An automatic test generation system for illiac iv logic boards

作     者：Agrawal, Vishwani D. 

作者机构：EG&G. Inc. Albuquerque N. 87106 United States Automation Technology Inc. Champaign ILL. United States 

出 版 物：《IEEE Transactions on Computers》 (IEEE Trans Comput)

年 卷 期：1972年第C-21卷第9期

页      面：1015-1017页

学科分类：0808[工学-电气工程] 08[工学] 0835[工学-软件工程] 0701[理学-数学] 0811[工学-控制科学与工程] 0812[工学-计算机科学与技术（可授工学、理学学位）] 

主　　题：D-algorithm diagnosis fault diagnosis off-line computer random test generation test generation 

摘      要：A test generation system, developed for the logic boards of the Illiac IV computer, is described. The system combines the test generation by random patterns and the D-algorithm. Some results are given to illustrate the effectiveness of this approach. Copyright © 1972 by The Institute of Electrical and Electronics Engineers, Inc.