Built-in-self-testing techniques for programmable capacitor arrays

作     者：Laknaur, Amit Durbha, Sai Raghuram Wang, Haibo 

作者机构：So Illinois Univ Dept Elect & Comp Engn Carbondale IL 62901 USA 

出 版 物：《JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS》 (J Electron Test Theory Appl JETTA)

年 卷 期：2006年第22卷第4-6期

页      面：449-462页

核心收录：

学科分类：0808[工学-电气工程] 0809[工学-电子科学与技术（可授工学、理学学位）] 08[工学] 

基　　金：National Science Foundation  NSF  (0448357) 

主　　题：built-in-self-testing field programmable analog array programmable capacitor array analog testing 

摘      要：This paper presents efficient built-in-self-testing (BIST) techniques for programmable capacitor arrays (PCAs) on field programmable analog array (FPAA) platforms. The proposed BIST circuits consist of switched-capacitor (SC) integrators and analog window comparators. Taking advantage of FPAA programmable resources, the proposed PCA BIST circuits can be implemented with very small hardware overhead. Also the impact of comparator threshold variations as well as other circuit parasitic effects on the efficiency of the proposed testing method is investigated. Effective circuit techniques along with new comparator designs are presented to minimize the adverse effect of comparator threshold variations. Finally, procedures for using the proposed BIST method to systematically test all PCAs on an FPAA platform are described and experimental results are presented.