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检索条件"机构=Section Computer Engineering Faculty of Information Technology and Systems"
2828 条 记 录,以下是2701-2710 订阅
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Port interference faults in two-port memories
Port interference faults in two-port memories
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IEEE International Test Conference
作者: S. Hamdioui A.J. Van De Goor Intel Corporation Santa Clara CA USA Section Computer Architecture & Digital Technique Department of Electrical Engineering Faculty of Information Technology and Systems Delft University of Technnology Delft Netherlands
A two-port memory contains two similar ports, which can be accessed separately and independent of each other. In this paper, logical fault models are derived for the effect of shorts between the ports. The result is a... 详细信息
来源: 评论
Adaptive real-time control of a Christmas tree using a novel signal processing approach
Adaptive real-time control of a Christmas tree using a novel...
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American Control Conference (ACC)
作者: J. Hu H.R. Wu C.T. Chou M. Verhaegen D. Westwick G. Nijsse School of Computer Science and Software Engineering Clayton Australia Control Laboratory Faculty of Information Technology and Systems Delft University of Technnology Delft Netherlands
The LMS algorithm forms the core of a number of adaptive control schemes. It has on one hand provided certain degree of robustness to these algorithms but on the other hand its convergence rate is notoriously slow. We... 详细信息
来源: 评论
Industrial evaluation of DRAM tests
Industrial evaluation of DRAM tests
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Design, Automation and Test in Europe Conference and Exhibition
作者: A.J. van de Goer J. de Neef Dept. of Electr. Eng. Delft Univ. of Technol. Netherlands Faculty of Information Technology and Systems Department of Electrical Engineering Section Computer Architecture and Digital Technique Delft University of Technnology Delft Netherlands
This paper presents the results of 44 well known memory tests applied to 1896 1M*4 DRAM chips, using up to 96 different stress combinations with each test. The results show the importance of selecting the right stress... 详细信息
来源: 评论
A remote sensing data classification method using self-organizing map
A remote sensing data classification method using self-organ...
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IEEE International Symposium on Geoscience and Remote Sensing (IGARSS)
作者: M. Hosokawa Y. Ito T. Hoshi Earthquake Disaster Section National Research Institute of Fire and Disaster Mitaka Tokyo Japan Department of Civil Engineering Takamatsu National College of Technology Takamatsu Japan Department of Computer and Information Sciences Faculty of Engineering Ibaraki University Hitachi Ibaraki Japan
A supervised classification method using a self-organizing map (SOM) is proposed to classify remote sensing data. The SOM structure is composed of two layers. One is an input layer with nodes corresponding to spectral... 详细信息
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Frequency domain subspace model identification using the w -operator
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IFAC Proceedings Volumes 1999年 第2期32卷 3986-3991页
作者: Zi-Jiang Yang Kiyoshi Wada Faculty of Computer Engineering and System Science Kyushu Institute of Technology Iizuka Fukuoka 820-8502 TEL+81-948-29-7672 FAX+81-948-29-7651 Japan Department of Electrical and Electronic Systems Engineering Graduate School of Information Science and Electrical Engineering Kyushu University Hakozaki Fukuoka 812 Japan
This paper proposes an efficient and convenient approach to frequency domain subspace identification for continuous-time systems. In the case of continuous-time models, the data matrices often become ill-conditioned i... 详细信息
来源: 评论
Erratum to “The traveling point load revisited” [Wave Motion 29 (1999) 119–135]
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Wave Motion 1999年 第3期30卷 289-289页
作者: M.C.M. Bakker M.D. Verweij B.J. Kooij H.A. Dieterman Section of Structural Mechanics and Dynamics Department of Civil Engineering Faculty of Civil Engineering and Geosciences Stevinweg 1 2628 CN Delft The Netherlands Laboratory of Electromagnetic Research Department of Electrical Engineering Faculty of Information Technology and Systems Mekelweg 4 2628 CD Delft The Netherlands
来源: 评论
Consequences of port restrictions on testing address decoder faults in two-port memories
Consequences of port restrictions on testing address decoder...
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Asian Test Symposium (ATS)
作者: S. Hamdioui A.J. van de Goor Faculty of Information Technology and Systems Department of Electrical Engineering Section of Computer Architecture & Digital Technique Delft University of Technnology Delft Netherlands
Testing two-port memories requires the use of single-port tests as well as special two-port tests; the test strategy determines which tests have to be used. Many two-port memories have ports which are read-only or wri... 详细信息
来源: 评论
System level modelling for hardware/software systems
System level modelling for hardware/software systems
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EUROMICRO Conference
作者: J.P.M. Voeten P.H.A. van der Putten M.C.W. Geilen M.P.J. Stevens Section of Information and Communication Systems Faculty of Electrical Engineering Eindhovan University of Technology Eindhoven Netherlands
Industry is facing a crisis in the design of complex hardware/software systems. Due to the increasing complexity, the gap between the generation of a product idea and the realisation of a working system is expanding r... 详细信息
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Consequences of port restrictions on testing two-port memories
Consequences of port restrictions on testing two-port memori...
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IEEE International Test Conference
作者: S. Hamdioui A.J. van de Goor Faculty of Information Technology and Systems Department o Electrical Engineering Section Computer Architecture & Digital Technique Delft University of Technnology Delft Netherlands
Testing two-port memories requires the use of single-port tests as well as special two-port tests; the test strategy determines which tests to be used. Many two-port memories have ports which are read-only or write-on... 详细信息
来源: 评论
March tests for word-oriented memories  98
March tests for word-oriented memories
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Design, Automation and Test in Europe Conference and Exhibition
作者: A.J. van de Goor I.B.S. Tlili Faculty of Information Technology and Systems Section Computer Architecture & Digital Technique Delft University of Technnology Delft Netherlands
Most memory test algorithms are optimized tests for a particular memory technology, and a particular set of fault models, under the assumption that the memory is bit-oriented; i.e., read and write operations affect on... 详细信息
来源: 评论