A combined sinusoidal transmission grating spectrometer and x-ray diode array diagnostics for time-resolved spectral measurements in laser plasma experiments

作     者：Shpilman, Ze'ev Hurvitz, Gilad Danon, Liron Shussman, Tomer Ehrlich, Yosi Maman, Shlomo Levy, Izhak Fraenkel, Moshe 

作者机构：Soreq NRC Plasma Phys Dept IL-81800 Yavne Israel 

出 版 物：《REVIEW OF SCIENTIFIC INSTRUMENTS》 (科学仪器评论)

年 卷 期：2019年第90卷第1期

页      面：013501-013501页

核心收录：

学科分类：08[工学] 080401[工学-精密仪器及机械] 0804[工学-仪器科学与技术] 081102[工学-检测技术与自动化装置] 0811[工学-控制科学与工程] 0702[理学-物理学] 

主　　题：Spectral resolution time-resolved spectroscopy Spectrometer transmission grating line of sight Laser produced plasmas x-ray diode Time resolved spectral bands C6orf15 gene beyond visual range X-ray spectra Sinusoidal non line of sight 

摘      要：A new system which combines two independent diagnostic devices on the same line of sight is used to measure the X-ray spectrum in the 50-1000 eV regime. The first device is an array of six channels of time-resolved X-ray diodes (XRD s), arranged to cover the spectral band with low spectral resolution (lambda/Delta lambda similar to 3). The second device is a time-integrated sinusoidal transmission grating spectrometer (STGS) with a wide spectral range coverage and moderate spectral resolution (lambda/Delta lambda similar to 30). The spectral band of each XRD can be tuned by selecting a cathode, an x-ray mirror, and a filter. The novel sinusoidal shape of the STGS allows acquisition of a pure first-order spectrum without contribution of high dispersion orders, resulting in a higher accuracy spectrum measurement. The system described here has recently been used [Y. Ehrlich et al., Rev. Sci. Instrum. 88, 043507 (2017)] to demonstrate an improved unfolding algorithm of an XRD-acquired spectrum, achieved by experimental information gathered from the STGS measurement. Published under license by AIP Publishing.