejaz Qu, Xin-Ping Liu, Ran State Key Lab of ASIC and System Department of Microelectronics Fudan University Shanghai 200433 China Department of Physics Fudan University Shanghai 200433 China Micro and Nanotechnology Centre Rutherford Appleton Laboratory Chilton Didcot Oxon OX11 0QX United Kingdom School of Microelectronics Fudan University 220 Handan Road Shanghai China

In this paper, we present a waveguide-surface plasmon resonance biosensor. A 450 nm period sub-wavelength metallic gratings (SWMGs) were fabricated by nanoimprint, which was then applied to detect the protein layer capping on the grating. Both our measurement and simulation results indicate that the resonance does exist for 450 nm pitched gratings. A resonance shift in surface plasmon resonance (SPR) curves of protein films with different refractive indices were investigated, which would be promisingly applied in protein, DNA or drug test. Moreover, a novel angle of incidence (AOI) based detection method was developed to help reduce the cost of the expensive detecting devices. © 2011 Elsevier B.V. All rights reserved.

关键词： Surface plasmon resonance

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Late Breaking Results: An Effective Legalization Algorithm for Heterogeneous FPGAs with Complex Constraints 21

Late Breaking Results: An Effective Legalization Algorithm f...

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Proceedings of the 58th Annual ACM/IEEE Design Automation Conference

作者： Zhipeng Huang Haokai Sun Huimin Wang Ziran Zhu Jun Yu Jianli Chen Center for Discrete Mathematics and Theoretical Computer Science Fuzhou University Fuzhou China Software Engineering Institute East China Normal University Shanghai China State Key Lab of ASIC & System Fudan University Shanghai China National ASIC System Engineering Center School of Electronic Science and Engineering Southeast University Nanjing China Center for Discrete Mathematics and Theoretical Computer Science Fuzhou University Fuzhou China and State Key Lab of ASIC & System Fudan University Shanghai China

ISBN: (纸本)9781665432740

The modern FPGA placement problem has become much more challenging than ever with various emerging design constraints, such as the location (including relative location (RLOC) and location range) and chain constraints, which have not been considered in the literature. In this paper, we propose a combinatorial algorithm for FPGA legalization with location and chain constraints. We first identify a virtual range to cluster an instance with the RLOC constraint and formulate minimum cost integer linear programming. Besides, we use an adaptive algorithm to deal with the chain-aware legalization problem for better quality and runtime trade-offs. Finally, a legalization algorithm based on minimum cost maximum flow (MCMF) is used to improve the solution quality further. Compared with the state-of-the-art work, experimental results show that our proposed algorithm can achieve respectively 4.4% and 4.9% smaller average and maximum movements, 1.7% smaller routed wirelength, and 7.6% shorter routing runtime.

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Multi-Corner Parametric Yield Estimation via Bayesian Inference on Bernoulli Distribution with Conjugate Prior

Multi-Corner Parametric Yield Estimation via Bayesian Infere...

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IEEE International Symposium on Circuits and systems (ISCAS)

作者： Jiahe Shi Zhengqi Gao Jun Tao Yangfeng Su Dian Zhou Xuan Zeng ASIC & System State Key Lab School of Microelectronics Fudan University Shanghai China School of Mathematical Sciences Fudan University Shanghai China Dept. of EE University of Texas at Dallas Dallas USA

ISBN: (数字)9781728133201

ISBN: (纸本)9781728133218

To efficiently estimate parametric yields over multiple process, voltage, temperature corners for binary output circuits, we propose a novel Bayesian Inference method based on Bernoulli distribution with conjugate prior in this paper. The key idea is to adopt a product of Beta distributions as the conjugate prior for the yields and encode circuit performance correlations among different corners into this prior. Next, the hyper-parameters are optimized by using multi-start Quasi-Newton method, and the yields over different corners are estimated via maximum-a-posteriori. Two circuit examples demonstrate that the proposed method achieves up to 3.0× cost reduction over the state-of-the-art methods without surrendering any accuracy.

关键词： Temperature distribution Correlation Training data Bayes methods Numerical models Yield estimation Integrated circuit modeling

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Sub-10 nm silicon FinFET devices on SOI substrate made by block copolymer lithography

Sub-10 nm silicon FinFET devices on SOI substrate made by bl...

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International Conference on Solid-state and Integrated Circuit Technology

作者： Dong-Xue Li Chien-Liang Chien Xinnian Wei Yanwei Huang Xin-Ping Qu Tzu-Hsuan Chang Shisheng Xiong School of Microelectronics State Key Lab of ASIC and System Fudan University Shanghai China Department of Electrical Engineering National Taiwan University Taipei School of Information Science and Technology Fudan University Shanghai China

Block copolymer (BCP) lithography as a low-cost and simple process emerges to become an important patterning technique in microelectronic manufacturing. In this work, self-assembly of a triblock copolymer was used to prepare silicon nanowire FinFET devices on the SOI substrate. The original pattern was formed on the block copolymer layer via self-assembly, and then transferred to the Si layer by dry etching that stops at the interface of Si and box oxide. The minimum critical dimension of the device can be as small as 8 nm, and the performance is extensively evaluated. This type of FinFET device shows high transconductance (g m ) 150 μS, signifies extremely low off current (I OFF ) ~50 pA, and high on/off current ratio (I ON /I OFF ) up to 3×10 6 .

关键词： Silicon FinFETs Self-assembly Substrates Silicon-on-insulator Lithography Nanoscale devices

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Projection based active Gaussian process regression for pareto front modeling

arXiv

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arXiv 2020年

作者： Gao, Zhengqi Tao, Jun Su, Yangfeng Zhou, Dian Zeng, Xuan ASIC & System State Key Lab School of Microelectronics Fudan University Shanghai China School of Mathematical Sciences Fudan University Shanghai China Department of EE University of Texas at Dallas Dallas United States

Pareto Front (PF) modeling is essential in decision making problems across all domains such as economics, medicine or engineering. In Operation Research literature, this task has been addressed based on multi-objective optimization algorithms. However, without learning models for PF, these methods cannot examine whether a new provided point locates on PF or not. In this paper, we reconsider the task from Data Mining perspective. A novel projection based active Gaussian process regression (P-aGPR) method is proposed for efficient PF modeling. First, P-aGPR chooses a series of projection spaces with dimensionalities ranking from low to high. Next, in each projection space, a Gaussian process regression (GPR) model is trained to represent the constraint that PF should satisfy in that space. Moreover, in order to improve modeling efficacy and stability, an active learning framework has been developed by exploiting the uncertainty information obtained in the GPR models. Different from all existing methods, our proposed P-aGPR method can not only provide a generative PF model, but also fast examine whether a provided point locates on PF or not. The numerical results demonstrate that compared to state-of-the-art passive learning methods the proposed P-aGPR method can achieve higher modeling accuracy and stability. Copyright © 2020, The Authors. All rights reserved.

关键词： Numerical methods

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A 0.45V 687pW low noise amplifier front-end with 1.73 NEF for energy-scavenging IoT sensors

A 0.45V 687pW low noise amplifier front-end with 1.73 NEF fo...

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IEEE International Wireless Symposium (IWS)

作者： Shuo Li Xiong Zhou Sanfeng Zhang Hailiang Yao Qiang Li Vahid Behravan Arun Natarajan Zhiliang Hong Patrick Y. Chiang State Key Laboratory of ASIC & System Fudan University Shanghai China Integrated Systems Lab University of Electronic Science and Technology of China Chengdu China School of EECS Oregon State University Corvallis OR USA

ISBN: (纸本)9781509006977

This paper presents a sub-nanowatt front-end amplifier for ultra-low-power wireless IoT sensor nodes. This chip consists of an instrumentation amplifier, a DC servo loop, a clock generator and a bias circuit. It is fully integrated, and therefore does not rely on any off-chip references. Fabricated in 65nm CMOS process, measurement results show that the amplifier system achieves 39dB gain and 0.1-130Hz bandwidth, sufficient for many low-frequency sensor interface applications. The measured power is 687pW for a 0.45V supply voltage, which when compared with previously published AFEs, is the only sub-nW low-noise amplifier.

关键词： Clocks Sensors Wireless sensor networks Wireless communication Voltage measurement Frequency measurement Gain measurement

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An effective method of contour extraction for SEM image based on DCNN

An effective method of contour extraction for SEM image base...

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Advanced Patterning Solutions (IWAPS), International Workshop on

作者： Tao Zhou Xuelong Shi YanYan Chen Li Shoumian Chen Yuhang Zhao Wenzhan Zhou Kan Zhou Xuan Zeng Shanghai Integrated Circuits R&D Center Co. Ltd. Shanghai China State Key Lab of ASIC & System School of Microelectronics Fudan University Shanghai China

ISBN: (数字)9781728175775

ISBN: (纸本)9781728175782

SEM-image contours provide valuable information about patterning quality and capability. Geometrical properties such as critical dimension and resist sidewall angle could be extracted or estimated from SEM image contours. Those geometrical properties can be used for OPC model calibration, OPC model verification and lithography hotspot detection. This work presents a machine learning based method for contour extraction of SEM image. A designed DCNN network and self-made high quality dataset are combined for contour model training. Based on the high capability of image/feature representation and remarkable advantage of parallel computing with hardware acceleration, the model achieves high accuracy and real-time operation for contour extraction, more importantly, it provides the ability to distinguish and separate the top and bottom contours of SEM images. Additionally, the model not only removes the abundant edges but also repairs the local discontinuity caused by imperfect process and measuring technique.

关键词： Training Computational modeling Lithography Resists Machine learning Feature extraction Real-time systems

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Effective Sparsity-Prior Image Denoising Algorithm for CMOS Image Sensor in Ultra-Low Light Imaging Applications

Effective Sparsity-Prior Image Denoising Algorithm for CMOS ...

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China Semiconductor Technology International Conference (CSTIC)

作者： Tao Zhou Chen Li Jiebin Duan Xuan Zeng Yuhang Zhao Shanghai Integrated Circuits R&D Center Co. Ltd. Shanghai China State Key Lab of ASIC & System School of Microelectronics Fudan University Shanghai China

ISBN: (数字)9781728165585

ISBN: (纸本)9781728165592

An effective algorithm is designed for incorporating in a 3D stacked CMOS image sensor for image denoising in ultra-low light conditions. The algorithm originates from sparsity-prior of image and non-locally clustered sparse representation. The simulation results of the CIS image signal processing (ISP) demonstrate high-performance at intense noise level of ultra-low light images, which reveal a great potential of the CIS design in various applications such as night shot, security monitoring, machine-state inspection, medical imaging, biophysics detection, etc.

关键词： Three-dimensional displays Simulation Signal processing algorithms Clustering algorithms CMOS image sensors Signal processing Image denoising

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Optimal ramped-gate soft programming of over-erased flash EEPROM cells at given current

Optimal ramped-gate soft programming of over-erased flash EE...

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2004 7th International Conference on Solid-state and Integrated Circuits Technology Proceedings, ICSICT 2004

作者： Quan, Wu-Yun Baek, Chang-Ki Kim, Dae M. Gang, Ruan Huang, Yiping ASIC and System State-Key Research Lab. Department of Microelectronics Fudan University 220 Handan-road 200433 Shanghai China School of Electrical Engineering and Computer Science ISRC Seoul National University Kwanak P.O. Box 34 Seoul 151-744 Korea Republic of Korea Institute for Advanced Study 207-43 Cheongryangri Seoul Korea Republic of

Presented herein is an efficient simulation technique enabling systematic investigation of the soft programming over-erased flash EEPROM cells. The simulation provides a method by which to find the optimal soft programming technique for given current. The method requires only the cell performance data and allows investigation of the soft programming under various bias conditions. In principle, the methodology can also be used to investigate the programming and erase operations. © 2004 IEEE.

关键词： Flash memory

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