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检索条件"机构=State Key Laboratory of Computer Architecture~ Institute of Computing Technology"
1783 条 记 录,以下是1621-1630 订阅
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Utility analysis for Internet-oriented server consolidation in VM-based data centers
Utility analysis for Internet-oriented server consolidation ...
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IEEE International Conference on Cluster computing
作者: Ying Song Yanwei Zhang Yuzhong Sun Weisong Shi Key Laboratory of Computer System and Architecture Institute of Computing Technology Chinese Academy and Sciences Beijing China Wayne State University Detroit USA
Server consolidation based on virtualization technology will simplify system administration, reduce the cost of power and physical infrastructure, and improve utilization in today's Internet-service-oriented enter... 详细信息
来源: 评论
Mean Shift Based Collaborative Localization with Dynamically Clustering for Wireless Sensor Networks
Mean Shift Based Collaborative Localization with Dynamically...
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WRI International Conference on Communications and Mobile computing, CMC
作者: Quan Zhou Xiaowei Li Yongjun Xu Institute of Computing Technology Key Laboratory of Computer System and Architecture Chinese Academy and Sciences Beijing China Institute of Computing Technology Laboratory of Sensor Networks Chinese Academy and Sciences Beijing China
Mean shift is a nonparametric method to estimate the density gradient, which iteratively computes the mean of observations and shifts to the centroid until reach a predefined end condition. This paper proposes a mean ... 详细信息
来源: 评论
Smallest Enclosing Circle Based Localization Approach for Wireless Sensor Networks
Smallest Enclosing Circle Based Localization Approach for Wi...
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WRI International Conference on Communications and Mobile computing, CMC
作者: Quan Zhou Xiaowei Li Yongjun Xu Key Laboratory of Computer System and Architecture Institute of Computing Technology Chinese Academy and Sciences Beijing China Laboratory of Sensor Networks Institute of Computing Technology Chinese Academy and Sciences Beijing China
A novel range-free localization approach, smallest enclosing Circle based Localization (SECL), has been proposed. This approach uses the center of smallest enclosing circle of neighboring anchor nodes to estimate the ... 详细信息
来源: 评论
A self-repairable microprocessor
A self-repairable microprocessor
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ISTC/CSTIC 2009 (CISTC)
作者: Xie, Yuanjiang Fu, Xiang He, Zijian Zhao, Yang Hu, Yu Li, Xiaowei Key Laboratory of Computer System and Architecture Chinese Academy of Sciences Beijing 100190 China Institute of Computing Technology Chinese Academy of Sciences Beijing China Graduate School of Chinese Academy of Sciences Beijing 100049 China Department of Computer Science and Engineering University of California Riverside 92521 United States
With increasing defect density, microprocessors, especially the embedded caches, will encounter more faults. Adding spare resources to replace defective components is a widely accepted method for yield enhancement. In... 详细信息
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Characterizing Betweenness Centrality Algorithm on Multi-core architectures
Characterizing Betweenness Centrality Algorithm on Multi-cor...
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International Symposium on Parallel and Distributed Processing with Applications, ISPA
作者: Dengbiao Tu Guangming Tan Chinese Academy and Sciences China Key Laboratory of Computer System and Architecture Institute of Computing Technology Chinese Academy and Sciences China
This paper presents an in-depth analysis of characterization for an irregular application - computing betweenness centrality (BC) - on multicore architectures. BC algorithm is widely used in large scale graph analysis... 详细信息
来源: 评论
Impact of Hazards on Pattern Selection for Small Delay Defects
Impact of Hazards on Pattern Selection for Small Delay Defec...
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Pacific Rim International Symposium on Dependable computing
作者: Jie Wang Huawei Li Yinghua Min Xiaowei Li Huaguo Liang School of Computer and Information Hefei University of Technology Hefei China Key Laboratory of Computer System and Architecture Institute of Computing Technology Chinese Academy and Sciences Beijing China
Hazards ubiquitously exist in combinational circuits, and then should be taken into account for delay testing. This paper analyzes the impact of hazards on small-delay defect (SDD) detection, and presents a new test p... 详细信息
来源: 评论
A Low Overhead On-Chip Path Delay Measurement Circuit
A Low Overhead On-Chip Path Delay Measurement Circuit
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Asian Test Symposium (ATS)
作者: Songwei Pei Huawei Li Xiaowei Li Chinese Academy of Sciences Beijing China Key Laboratory of Computer System and Architecture Institute of Computing Technology Chinese Academy and Sciences China
In this paper, we present a novel on-chip path delay measurement circuit for efficiently detecting and debugging of delay faults in the fabricated integrated circuits. Several delay stages are employed in the proposed... 详细信息
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Small Delay Fault Simulation for Sequential Circuits
Small Delay Fault Simulation for Sequential Circuits
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Pacific Rim International Symposium on Dependable computing
作者: Li Liu Jishun Kuang Huawei Li School of Computer and Communication Hunan University Changsha China Key Laboratory of Computer System and Architecture Institute of Computing Technology Chinese Academy and Sciences Beijing China
Small-delay faults may escape detection by transition fault patterns, but traditional transition fault simulator can not detect this phenomenon. A fault simulator detecting test escape of small-delay faults is present... 详细信息
来源: 评论
A New Multiple-Round DOR Routing for 2D Network-on-Chip Meshes
A New Multiple-Round DOR Routing for 2D Network-on-Chip Mesh...
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Pacific Rim International Symposium on Dependable computing
作者: Binzhang Fu Yinhe Han Huawei Li Xiaowei Li Chinese Academy of Sciences Beijing China Key Laboratory of Computer System and Architecture Institute of Computing Technology Chinese Academy and Sciences Beijing China
The Network-on-Chip (NoC) meshes are limited by the reliability constraint, which impels us to exploit the fault tolerant routing. Particularly, one of the main design issues is minimizing the loss of non-faulty route... 详细信息
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Efficient Physical Design Methodology for Reducing Test Power Dissipation of Scan-Based Designs
Efficient Physical Design Methodology for Reducing Test Powe...
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International Conference on Networking, architecture, and Storage (NAS)
作者: Jun Xu Xiangku Li Key Laboratory of Computer System and Architecture Institute of Computing Technology Chinese Academy and Sciences Beijing China Chinese Academy of Sciences Beijing China
Scan-based test methodology is used to resolve the sequential-test problem but suffers from high power dissipation. In this paper, we propose a scheme to prevent transitions of scan chain from reflecting into the circ... 详细信息
来源: 评论