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Dependency-aware Maintenance for Dynamic Grid services

Dependency-aware Maintenance for Dynamic Grid Services

引用

International Conference on Parallel Processing (ICPP)

作者： Hai Jin Li Qi Song Wu Yaqin Luo Jie Dai Cluster and Grid Computing Laboratory Service Computing Technology and System Huazhong University of Science and Technology China

Any mistaken maintenance for the complicated and distributed grid can bring unpredictable disaster. Here we focus on the system availability issues caused by service dependencies during the maintenance in grid. A novel mechanism, called Cobweb Guardian, is proposed in this paper. It provides multiple granularities (service-, container-, and node-level) maintenance for service components in grid. By using the Cobweb Guardian, grid administrators can execute the maintaining task safely in runtime with high availability. The evaluation results show that our proposed dependency-aware maintenance can make the grid management more automatic and available.

关键词： Availability Runtime Grid computing Computers Software maintenance Scalability Project management Parallel processing Containers Costs

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The design-for-testability features of a general purpose microprocessor

The design-for-testability features of a general purpose mic...

引用

2007 IEEE International Test Conference, ITC

作者： Wang, Da Fan, Xiaoxin Fu, Xiang Liu, Hui Wen, Ke Li, Rui Li, Huawei Hu, Yu Li, Xiaowei Key Laboratory of Computer System and Architecture Institute of Computing Technology Chinese Academy of Sciences Beijing China Beijing China Co. Ltd. Shanghai China

ISBN: (纸本)1424411289

This paper describes the design-for-testability (DFT) features and test challenges in a general purpose microprocessor design. An optimized DFT architecture with its implementation strategies are presented in detail. Major DFT solutions are implemented which can meet high-volume manufacturing (HVM) and high quality test goals. © 2007 IEEE.

关键词： Design for testability

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Deterministic Circular Self Test Path

Deterministic Circular Self Test Path

引用

第十二届全国容错计算学术会议

作者： WEN Ke HU Yu LI Xiaowei Key Laboratory of Computer System and Architecture Institute of Computing TechnologyChinese Academy Key Laboratory of Computer System and Architecture Institute of Computing TechnologyChinese Academy

Circular self test path (CSTP) is an attractive technique for testing digital integrated circuits(IC) in the nanometer era, because it can easily provide at-speed test with small test data volume and short test application time. However, CSTP cannot reliably attain high fault coverage because of difficulty of testing random-pattern-resistant faults. This paper presents a deterministic CSTP (DCSTP) structure that consists of a DCSTP chain and jumping logic, to attain high fault coverage with low area overhead. Experimental results on ISCAS'89 benchmarks show that 100％ fault coverage can be obtained with low area overhead and CPU time, especially for large circuits.

关键词： very large scale integration (VLSI) test built-in-self-test (BIST) circular self test path deterministic

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Test Generation for Crosstalk Glitches Considering Multiple Coupling Effects

Test Generation for Crosstalk Glitches Considering Multiple ...

引用

The 16th Asian Test Symposium(第十六届亚洲测试学术会议)

作者： Minjin Zhang Xiaowei Li Key Laboratory of Computer System and Architecture Institute of Computing Technology Chinese Acade Key Laboratory of Computer System and Architecture Institute of Computing Technology Chinese Acade

As the feature size continues to scale into the nanometer era, crosstalk-induced effect begins to exert a more significant influence. In this paper, we address the condition of maximum crosstalk glitch noise considering multiple coupling effects and propose a novel test generation technique for this problem. A multiple crosstalk-induced glitch fault (MCGF) model is introduced, which gives information on one or more sub-paths to be sensitized to generate transitions coupled to a victim line. The test for an MCGF is a 2-vector pattern that sensitizes the transition signal along the sub-path to each aggressor line at the maximum aggressive time (MAT), and propagates the signal on a victim line to an output. A new structure, transition map (TM), is proposed to record all the possible arrival time of a line. The MAT of a victim line is calculated based on effective coupling capacitance (ECC). Therefore, the crosstalk-induced effects can be effectively identified, and exactly activated using the generated test patterns. Experiments on ISCAS89 benchmark circuit show that the proposed technique can be applied to circuits of reasonable sizes within acceptable time.

关键词： Crosstalk Circuit faults Timing Test pattern generators system testing Noise generators Coupling circuits Capacitance Circuit noise Automatic test pattern generation

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Fault Tolerance Mechanism in Chip Many-Core Processors

Fault Tolerance Mechanism in Chip Many-Core Processors

引用

第十二届全国容错计算学术会议

作者： ZHANG Lei HAN Yinhe LI Huawei LI Xiaowei Key Laboratory of Computer System and Architecture Institute of Computing TechnologyChinese Academy Key Laboratory of Computer System and Architecture Institute of Computing TechnologyChinese Academy

As semiconductor technology advances, there will be billions of transistors on a single chip. Chip many-core processors are emerging to take advantage of these greater transistor densities to deliver greater performance. Effective fault tolerance techniques are essential to improve the yield of such complex chips. In this paper, a core-level redundancy scheme called N+M is proposed to improve N-core processors'yield by providing M spare cores. In such architecture, topology is an important factor because it greatly affects the processors'performance. The concept of logical topology and a topology reconfiguration problem are introduced, which is able to transparently provide target topology with lowest performance degradation as the presence of faulty cores on-chip. A row rippling and column stealing (RRCS) algorithm is also proposed. Results show that PRCS can give solutions with average 13.8％ degradation with negligible computing time.

关键词： chip many-core processors yield fault tolerance reconfiguration network-on-chip

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Online Distributed Fault Detection of Sensor Measurements

Online Distributed Fault Detection of Sensor Measurements

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第十二届全国容错计算学术会议

作者： GAO Jianliang XU Yongjun LI Xiaowei Key Laboratory of Computer System and Architecture Institute of Computing TechnologyChinese Academy Key Laboratory of Computer System and Architecture Institute of Computing TechnologyChinese Academy

In wireless sensor networks (WSNs), a faulty sensor may produce incorrect data and transmit them to the other sensors. This would consume the limited energy and bandwidth of WSNs. Furthermore, the base station may make inappropriate decisions when it receives the incorrect data sent by the faulty sensors. To solve these problems, this paper develops an online distributed algorithm to detect such faults by exploring the weighted majority vote scheme. Considering the spatial correlations in WSNs, a faulty sensor can diagnose itself through utilizing the spatial and time information provided by its neighbor sensors. Simulation results show that even when as many as 30％ of the sensors are faulty, over 95％ of faults can be correctly detected with our algorithm. These results indicate that the proposed algorithm has excellent performance in detecting fault of sensor measurements in WSNs.

关键词： wireless sensor networks fault diagnosis fault detection fault tolerance spatial correlation

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Protein structure superposition by curve moment invariants and iterative closest point

Protein structure superposition by curve moment invariants a...

引用

2007 1st International Conference on Bioinformatics and Biomedical Engineering, ICBBE

作者： Xu, Dong Li, Hua Gu, Tongjun Key Laboratory of Intelligent Information Processing Key Laboratory of Computer System and Architecture National Research Center for Intelligent Computing Systems Institute of Computing Technology Chinese Academy of Sciences Center for Systems Biology Institute of Biophysics Chinese Academy of Sciences Graduate University Chinese Academy of Sciences

ISBN: (纸本)1424411203

Superimpose one protein tertiary structure to another can help to find similarity between them and further identify functional and evolutionary relationships. We first extract invariant features under rigid body transformation for each protein backbone which is represented by alpha-carbons of all the residues. Then, the invariant features are embedded with Iterative Closest Point algorithm for superposition. With several initialized orientations, pairwise alignment can be achieved accurately only by few iterations. Experiments indicate that our proposed algorithm is competitive with several well-known algorithms and with smallest root mean squared distance. © 2007 IEEE.

关键词： Proteins

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CREA: A Checkpoint Based Reliable Micro-architecture for Superscalar Processors

CREA: A Checkpoint Based Reliable Micro-architecture for Sup...

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The 16th Asian Test Symposium(第十六届亚洲测试学术会议)

作者： Shijian Zhang Weiwu Hu Key Laboratory of Computer System and Architecture Institute of Computing Technology Chinese Acade Key Laboratory of Computer System and Architecture Institute of Computing Technology Chinese Acade

Conventional temporal redundant techniques to detect transient faults have resulted in considerable performance loss. One major reason for this problem is the reclamation of some critical resources, such as the instruction window and physical registers, is delayed, which degrades instruction-level parallelism. This paper proposes a novel fault- tolerant micro-architecture based on checkpoint mechanism. All occupied resources are reclaimed during the retirement stage in the first execution. Therefore, the performance overhead is mitigated evidently. Our scheme requires only small hardware cost and provides short fault detection latency.

关键词： Registers Fault detection Retirement Hardware Costs Delay Pipelines Buffer storage Redundancy Yarn

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Frequency Analysis Method for Propagation of Transient Errors in Combinational Logic

Frequency Analysis Method for Propagation of Transient Error...

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The 16th Asian Test Symposium(第十六届亚洲测试学术会议)

作者： Shaohua Lei Yinhe Han Xiaowei Li Key Laboratory of Computer System and Architecture Institute of Computing Technology Chinese Acade Key Laboratory of Computer System and Architecture Institute of Computing Technology Chinese Acade

The continuous development of VLSI technology is shrinking the minimal sizes to nanometer region, making circuits more susceptible to transient error. In this paper, we present a frequency analysis method to accurately estimate the possible propagation of transient fault-due glitches through a CMOS combinational circuit. We use the frequency feature of signal and frequency response of electrical system to analyze the propagation of transient error. Experiments show that on average, our approach provides approximately 95％ accuracy and several orders of magnitude faster with respect to HSPICE simulation.

关键词： Transient analysis Frequency estimation CMOS logic circuits Very large scale integration CMOS technology Circuit faults Combinational circuits Frequency response Signal analysis Circuit simulation

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A routing algorithm for random error tolerance in network-on-chip

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12th International Conference on Human-Computer Interaction, HCI International 2007

作者： Zhang, Lei Li, Huawei Li, Xiaowei Key Laboratory of Computer System and Architecture Institute of Computing Technology Chinese Academy of Sciences 100080 Beijing China Graduate University Chinese Academy of Sciences Beijing 100080 China

ISBN: (纸本)9783540731092

In DSM and nanometer technology, there will present more and more new fault types, which are difficult to predict and avoid. Applying fault tolerant algorithms to achieve reliable on-chip communication is one of the most important issues of Network-on-Chip (NoC). This paper reviews the main on-chip fault tolerant communication algorithms and then proposes a new routing algorithm with end-to-end feedback. The average transmission latency, power consumption and reliability are compared with other techniques. As experiments show, the proposed algorithm has lower latency, lower power consumption compared with those of others, and it can provide high reliability. © Springer-Verlag Berlin Heidelberg 2007.

关键词： Routing algorithms

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