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2019 International Conference on Quality, reliability, Risk, Maintenance, and Safety Engineering, QR2MSE 2019

作者： Chen, Yuan Zhang, Peng Hou, Bo Huang, Hong-Zhong University of Electronic Science and Technology of China School of Mechanical and Electrical Engineering Chengdu Sichuan611731 China Fifth Electronics Research Institute of Ministry of Industry and Information Technology Science and Technology on Reliability Physics and Application of Electronic Component Laboratory Guangzhou Guangdong510610 China South China University of Technology Analysis and Test Center Guangzhou Guangdong510641 China

ISBN: (纸本)9781728114279

Power devices are widely used in power supply or converter systems in aerospace, rail transit, smart grid, new energy vehicles, industrial electronics and other fields. The reliability of power devices plays an important role in the smooth operation of power electronic system. Junction temperature is an important parameter that determines the lifetime of power devices, and its fluctuation is directly related to the aging and failure of bonding wire and solder layer. In this paper, the NPN high-power switch transistor is tested for power cycling, and the changes of electrical parameters and thermal resistance are compared under different junction temperature variations, and Coffin-Mason model is used to predict its lifetime. The degradation trend of power devices is described by using both life prediction model and sensitive parameter change innovatively. The results show that the prediction lifetime by Coffin-Mason model is consistent with the degradation trend of sensitive parameters. © 2019 IEEE.

关键词： Junction temperature

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Enhancing dipole polarization loss in conjugated metal-organic frameworks via coordination symmetry breaking under electromagnetic field

Advanced Powder Materials

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Advanced Powder Materials 2025年第4期4卷

作者： Weize Wang Rong Liu Jiaqi Tao Tinglei Yu Yijie Liu Lvtong Duan Zifu Zhang Zhihao He Shuang Chen Jintang Zhou Ping Chen Peijiang Liu Zhengjun Yao College of Materials Science and Technology Nanjing University of Aeronautics and Astronautics Nanjing 211100 China Key Laboratory of Material Preparation and Protection for Harsh Environment (Nanjing University of Aeronautics and Astronautics) Ministry of Industry and Information Technology Nanjing 211100 China Kuang Yaming Honors School Nanjing University Nanjing 210023 China Department of Materials Science and Engineering National University of Singapore 117575 Singapore College of chemistry and chemical engineering Lanzhou University Lanzhou 730000 China School of Electronic Science and Engineering Nanjing University Nanjing 210023 China Reliability Physics and Application Technology of Electronic Component Key Laboratory the fifth Electronics Research Institute of the Ministry of Industry and Information Technology Guangzhou 510610 China

Modulating the dipole polarization loss in the single-atom region and establishing its direct relationship with the electromagnetic wave absorption (EWA) performance remain an unmet challenge. Here, a dual-ligand modulation strategy, i.e., partially changing coordination atoms in the single-metal region (sMr), is introduced to effectively break the coordination symmetry of conjugated metal-organic frameworks (cMOFs), finally enhancing EWA property of cMOFs materials. Further, the asymmetrical sMr is experimentally found to elicit the dipole polarization loss, overcoming the handicaps of other electromagnetic wave loss mechanisms, which directly contribution to enhance EWA performance of this series of cMOFs. This strategy is further confirmed by replacing metal centers. Among studied series of cMOFs, Cu 2.25 /Co 0.75 (HHTP 1.67 HITP 0.33 ) achieves excellent EWA performance with an effective absorption bandwidth of 5.00 GHz and a reflection loss of −66.03 dB. We introduce a dual-ligand modulation strategy targeting single-metal regions within cMOFs here, aiming to achieve superior EWA performance through atomic-scale dipole polarization loss modulation. We hope our study can inspire more exploration to realize high-performance EWA materials.

关键词： Asymmetric structure Single-metal region Dipole polarization loss Electromagnetic wave absorption materials Conjugated metal-organic frameworks

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Research on the Test Method of Output Hot Standing Wave of High Power TWT

Research on the Test Method of Output Hot Standing Wave of H...

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2019 International Vacuum electronics Conference, IVEC 2019

作者： Liu, Xinai Zou, Feng Wang, Gang Miao, Guoxing Song, Fangfang Key Laboratory of Science and Technology on High Power Microwave Sources and Technologies Institute of Electronics Chinese Academic of Sciences Beijing101407 China University of Chinese Academy of Sciences Beijing101407 China Sci. and Technol. Reliability Physics and Application Technology of Electronic Component Laboratory Guangzhou510610 China

ISBN: (纸本)9781538675342

In this paper, the measurement principle of TWT output hot standing wave is analyzed, and the test method of hot standing wave based on vector network analyzer (VNA) is put forward. The feasibility of this method is preliminarily proved by analyzing and comparing the test results of the TWT output cold standing wave, and the output hot standing wave of \mathbf{L} band TWT is measured in saturated and small signal states. © 2019 IEEE.

关键词： Elastic waves

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Radiation Effects of 500 MeV Kr+ ions on NiO/β-Ga2O3 heterojunction diodes

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IEEE Transactions on Nuclear science 2025年

作者： Zhao, Penghui Chen, Hao Zhou, Leidang Ma, Teng Chen, Liang Yang, Tao Lei, Zhifeng Lu, Xing Zhou, Genshu Guo, Hui Ouyang, Xiaoping School of Materials Science and Engineering Xi’an Jiaotong University Xi’an710049 China Xi’an Jiaotong University School of Microelectronics Xi’an710049 China State Key Laboratory of Multiphase Flow in Power Engineering Xi’an Jiaotong University Xi’an710049 China Xi’an Engineering Research Center of Advanced3D Vision Shaanxi Xi’an710000 China China Electronic Product Reliability and Environmental Testing Research Institute Science and Technology on Reliability Physics and Application of Electronic Component Laboratory Guangzhou510610 China Northwest Institute of Nuclear Technology Radiation Detection Research Center Xi’an710024 China Xi’an Jiaotong University School of Instrument Science and Technology Xi’an710049 China Sun Yat-sen University State Key Laboratory of Optoelectronic Materials and Technologies School of Electronics and Information Technology Guangzhou510275 China Xidian University School of Microelectronics Shaanxi Xi’an710016 China

This study investigates the in-situ radiation effects on NiO/β-Ga2O3 heterojunction diodes (HJDs) under 500 MeV Kr+ ions irradiation, with a fluence of 1×108 cm-2 at -200 V. The statistical results show that both the forward conductive and reverse blocking characteristics of the HJDs were degraded after the irradiation of Kr+ ions. Associated with the analysis of current-voltage characteristics and the SRIM simulation results, the performance degradations were attributed to the vacancies induced by Kr+ ions radiation in the β-Ga2O3 material. On the one hand, the Kr+ radiation-induced vacancies reduced the net carrier concentration of the β-Ga2O3 and increased the generation-recombination current, leading to increased specific on-resistance and ideality factor of the irradiated HJDs. On the other hand, an oxygen di-vacancies-related trap, set at 1.07±0.01 eV below the conduction band, was involved after Kr+ ions radiation, which enhanced the Poole-Frenkel emission process, dominating the higher leakage current of the irradiated HJDs beyond -300 V. These results provide valuable insights into the radiation damage and performance degradation mechanisms in β-Ga2O3-based devices for space applications. © 1963-2012 IEEE.

关键词： Radiation damage

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Topological electride Hf2Se: Enhanced hydrogen evolution reaction activity from nontrivial topological Fermi arc

EcoEnergy

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EcoEnergy 2024年

作者： Weizhen Meng Jiayu Jiang Hongbo Wu Yalong Jiao Xiaoming Zhang Zhenxiang Cheng Xiaotian Wang Hebei Key Laboratory of Photophysics Research and Application College of Physics Hebei Normal University Shijiazhuang China State Key Laboratory of Reliability and Intelligence of Electrical Equipment and School of Materials Science and Engineering Hebei University of Technology Tianjin China Institute for Superconducting and Electronic Materials Faculty of Engineering and Information Sciences University of Wollongong Wollongong New South Wales Australia

Recently, the emergence of topological electride catalysts has attracted significant attention in the fields of condensed matter physics, chemistry, and materials science. In this study, we found that electride Hf 2 Se exhibits various types of topological quantum states under the constraint of symmetric operations, particularly the Weyl point (WP) located at the K valley. The WP is closely aligned with the Fermi level and generates an extensive Fermi arc surface state on the (001) surface. In addition, electride Hf 2 Se exhibits a lower work function on the (001) surface. Remarkably, electride Hf 2 Se exhibits extremely high stability in both air and water environments. The catalytic activity of electride Hf 2 Se for hydrogen evolution reaction (HER) was significantly improved by utilizing its robust surface state and low work function. Therefore, we provide a new insight into the application of electrides in HER.

关键词： inorganic electrides topological catalysis topological semimetals

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Study of Fields Above Differential Microstrip lines for Probe Characterization application

Study of Fields Above Differential Microstrip lines for Prob...

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Workshop on Electromagnetic Compatibility of Integrated Circuits (EMC Compo)

作者： Xinxin Tian Zeyi Li Rongquan Chen Meizhen Xiao Weiheng Shao Wenxiao Fang Duolong Wu Lei Wang Hengzhou Liu Yulong Wang Xuecheng Xu Zhiyuan He Heng Zhang School of Physics and Optoelectronic Engineering Guangdong University of Technology Science and Technology on Reliability Physics and Application of Electronic Component Laboratory China Electronic Product Reliability and Environmental Testing Research Institute (CEPREI) Guangzhou China

The spatial resolution of probe is defined for a 6-dB level drop point from the peak point close to the edge of the microstrip line. However, this definition is not clear for strongly coupled traces. If the spacing between adjacent traces is small enough, the probe may not detect multiple sources. In this paper, near fields above differential microstrip lines are investigated numerically and theoretically for probe characterization of spatial resolution. Results show several limiting cases for the probe to discriminate two RF sources in close proximity. It is discovered that two traces can be easily distinguished with differential mode excitation, while the detection for the common mode excitation cases is affected by probe height and trace spacing.

关键词： Probes Magnetic field measurement Electromagnetic compatibility Spatial resolution Microstrip components Magnetic fields

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Transient Analysis Based on Finite Element Method for Ball Grid Array Package

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IOP Conference Series: Earth and Environmental science 2021年第4期769卷

作者： Wenhao Luo Wei Su Xianshan Dong Zhenhua Nie Agam Tomar MOE Key lab of Disaster Forecast and Control in Engineering School of Mechanics and Construction Engineering Jinan University Science and Technology on Reliability Physics and Application Technology of Electronic Component Laboratory China Electronic Product Reliability and Environmental Testing Research Institute Guangzhou China Science and Technology on Reliability Physics and Application Technology of Electronic Component Laboratory China Electronic Product Reliability and Environmental Testing Research Institute MOE Key lab of Disaster Forecast and Control in Engineering Guangzhou China MOE Key lab of Disaster Forecast and Control in Engineering Science and Technology on Reliability Physics and Application Technology of Electronic Component Laboratory China Electronic Product Reliability and Environmental Testing Research Institute Guangzhou China MOE Key lab of Disaster Forecast and Control in Engineering School of Mechanics and Construction Engineering Jinan University Guangzhou China Faculty of Engineering and Mathematical Sciences University of Western Australia MOE Key lab of Disaster Forecast and Control in Engineering Perth Australia

In this paper, finite element simulation is carried out for BGA sample. The authors establishes the model of fixture, ceramic panel and metal sheet. Based on this model, several layers papers are laid on the metal sheet for simulation test. Then, ANASYS Workbench is used to conduct transient analysis of the samples to study the influence of different thickness papers on acceleration and time. The results provide useful reference for the adjustment of dynamic response parameters.

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A Method for Thermal Resistance Test of Reverse-Conducting IGBT (RC-IGBT)

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IOP Conference Series: Materials science and Engineering 2021年第2期1043卷

作者： Y Chen P Zhang X F Hu H Z Huang P Lai Z Y He Y Q Chen Science and Technology on Reliability Physics and Application of Electronic Component Laboratory The 5th Electronics Research Institute of MIIT Guangzhou China School of Mechanical and Electrical Engineering University of Electronic Science and Technology of China Chengdu China South China University of Technology Guangzhou Guangdong

The RC-IGBT is integrated IGBT and fast recovery diode (FRD) on the same chip. RC-IGBT has smaller size, higher power density, lower cost, and higher reliability. However, due to the snap-back effect, the traditional test circuit and method cannot accurately measure the thermal resistance of RC-IGBT. In this paper, a thermal resistance test circuit based on series compensation of two devices is proposed, and the voltage drop Vec of the body diode is taken as the temperature sensitive parameter of RC-IGBT. The thermal response curve is obtained basing on the change of Vec with temperature. By comparing the traditional method with the new method, it can be seen that the new method can greatly improve the test accuracy.

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Finite Element Analysis of Subsurface Damage of Optical Glass after Grinding

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Journal of physics: Conference Series 2021年第2期1802卷

作者： Wei Su Wenhao Luo Xianshan Dong Renhuai Liu MOE Key lab of Disaster Forecast and Control in Engineering Guangzhou 510632 China Science and Technology on Reliability Physics and Application Technology of Electronic Component Laboratory China Electronic Product Reliability and Environmental Testing Research Institute Guangzhou 510610 China School of Mechanics and Construction Engineering Jinan University Guangzhou 510632 China

The interaction between abrasive particles and optical element surface can result in various forms of subsurface damage while removing the material. In order to obtain the stress distribution during optical glass grinding, the finite element analysis of optical glass grinding is carried out by using ANSYS software. The stress distribution of optical glass was obtained by establishing the grinding model of consolidated abrasive and free abrasive. The simulation results show that different abrasives have different damage degrees to the glass surface, which provides a useful reference for improving the quality of optical material processing technology.

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Residual Stress Analysis of Laser Welding Between Output Needle and Helix

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Journal of physics: Conference Series 2021年第2期1802卷

In order to obtain the welding stress of the output needle and helix, a finite element model is established and the mesh at the weld is refined to evaluate the welding residual stress. ANSYS parameter design language is used to simulate the motion load of welding heat source. Based on the exact calculation of the temperature field, the corresponding thermal units are converted into structural units to calculate the welding residual stress. Finally, the thermal stress distribution curve and residual stress distribution trend are obtained after post-treatment.

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