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Fault Detection and Diagnosis of Automated Manufacturing systems
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IFAC Proceedings Volumes 1988年 第15期21卷 95-102页
作者: N. Viswanadham T.L. Johnson Department of Computer Science & Automation Indian Institute of Science Bangalore India Systems Architectures Control Technology Bra General Electric R&D Center Schenectady NY 12345 USA
In this paper, we propose and develop a two level scheme for monitoring and diagnosis in automated manufacturing systems. At the first level, there are dedicated diagnostic systems for each of the subsystems such as m... 详细信息
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Fault detection and diagnosis of automated manufacturing systems
Fault detection and diagnosis of automated manufacturing sys...
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IEEE Conference on Decision and control
作者: N. Viswanadham T.L. Johnson Department of Computer Science & Automation Indian Institute of Science Bangalore India Systems Architectures Control Technology Bra General Electric Research and Development Center Schenectady NY USA
The authors develop a controller methodology for fault detection and diagnosis using Petri nets and fault trees in automated manufacturing systems. The controller has two levels. At the first level there are dedicated... 详细信息
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