Test structures and their application in structural testing of digital RSFQ circuits

作     者：Joseph, AA Heuvelmans, S Gerritsma, GJ Kerkhoff, HG 

作者机构：Univ Twente MESA Res Inst Testable Design & Testing Microsyst Grp NL-7500 AE Enschede Netherlands Univ Twente Low Temp Phys Grp NL-7500 AE Enschede Netherlands 

出 版 物：《PHYSICA C-SUPERCONDUCTIVITY AND ITS APPLICATIONS》 (Phys C Supercond Appl)

年 卷 期：2004年第403卷第1-2期

页      面：103-111页

核心收录：

学科分类：07[理学] 0702[理学-物理学] 

基　　金：The work has been carried out in the framework of JeSEF under the Fluxonics network in Europe. The authors are indebted to the members of the Fluxonics design group  esp. J. Kunert (JeSEF)  H. Topfer (TU Ilmenau) and A. Kidiyarova-Shevchenko (Chalmers) for their assistance in preparing the required data and design. JeSEF provided the chips for testing. We express deep sorrow on demise of our colleague and friend G.J. Gerritsma  who was the director of the "Terahertz" program at MESA+ institute 

主　　题：testing defect-oriented testing superconductor devices RSFQ circuit testing fault modeling 

摘      要：As the niobium (Nb) LTS RSFQ processes advance being the technology for future ultrahigh-speed systems in the digital domain, the quality of the process should be maintained high for a successful realization of these complex circuits. A defect-oriented testing (DOT) approach is essential so as to increase the yield of the process. Little information is available in this area and the recent increase of Josephson junctions to around 90,000 per chip requires a detailed study on this topic. In this paper we present how DOT can be applied to RSFQ circuits. As a result of a study conducted on an RSFQ process, a list of possible defects has been identified and described in detail. We have also developed test-structures for detection of the top-ranking defects, which will be used for the probability distribution of faults in the process. One of the highly probable defects will be used to elaborate the DOT technique for fault modeling and simulation purposes. (C) 2001 Elsevier B.V. All rights reserved.