We present a combined analysis of neutron scattering and photoemission measurements on superconducting FeSe0.5Te0.5. The low-energy magnetic excitations disperse only in the direction transverse to the characteristic ...
We present a combined analysis of neutron scattering and photoemission measurements on superconducting FeSe0.5Te0.5. The low-energy magnetic excitations disperse only in the direction transverse to the characteristic wave vector (12,0,0) whereas the electronic Fermi surface near (12,0,0) appears to consist of four incommensurate pockets. While the spin resonance occurs at an incommensurate wave vector compatible with nesting, neither spin-wave nor Fermi-surface-nesting models can describe the magnetic dispersion. We propose that a coupling of spin and orbital correlations is key to explaining this behavior. If correct, it follows that these nematic fluctuations are involved in the resonance and could be relevant to the pairing mechanism.
In order to simplify the design and implementation of a stereo vision system, catadioptric instruments have been used to capture stereo images with a single camera. These catadioptric stereo systems not only provide r...
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Carbon dioxide (CO2) corrosion of carbon steel in the presence of brine has been a recognized problem in oil production for many years and it is becoming more common with the extensive use of CO2-flooding as an oil re...
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Because of the prevalence of digital imaging in radiology and the developments of electronic three-dimensional (3D) viewing devices, digital stereoradiography will become an efficient and economical way for improving ...
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Nanoindentation-induced material extrusion around the nanoindent (pile-up) leads to an overestimation of elastic modulus, E, and nanohardness, H, when the test results are evaluated using the Oliver and Pharr method. ...
Nanoindentation-induced material extrusion around the nanoindent (pile-up) leads to an overestimation of elastic modulus, E, and nanohardness, H, when the test results are evaluated using the Oliver and Pharr method. Factors affecting the pile-up during testing are residual stresses in film and ratio of film and substrate mechanical properties. Nanoindentation of hydrogenated amorphous silicon (a-Si:H) films has been carried out with the aim to study the effect of residual compressive stress on the pile-up in this material. To distinguish the contribution of compressive stress to the appearance of pile-up ion implantation has been used as a tool, which reduces the compressive stress in a-Si:H. Scanning probe microscope has been used for the imaging of the indent and evaluation of the pile-up. The values of E and H have been obtained from the experimental load-displacement curves using depth profiling with Berkovich tip, which has created negligible pile-up. A sharper cube corner tip has been used to study the pile-up. It has been established that pile-up is determined by the material plasticity, when the compressive stress is below 200 MPa. The contribution of mechanical stress to the pile-up is essential for the stress as high, as about 500 MPa.
Because of the prevalence of digital imaging in radiology and the developments of electronic three-dimensional (3D) viewing devices, digital stereoradiography will become an effcient and economical way for improving t...
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ISBN:
(纸本)9780769537443
Because of the prevalence of digital imaging in radiology and the developments of electronic three-dimensional (3D) viewing devices, digital stereoradiography will become an effcient and economical way for improving the diagnostic effcacy. A viewing device based on one compact mirror and two flat-panel LCDs to achieve high resolution of digital dental stereoradiography is proposed and its effectiveness was evaluated. The proposed viewing method shows better performance compared with the other two approaches. Clinical use of the viewing instruments can be expected to show similar results.
A series of demonstrations and laboratory exercises have been developed to teach fundamental concepts in the thermal and fluid sciences of the undergraduate engineering curriculum. This material is part of an educatio...
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The microstructure and electromagnetic properties of FeCoB-SiO2 thin films which were deposited on different substrates (silicon, glass and Mylar) by using magnetron sputtering were studied. X-Ray Diffraction revealed...
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The microstructure and electromagnetic properties of FeCoB-SiO2 thin films which were deposited on different substrates (silicon, glass and Mylar) by using magnetron sputtering were studied. X-Ray Diffraction revealed that FeCo nanocrystalline only precipitated in FeCoB-SiO2 thin films on silicon and glass substrates, and the FeCoB-SiO2 films on Mylar substrate were amorphous. The surface images obtained by atomic microscopy (AFM) indicated that films on Mylar substrate with biggest particle size (about 120-150 nm), and agglomerated particle was discovered. The static electromagnetic properties, including resistivity and saturation magnetization for the films on different substrates, had also been investigated. The films sputtered on glass showed highest resistivity (2140 μΩcm) and a biggest saturation magnetization (4 πMs = 13 kG).
In this study, we proposed the low temperature (150 °C) oxygen (O2) and ozone (O3) treatments with a high pressure of 68 atm to improve the quality of sputtered hafnium-oxide (HfOx) thin-film dielectric...
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