咨询与建议

限定检索结果

文献类型

  • 24 篇 会议
  • 1 篇 期刊文献

馆藏范围

  • 25 篇 电子文献
  • 0 种 纸本馆藏

日期分布

学科分类号

  • 10 篇 工学
    • 8 篇 计算机科学与技术...
    • 4 篇 电子科学与技术(可...
    • 4 篇 软件工程
    • 2 篇 仪器科学与技术
    • 2 篇 生物医学工程(可授...
    • 2 篇 生物工程
    • 1 篇 机械工程
    • 1 篇 材料科学与工程(可...
    • 1 篇 电气工程
    • 1 篇 信息与通信工程
    • 1 篇 建筑学
    • 1 篇 核科学与技术
  • 3 篇 理学
    • 2 篇 生物学
    • 1 篇 数学
  • 3 篇 管理学
    • 3 篇 管理科学与工程(可...
    • 3 篇 工商管理
  • 2 篇 经济学
    • 2 篇 应用经济学
  • 1 篇 法学
    • 1 篇 社会学
  • 1 篇 医学
    • 1 篇 基础医学(可授医学...
    • 1 篇 临床医学
    • 1 篇 公共卫生与预防医...
    • 1 篇 药学(可授医学、理...

主题

  • 9 篇 computer archite...
  • 5 篇 information tech...
  • 5 篇 random access me...
  • 4 篇 electronic mail
  • 3 篇 read-write memor...
  • 3 篇 interference
  • 3 篇 digital systems
  • 3 篇 system testing
  • 3 篇 scheduling
  • 2 篇 scalability
  • 2 篇 electrical capac...
  • 2 篇 application soft...
  • 2 篇 reduced instruct...
  • 2 篇 electronic switc...
  • 2 篇 decoding
  • 2 篇 circuit testing
  • 2 篇 circuit faults
  • 2 篇 clocks
  • 2 篇 performance eval...
  • 2 篇 testing

机构

  • 3 篇 delft university...
  • 2 篇 faculty of infor...
  • 2 篇 section digital ...
  • 1 篇 section computer...
  • 1 篇 stony brook univ...
  • 1 篇 parallel computi...
  • 1 篇 university of tu...
  • 1 篇 university of co...
  • 1 篇 the ohio state u...
  • 1 篇 eindhoven univer...
  • 1 篇 new york univers...
  • 1 篇 seoul national u...
  • 1 篇 z-inspection® in...
  • 1 篇 intel corporatio...
  • 1 篇 finnish tax admi...
  • 1 篇 section digital ...
  • 1 篇 syngenta cads de...
  • 1 篇 section computer...
  • 1 篇 hautmedizin bad ...
  • 1 篇 erasmus universi...

作者

  • 5 篇 a.j. van de goor
  • 4 篇 s. hamdioui
  • 4 篇 mulder hans
  • 3 篇 corporaal henk
  • 2 篇 a. srivastava
  • 2 篇 a.j. van de goer
  • 2 篇 hoogerbrugge jan
  • 2 篇 j. de neef
  • 2 篇 f. klass
  • 2 篇 j.m. mulder
  • 2 篇 r. in't velt
  • 2 篇 corporaal h.
  • 1 篇 klass f.
  • 1 篇 binkley charles
  • 1 篇 krier sebastien ...
  • 1 篇 neri emanuele
  • 1 篇 j.e. simonse
  • 1 篇 stephansen annet...
  • 1 篇 a. paalvast
  • 1 篇 h. corporaal

语言

  • 24 篇 英文
  • 1 篇 其他
检索条件"机构=Section Digital Systems and Computer Architecture"
25 条 记 录,以下是11-20 订阅
排序:
Defining SRAM resistive defects and their simulation stimuli
Defining SRAM resistive defects and their simulation stimuli
收藏 引用
Asian Test Symposium (ATS)
作者: A.J. van de Goor J.E. Simonse Systems Section Computer Architecture & Digital Technique Delft University of Technnology Delft Netherlands
This paper presents a structured way of deriving new functional fault models, based on the insertion of resistive defects into the electrical schematic of an SRAM. A taxonomy of the set of possible electrical faults i... 详细信息
来源: 评论
Efficient systolic array for linear discriminant function classifier
Efficient systolic array for linear discriminant function cl...
收藏 引用
CompEuro
作者: F. Klass Section Digital Systems and Computer Architecture Department of Electrical Engineering Delft University of Technnology Netherlands
A unidirectional flow systolic array with 100% efficiency is described for the linear discriminant classifier. To obtain this solution, a two-stage transformation method is applied to a contraflow array given by H.H. ... 详细信息
来源: 评论
Use of CMOS Technology in Wave Pipelining
Use of CMOS Technology in Wave Pipelining
收藏 引用
International Conference on VLSI Design
作者: F. Klass J.M. Mulder Section Computer Architecture and Digital Systems Department of Electrical Engineering Delft University of Technnology Netherlands
来源: 评论
Efficient Macro-code Emulation In Hardwired Pipelined Processors
Efficient Macro-code Emulation In Hardwired Pipelined Proces...
收藏 引用
Annual Workshop on Microprogramming and Microarchitecture
作者: J.M. Mulder R.J. Portier A. Srivastava R. in't Velt Section Digital Systems and Computer Architecture Department of Electrical Engineering Delft University of Technnology Delft Netherlands
来源: 评论
A Scalable VLSI MIMD Routing Cell
A Scalable VLSI MIMD Routing Cell
收藏 引用
Distributed Memory Computing Conference
作者: H. Corporaal J.G.E. Olk Faculty of Electrical Engineering Section Computer Architecture and Digital Systems Delft University of Technnology Delft Netherlands
来源: 评论
March tests for word-oriented memories  98
March tests for word-oriented memories
收藏 引用
Design, Automation and Test in Europe Conference and Exhibition
作者: A.J. van de Goor I.B.S. Tlili Faculty of Information Technology and Systems Section Computer Architecture & Digital Technique Delft University of Technnology Delft Netherlands
Most memory test algorithms are optimized tests for a particular memory technology, and a particular set of fault models, under the assumption that the memory is bit-oriented; i.e., read and write operations affect on... 详细信息
来源: 评论
Efficient macro-code emulation in hardwired pipelined processors  21
Efficient macro-code emulation in hardwired pipelined proces...
收藏 引用
Proceedings of the 21st annual workshop on Microprogramming and microarchitecture
作者: J. M. Mulder R. J. Portier A. Srivastava R. in't Velt Section Digital Systems and Computer Architecture Department of Electrical Engineering Delft University of Technology POBox 5031 2600 AG Delft The Netherlands
Traditionally microcoded computers have been the ideal machines for implementing scalable architectures. These machines easily implement application-specific functionality in microcode and they allow architecturally t...
来源: 评论
Consequences of port restrictions on testing address decoder faults in two-port memories
Consequences of port restrictions on testing address decoder...
收藏 引用
Asian Test Symposium (ATS)
作者: S. Hamdioui A.J. van de Goor Faculty of Information Technology and Systems Department of Electrical Engineering Section of Computer Architecture & Digital Technique Delft University of Technnology Delft Netherlands
Testing two-port memories requires the use of single-port tests as well as special two-port tests; the test strategy determines which tests have to be used. Many two-port memories have ports which are read-only or wri... 详细信息
来源: 评论
Industrial evaluation of DRAM SIMM tests
Industrial evaluation of DRAM SIMM tests
收藏 引用
IEEE International Test Conference
作者: Ad.J. van de Goor A. Paalvast Faculty of Information Technology and Systems Department of Electrical Engineering Section Computer Architecture and Digital Technique Delft University of Technnology Delft Netherlands
This paper describes the results of testing 50 single inline memory modules (SIMMs) each containing 16 16 Mbit DRAM chips (DUTs); 39 SIMMs failed, and of the 800 DUTs, 116 failed. In total 54 different test algorithms... 详细信息
来源: 评论
Industrial evaluation of DRAM tests  99
Industrial evaluation of DRAM tests
收藏 引用
Proceedings of the conference on Design, automation and test in Europe
作者: Ad J. van de Goor J. de Neef Faculty of Information Technology and Systems Department of Electrical Engineering Section Computer Architecture and Digital Technique Delft University of Technology Delft The Netherlands
来源: 评论