The Mean Time Between Failures for an LCD Panel

作     者：Wang, Fu-Kwun Chu, Tao-Peng 

作者机构：Natl Taiwan Univ Sci & Technol Dept Ind Management Taipei 106 Taiwan Natl Taiwan Univ Sci & Technol Grad Inst Management Taipei 106 Taiwan 

出 版 物：《QUALITY AND RELIABILITY ENGINEERING INTERNATIONAL》 (国际质量与可靠性工程)

年 卷 期：2011年第27卷第2期

页      面：203-208页

核心收录：

学科分类：12[管理学] 1201[管理学-管理科学与工程(可授管理学、工学学位)] 08[工学] 

主　　题：mean time between failures LCD Panel Weibull distribution Burr XII distribution 

摘      要：The calculation of mean time between failures is very important in reliability life data analysis. For different distributions, the values of mean time between failures are always different. The two-parameter Weibull distribution is widely used in reliability engineering. However, some distributions may offer a better fit of data. This paper aims to develop an algorithm for determining the best-fitted distribution of a liquid crystal display panel based on the field return data. The two-parameter and three-parameter Weibull distributions and other distributions such as the Burr XII distribution, the Pareto distribution and the Log-logistic distribution are compared to provide a better characterization of the life data which is based on the maximum value of all log-likelihood functions. We also provide a goodness-of-fit test for the best-fitted distribution. It is recommended that the Burr XII distribution could be used to characterize the reliability life of a liquid crystal display panel. Copyright (C) 2010 John Wiley & Sons, Ltd.