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检索条件"机构=Science and Technology on Reliability Physics and Application of Electronic"
824 条 记 录,以下是221-230 订阅
排序:
Synergically improved energy storage performance and stability in sol–gel processed BaTiO_(3)/(Pb,La,Ca)TiO_(3)/BaTiO_(3) tri-layer films with a crystalline engineered sandwich structure
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Journal of Advanced Ceramics 2023年 第12期12卷 2300-2314页
作者: Jinpeng Liu Ying Wang Hanfei Zhu Hongyu Luo Xiao Zhai Yu Huan Jing Yan Kun Wang Chao Liu Hongbo Cheng Jun Ouyang School of Chemistry and Chemical Engineering Qilu University of Technology(Shandong Academy of Sciences)Jinan 250353China School of Physics Shandong UniversityJinan 250100China School of Material Science and Engineering University of JinanJinan 250022China College of Physics and Electronic Engineering Qilu Normal UniversityJinan 250200China China Tobacco Shandong Industrial Co. Ltd.Jinan 250014China Key Laboratory of Key Film Materials&Application for Equipments(Hunan Province) Hunan Provincial Key Laboratory of Thin Film Materials and DevicesSchool of Material Sciences and EngineeringXiangtan UniversityXiangtan 411105China
Achieving an excellent energy storage performance,together with high cycling reliability,is desirable for expanding technological applications of ferroelectric ***,in well-crystallized ferroelectric materials,the conc... 详细信息
来源: 评论
Helium incorporation induced direct-gap silicides
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npj Computational Materials 2021年 第1期7卷 809-816页
作者: Shicong Ding Jingming Shi Jiahao Xie Wenwen Cui Pan Zhang Kang Yang Jian Hao Lijun Zhang Yinwei Li Laboratory of Quantum Functional Materials Design and Application School of Physics and Electronic EngineeringJiangsu Normal UniversityXuzhouChina State Key Laboratory of Superhard Materials Key Laboratory of Automobile Materials of MOEand College of Materials Science and EngineeringJilin UniversityChangchunChina Shandong Key Laboratory of Optical Communication Science and Technology School of Physical Science and Information Technology of Liaocheng UniversityLiaochengChina
The search of direct-gap Si-based semiconductors is of great interest due to the potential application in many technologically relevant *** work examines the incorporation of He as a possible route to form a direct ba... 详细信息
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Evaluation of stress voltage on off-state time-dependent breakdown for GaN MIS-HEMT with SiNx gate dielectric
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Chinese physics B 2020年 第10期29卷 444-450页
作者: Tao-Tao Que Ya-Wen Zhao Qiu-Ling Qiu Liu-An Li Liang He Jin-Wei Zhang Chen-Liang Feng Zhen-Xing Liu Qian-Shu Wu Jia Chen Cheng-Lang Li Qi Zhang Yun-Liang Rao Zhi-Yuan He Yang Liu School of Electronics and Information Technology Sun Yat-Sen UniversityGuangzhou 510275China School of Materials Science and Engineering.Sun Yat-Sen University Guangzhou 510275China Science and Technology on Reliability Physics and Application of Electronic Component Laboratory No.5 Electronics Research Institute of the Ministry of Industry and Information TechnologyGuangzhou 510610China
Stress voltages on time-dependent breakdown characteristics of GaN MIS-HEMTs during negative gate bias stress (with VGS 0, VS = 0) are investigated. For negative bias stress, the breakdown time distribution (β) decr... 详细信息
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Ultrafast Nonlinear Optical Response of Two-dimensional MoS_(2)/Bi_(2)Te_(3) Heterostructure
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Chinese Journal of Structural Chemistry 2021年 第11期40卷 1496-1504,1408页
作者: DONG Jun-Hao PAN Jia YE Chen-Yu WANG Ru HUANG Yong-Feng ZHENG Jing-Ying ZHAN Hong-Bing WANG Qian-Ting School of Materials Science and Engineering Fujian University of TechnologyFuzhou 350118China Fujian Provincial Key Laboratory of Advanced Materials Processing and Application Fuzhou 350108China School of Electronic Electrical Engineering and PhysicsFujian University of TechnologyFuzhou 350118China College of Materials Science and Engineering Fuzhou UniversityFuzhou 350118China
Controlled stacking of different two-dimensional(2D)atomic layers hold great promise for significantly optimizing the optical properties of 2D materials and broadening their ***,vertical 2DMoS_(2)/Bi_(2)Te_(3) heteros... 详细信息
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reliability evaluation of supercapacitors based on pseudo-failure calendar lifetime distribution
Reliability evaluation of supercapacitors based on pseudo-fa...
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12th International Conference on Quality, reliability, Risk, Maintenance, and Safety Engineering (QR2MSE 2022)
作者: P. Yu G. Wang Y. Huang C. Huang G. Lu School of Electric Power Engineering South China University of Technology Guangzhou People's Republic of China Laboratory of Science and Technology on Reliability Physics and Application of Electronic Component China Electronic Product Reliability and Environmental Testing Research Institute Guangzhou People's Republic of China Technology and Planning Office China Electronic Product Reliability and Environmental Testing Research Institute Guangzhou People's Republic of China
Supercapacitors are new types of electrical energy storage components with an electric double layer. Ageing characteristics, lifetime and reliability evaluation are of great significance for quality evaluation and rat...
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Enhanced pyrocatalysis of the pyroelectric BiFeO_(3)/g-C_(3)N_(4) heterostructure for dye decomposition driven by cold–hot temperature alternation
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Journal of Advanced Ceramics 2021年 第2期10卷 338-346页
作者: Mingzi Chen Yanmin Jia Huamei Li Zheng Wu Tianyin Huang Hongfang Zhang College of Physics and Electronic Information Engineering Zhejiang Normal UniversityJinhua321004China School of Science Xi’an University of Posts and TelecommunicationsXi’an710121China College of Environmental and Chemical Engineering Xi’an Polytechnic UniversityXi’an710048China Jiangsu Key Laboratory of Micro and Nano Heat Fluid Flow Technology and Energy Application School of Physical Science and Technology and School of Environmental Science and EngineeringSuzhou University of Science and TechnologySuzhou215009China
The BiFeO_(3)/g-C_(3)N_(4) heterostructure,which is fabricated via a simple mixing–calcining method,benefits the significant enhancement of the pyrocatalytic *** the growth of g-C_(3)N_(4) content in the heterostruct... 详细信息
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通过激光/分散系耦合增强氧化石墨烯的还原效果:实现大规模、低缺陷的石墨烯用于无折痕散热膜在先进柔性电子器件中的应用
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science Bulletin 2024年 第11期69卷 1716-1727页
作者: 孙佳惟 熊雨薇 贾海洋 韩龙祥 叶雯 孙立涛 College of Electronic and Information Engineering Suzhou University of Science and TechnologySuzhou 215009China SEU-FEI Nano-Pico Center Key Laboratory of MEMS of Ministry of EducationSoutheast UniversityNanjing 210096China School of Physics and New Energy Xuzhou University of TechnologyXuzhou 221018China Jiangsu Industrial Intelligent and Low-carbon Technology Engineering Center Suzhou 215000China Suzhou Key Laboratory of Intelligent Low-carbon Technology Application Suzhou 215000China College of Chemistry and Life Sciences Suzhou University of Science and TechnologySuzhou 215009China
The advancement of flexible electronics demands improved components,necessitating heat dissipation membranes(HDMs)to exhibit high thermal conductivity while maintaining structural integrity and performance stability e... 详细信息
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Temperature Hysteresis Effect of Q-factor in Vacuum Packaged MEMS Device  21
Temperature Hysteresis Effect of Q-factor in Vacuum Packaged...
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21st International Conference on electronic Packaging technology, ICEPT 2020
作者: Dong, Xianshan Huang, Qinwen Lai, Ping Yang, Shaohua Su, Wei Huang, Yun No.5 Electronics Research Institute of the Ministry of Industry and Information Technology Science and Technology on Reliability Physics and Application of Electronic Component Laboratory Guangzhou China
Vacuum packaging technology is commonly used in MEMS device to improve performance. Yet, the temperature influence of vacuum packaging on the MEMS device is rarely studied. In this paper, temperature hysteresis effect... 详细信息
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Failure Analysis and Modeling of Blind Vias Crack in BGA-PCB Assemblies
Failure Analysis and Modeling of Blind Vias Crack in BGA-PCB...
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International Conference on (ICEPT) electronic Packaging technology
作者: Ying Shi Shaohua Yang Fugen Wu Huafeng Dong State Key Laboratory of Precision Electronic Manufacturing Technology and Equipment and School of Materials and Energy Guangdong University of Technology Guangzhou P.R. China Science and Technology on Reliability Physics and Application of Electronic Component Laboratory No.5 Electronics Research Institute of Ministry of Industry and Information Technology (MIIT) Guangzhou P.R. China School of Physics and Optoelectronic Engineering Guangdong University of Technology Guangzhou P.R. China
electronic products and devices including personal computers, servers and mobile phones are moving towards high performance and high integration to meet the demands of users. As the core components in electronic produ...
来源: 评论
Enhanced Responsivity of Solar Blind Ultraviolet Photodetector by PEALD Deposited Zn-Doped Ga2O3Thin Films
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IEEE Transactions on Electron Devices 2024年 第1期71卷 664-669页
作者: Fan, Hui-Chen Wang, Chen Ruan, Yu-Jiao Shen, Kun-Ching Wu, Wan-Yu Wuu, Dong-Sing Lai, Feng-Min Lien, Shui-Yang Zhu, Wen-Zhang Xiamen Institute of Measurement and Testing National Measurement and Testing Center for Flat Panel Display Industry Xiamen361024 China Fuzhou University College of Physics and Information Engineering Fuzhou350108 China National United University Department of Materials Science and Engineering Miaoli36063 Taiwan National Chi Nan University Department of Applied Materials and Optoelectronic Engineering Nantou54561 Taiwan Xiamen University of Technology Xiamen Key Laboratory of Development and Application for Advanced Semiconductor Coating Technology School of Opto-Electronic and Communication Engineering Xiamen361026 China Da-Yeh University Department of Biomedical Engineering Changhua51591 Taiwan
In this article, the tunable Zn-doped Ga2O3 films were obtained by introducing ZnO intercalation during the film deposition using plasma-enhanced atomic layer deposition (PEALD). The effect of the ZnO cycle ratio on t... 详细信息
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