In this paper, defect-oriented testing of low temperature superconducting Josephson logic systems is used as a basis for structural test generation. This requires the investigation of processing defects using defect m...
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In this paper, defect-oriented testing of low temperature superconducting Josephson logic systems is used as a basis for structural test generation. This requires the investigation of processing defects using defect monitors and the development of fault models. Inductive fault analysis techniques play an important role in this approach. By means of fault injection in the JSIM circuit simulator, the most effective test signals can be derived which can subsequently be used for test-generator hardware in a built-in self test environment. (C) 2001 Elsevier Science B.V. All rights reserved.
As the niobium (Nb) LTS RSFQ processes advance being the technology for future ultrahigh-speed systems in the digital domain, the quality of the process should be maintained high for a successful realization of these ...
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As the niobium (Nb) LTS RSFQ processes advance being the technology for future ultrahigh-speed systems in the digital domain, the quality of the process should be maintained high for a successful realization of these complex circuits. A defect-oriented testing (DOT) approach is essential so as to increase the yield of the process. Little information is available in this area and the recent increase of Josephson junctions to around 90,000 per chip requires a detailed study on this topic. In this paper we present how DOT can be applied to RSFQ circuits. As a result of a study conducted on an RSFQ process, a list of possible defects has been identified and described in detail. We have also developed test-structures for detection of the top-ranking defects, which will be used for the probability distribution of faults in the process. One of the highly probable defects will be used to elaborate the DOT technique for fault modeling and simulation purposes. (C) 2001 Elsevier B.V. All rights reserved.
Developments in electronic/fluidic microsystems are progressing rapidly. The ultimate goal is to deliver products in the 10,000 fluidic reaction-wells range. Exciting applications include massive parallel DNA analysis...
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Developments in electronic/fluidic microsystems are progressing rapidly. The ultimate goal is to deliver products in the 10,000 fluidic reaction-wells range. Exciting applications include massive parallel DNA analysis and automatic drug synthesis. Until now, only functional testing has been used to "guarantee" the quality of micro-fluidic systems after manufacturing. In this paper, defect-oriented test approaches developed in analogue fault modeling and simulation have been used to predict for the first time the faulty behavior of micro-electronic fluidic microsystems. The modeling is targeted for use in complex electronic/fluidic microsystems employing commercial microsystem CAD tools. It enables a measure for the quality of these systems based on the performed (functional) tests and can be a guide for future test-stimuli generation and yield prediction.
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