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作者机构:Univ Maryland Dept Elect & Comp Engn College Pk MD 20742 USA
出 版 物:《IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY》 (IEEE Trans Electromagn Compat)
年 卷 期:2007年第49卷第2期
页 面:329-338页
核心收录:
学科分类:0810[工学-信息与通信工程] 0808[工学-电气工程] 08[工学]
基 金:Air Force Office of Scientific Research AFOSR (F496200110374)
主 题:CMOS inverters device scaling dynamic operation electromagnetic interference (EMI) parameter extraction method power dissipation propagation delay
摘 要:The effects of electromagnetic interference (EMI) from high-power microwave signals on CMOS inverters are reported. In order to study these effects more effectively, a novel analytical parameter extraction method, which allows us to predict the dynamic operation of the inverters under interference from experimentally measured load-line characteristics, is developed. Based on the method, the output voltages, output short-circuit currents, propagation delays, and dynamic power dissipation during EMI were extracted. The results showed that the inverters suffer severely from compressed output voltage swing, bit errors, significant changes in the propagation delays, and substantially increased short-circuit currents, as well as a large increase in dynamic power dissipation during logic state transition from high to low and vice versa. Scaling down of the inverters showed that such operational parameters of the devices were more strongly affected by the interference, resulting in significantly more vulnerable CMOS inverters.