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检索条件"机构=State Key Laboratory of Computer System and Architecture"
2806 条 记 录,以下是2581-2590 订阅
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Effect of applied DC voltages and temperatures on space charge behaviour of multi-layer oil-paper insulation
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Journal of Physics: Conference Series 2009年 第1期183卷
作者: Chao Tang G Chen M Fu Rui-jin Liao The State Key Laboratory of Power Transmission Equipment & System Security and New Technology Chongqing University China School of Electronics and Computer Science University of Southampton UK AVERA T&D Technology Centre Stafford UK
In this paper, space charge in a multi-layer oil-paper insulation system was investigated using the pulsed electroacoustic (PEA) technique. A series of measurements had been carried following subjection of the insulat...
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Weak parametric failure equivalences and their congruence formats
Weak parametric failure equivalences and their congruence fo...
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Theory of Computing 2008 - 14th Computing: The Australasian Theory Symposium, CATS 2008
作者: Huang, Xiaowei Jiao, Li Lu, Weiming Academy of Mathematics and System Science Chinese Academy of Sciences China State Key Laboratory of Computer Science Institute of Software Chinese Academy of Sciences China
Weak equivalences are important behavioral equivalences in the course of specifying and analyzing the reactive systems using process algebraic languages. In this paper, we propose a series of weak equivalences named w... 详细信息
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On capture power-aware test data compression for scan-based testing
On capture power-aware test data compression for scan-based ...
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2008 International Conference on computer-Aided Design, ICCAD
作者: Li, Jia Liu, Xiao Zhang, Yubin Hu, Yu Li, Xiaowei Xu, Qiang Key Laboratory of Computer System and Architecture ICT CAS Beijing China Graduate University Chinese Academy of Sciences Beijing China Deptartment of Computer Science and Engineering Chinese University of Hong Kong Shatin N.T. Hong Kong
Large test data volume and high test power are two of the major concerns for the industry when testing large integrated circuits. With given test cubes in scan-based testing, the "don't-care" bits can be... 详细信息
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A current shaping technique to lower phase noise in LC oscillators
A current shaping technique to lower phase noise in LC oscil...
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15th IEEE International Conference on Electronics, Circuits and systems, ICECS 2008
作者: Chen, Jian Jonsson, Fredrik Olsson, Hakan Zheng, Li-Rong Zhou, Dian Electronic Computer and Software Systems Royal Institute of Technology Stockholm Kista-164 40 Sweden State Key Laboratory of ASIC and System Fudan University Shanghai 200433 China
A novel LC-tank oscillator, where bias noise is decoupled and drain current is shaped in order to reduce phase noise, is presented. Active devices work in a class-C manner, the drain current is pulse shaped and peaks ... 详细信息
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IFill: An Impact-Oriented X-Filling Method for Shift- and Capture-Power Reduction in At-Speed Scan-Based Testing  08
IFill: An Impact-Oriented X-Filling Method for Shift- and Ca...
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2008 Design, Automation and Test in Europe (DATE 2008), vol.3
作者: Jia LI Qiang XU Yu HU Xiaowei LI Key Laboratory of Computer System and Architecture ICT CAS Beijing China and Graduate University of Chinese Academy of Sciences Beijing China The Chinese University of Hong Kong Key Laboratory of Computer System and Architecture ICT CAS Beijing China
In scan-based tests, power consumptions in both shift and capture phases may be significantly higher than that in normal mode, which threatens circuits' reliability during manufacturing test. In this paper, by ana... 详细信息
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Testing content addressable memories using instructions and march-like algorithms
Testing content addressable memories using instructions and ...
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15th IEEE International Conference on Electronics, Circuits and systems, ICECS 2008
作者: Lin, Ma Yunji, Chen Menghao, Su Zichu, Qi Heng, Zhang Weiwu, Hu Key Laboratory of Computer System and Architecture Institute of Computing Technology Chinese Academy of Sciences P.O. Box 2704-25 Beijing 100080 China Graduate University Chinese Academy of Science Beijing 100049 China
CAM is widely used in microprocessors and SOC TLB modules. It gives great advantage for software development. And TLB operations become bottleneck of the microprocessor performance. The test cost of normal BIST approa... 详细信息
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Location Consistency Model Revisited: Problem, Solution and Prospects
Location Consistency Model Revisited: Problem, Solution and ...
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IEEE International Conference on Parallel and Distributed Computing, Applications and Technologies (PDCAT)
作者: Guoping Long Nan Yuan Dongrui Fan Key Laboratory of Computer System and Architecture Institute of Computing Technology Chinese Academy and Sciences Beijing China
Location consistency (LC) is a weak memory consistency model which is defined entirely on partial order execution semantics of parallel programs. Compared with sequential consistency (SC), LC is scalable and provides ... 详细信息
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An interconnect-aware power efficient cache coherence protocol for CMPs
An interconnect-aware power efficient cache coherence protoc...
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International Symposium on Parallel and Distributed Processing (IPDPS)
作者: Hongbo Zeng Jun Wang Ge Zhang Weiwu Hu Key Laboratory of Computer System and Architecture Institute of Computing Technology Chinese Academy and Sciences Beijing China
The continuing shrinking of technology enables more and more processor cores to reside on a single chip. However, the power consumption and delay of global wires have presented a great challenge in designing future ch... 详细信息
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On reducing both shift and capture power for sean-based testing
On reducing both shift and capture power for sean-based test...
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2008 Asia and South Pacific Design Automation Conference, ASP-DAC
作者: Li, Jia Xu, Qiang Hu, Yu Li, Xiaowei Key Laboratory of Computer System and Architecture ICT Chinese Academy of Sciences Beijing 100080 China Graduate University Chinese Academy of Sciences Beijing 100080 China Dept. of Computer Science and Engineering Chinese University of Hong Kong Hong Kong Center for Intelligent System and Biomimetics Institute of Advanced Integration Technology CAS/CUHK Shenzhen 518067 China
Power consumption in scan-based testing is a major concern nowadays. In this paper, we present a new X-filling technique to reduce both shift power and capture power during scan tests, namely LSC-filling. The basic id... 详细信息
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Research of the power frequency magnetic fields distribution around dry-type air-core reactor
Research of the power frequency magnetic fields distribution...
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2008 World Automation Congress, WAC 2008
作者: Yan, Zhang Quandi, Wang Bin, Li Yi, Zhao Qingsheng, Liu Refai, Hazem H. State Key Laboratory of Power Transmission Equipment and System Security and New Technology Chongqing University Chongqing 400030 China Electrical and Computer Engineering Department University of Oklahoma Tulsa OK 74135 United States
The strong magnetic fields generated by reactors, which not only interfere other electric equipments' regularly running, but also are potentially harmful to substation employees' health, are the main electroma... 详细信息
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