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SYSTEMS AND computerS IN JAPAN 1995年第7期26卷 1-12页

作者： FUJIWARA, E TANAKA, T Member Faculty of Engineering Tokyo Institute of Technology Tokyo Japan 152 Eui Fujiwara:received his B.S. and M.S. degrees in Electronics Engineering in 1968 and 1970 respectively and his Dr. of Eng. degree in 1981 all from Tokyo Institute of Technology. In 1970 he joined the NTT Musashino Electrical Communication Laboratories and engaged in developing PIPS-1 and PIPS-11 computer systems. In 1988 he joined the Department of Computer Science Tokyo Institute of Technology as an Associate Professor. In 1990 he became a full Professor. He was a Visiting Professor at the Center for Advanced Computer Studies the University of Southwestern Louisiana from June 1985 to July 1986. His current research interests include coding theory for computers fault-tolerant memories VLSI defect-toleranceand WSI systems. He is a co-author ofError Control Coding for Computer Systems(Prentice-Hall1989) EssentiaLF of Error-Correcting Coding Techniques (Academic Press 1990) and other books. Dr. Fujiwara received the Young Engineer Award from the I.E.I.C.E. in 1978 and the Teshima Memorial Research Award in 1991. He is a senior member of the IEEE and a member of the Information Processing Society Japan. Associate Member

Because of its capability of high-speed search, the associative memory (CAM) is expected to be used in a variety of information processing systems. In this paper, novel fault-tolerant techniques which are effective for on-line use are proposed for TLB which is an example of the application of CAM. First, fault and error models of the TLB consisting of the CAM part and the SRAM part are clarified. Then, the fault-tolerant techniques for these faults and errors, such as distance separable technique, cod-ing technique, simplified 1-out-of-n check and graceful degradation, are proposed. The distance separable technique which encodes the data stored in the CAM part is the one which masks the faulty CAM part and prevents errors from propagating to the subsequent circuits. The coding technique checks the one-to-one correspondence between the data in the CAM and those in SRAM by using the SEC-DED code with byte error detection capability, i.e., SEC-DED-SbED code, and at the same time it detects and corrects errors in the data stored in SRAM. The simplified 1-out-of-n check processes association errors. The graceful degradation gives a flag in the faulty memory section and prevents it from being used. The methods proposed in this paper are evaluated from area augmentation and error detection capability perspectives. The results show that the fault-tolerant TLB with 32 virtual address bits, 32 physical address bits and 128 entries gives single fault detection probability of nearly 99 percent with 28 percent area increase.

关键词： CAM TLB DISTANCE SEPARABLE TECHNIQUE CODING TECHNIQUE SIMPLIFIED 1-OUT-OF-N CHECK GRACEFUL DEGRADATION

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Development and application of MCAL tools for marine radar instruction

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computer Applications in engineering Education 1995年第4期3卷 259-259页

作者： Guirguis, S. Korany, E. Abdel-Bary, A. Institute of Graduate Studies and Research Alexandria University Alexandria Egypt Shawkat K. Guirguis:obtained the BSc and M.Sc. degrees in Computer Science and Automatic Control Faculty of Engineering Alexandria University in 1981 and 1984 respectively. In 1988 he obtained a PhD degree in Electronics and Communications Faculty of Engineering Cairo University co-supervised by the Imperial College of Science and Technology University of London where he spent two years as an academic visitor. His current research interests include software quality management multimedia automatic programming and decision support systems. He is currently a lecturer of Computer Science at the Institute of Graduate Studies & Research Alexandria University. Ezzat A. Korany:received the BS degree in Electrical Engineering (Electronics Section) from the University of Alexandria Egypt in 1971 the MS degree in Electrical Engineering (Computer Section) from Ain Shams University Cairo Egypt in 1977 and the PhD degree in Electrical Engineering (Digital Systems) from Florida Institute of Technology U.S.A. in 1982. He is currently an associate professor of Computer Science at the Institute of Graduate Studies & Research University of Alexandria. His research interests are in data communications and multimedia applications computer networks image processing and pattern recognition. Abdel-Latif A. Abdel-Bary:obtained the BEng degree in Electronics Technology from Arab Maritime Transport Academy in 1986. In 1995 he obtained the MSc degree in Information Technology from the Institute of Graduate Studies & Research Alexandria University. His current research interests include ICAL hypermedia and automatic programming.

In this article a multimedia computer-assisted learning (MCAL) system is presented. The major objective of this work was to investigate the potential of using such systems as tools for transferring instructional course information through various types of computer media as opposed to the classic CAL systems. The philosophy and techniques employed to design the system are investigated. Usage of the implemented system and its merits have been illustrated through its application to teach engineering students and technicians the theory and concepts of marine radar. System design, implementation, test, and revision phases are presented and discussed.

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Steady‐state security evaluation of electrical power systems by means of artificial neural network

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European Transactions on Electrical Power 1995年第2期5卷 91-97页

作者： Chiodo, E. Menniti, D. Testa, A. Picardi, C. Elio Chiodo (1959) received the degree in Electronics Engineering in 1985 and the Ph.D. degree in Computational Statistics both from the University of Naplefltaly. He is a Researcher at the Department of Electrical Engineering of the University of Naples and a member of the Italian Statistical Society. His areas of interest include probabilistic methods applied to electric power systems analysis. (University of Naples Fedrrico 11. Electrical Engineering Dept.via Claudio 21 1-80125 Naplefltaly T +3981/7683226 Fax+3981/2396897) Daniele Menniti (1958) received the degree in Electrical Engineering from the University of Calabria. Cosenzataly and the Ph.D. degree in Electrical Engineering from the University of NapleslItaly in 1984 and 1989 respectively. He is a researcher at the Electronic. Computer and Systems Science Department of the University of Calabria. Italy. Hiscurrent research interests concern electric power system analysis real-time control and automation. (University of Calabria Electronic Computer and Systems Science Dep. Arcavacataji Rende (CS). 1-87036 CosenzdItaly T +39984/494707. Fax +39984/4947 13) Alfredo Testa (1950) received the degree in Electrical Engineering from the University of Naples/Italy in 1975. He is an Associate Professor in Electrical Power Systems at the Department of Electrical Engineering of the University of Naples. He is engaged in researches on electrical power systems reliability and harmonic analysis. (University of Naples Federico 11. Electrical Engineering Dep. via Claudio '2 1 1-80 I25 NapleslItaly T + 39 8 I/7 68 3'2 11. Fax+3981/2396897) Ciro Picardi (1949) received the degree in Electronics Engineering from the University of Naples/Italy in 1975. He is currently Associate Professor in Process Control at the Department of Electronic Computer and System Science of the University of Calabria. Italy. His current research interests are in the area of electrical drives robotics neural networks and fuzzy control. (University of Calabria Electronic. Compu

An artificial‐neural‐network (ANN) application for steady‐state security evaluation of electrical power systems is presented. Such application is based upon a combined use of a multilayer back‐propagation neural network and of an opportune electrical system model, previously proposed by some of the authors. In the paper, the definition of steady‐state security and the problems arising from its on‐line evaluation are briefly recalled. Then, the ANN utilized is described with particular reference to the solutions adopted by the authors. Afterwards, some remarks on the system model utilized are reported. Finally, numerical applications on the AEP‐14 bus system are presented and the results obtained with different ANN configurations are analyzed. Copyright © 1995 John Wiley & Sons, Ltd.

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INTEGRATION OF WET-CHEMICAL PROCESSING WITH LOW-TEMPERATURE PLASMA-ASSISTED PROCESSES FOR THE FORMATION OF DEVICE-QUALITY SI/SIO2 INTERFACES ON SI(111) SURFACES

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MICROELECTRONIC engineering 1994年第2-4期25卷 217-222页

作者： YASUDA, T BJORKMAN, CH MA, Y LU, Z LUCOVSKY, G EMMERICHS, U MEYER, C LEO, K KURZ, H Departments of Physics Materials Science and Engineering and Electrical and Computer Engineering North Carolina State University Raleigh NC 27695 USA Institute of Semiconductor Electronics II Rheinische-Westfälische Technische Hochschule 5100 Aachen Germany

An integrated sequence of ex-situ wet-chemistry, and on-line low-temperature remote plasma-assisted techniques, for fabricating device-quality Si/SiO2 interfaces on Si(111) wafers is reported. Three factors contribute to the device quality interfaces i) the orientation of the Si surface relative to a perfect (111) alignment, ii) the pH of the final HF/NH4F rinse used in the pre-deposition wet-chemistry processing, and iii) the specific plasma-assisted oxidation and deposition processes used to form the SiO2/Si heterostructure.

关键词： Microelectronic processing

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INTEGRATED PROCESSING OF STACKED-GATE HETEROSTRUCTURES - PLASMA-ASSISTED LOW-TEMPERATURE PROCESSING COMBINED WITH RAPID THERMAL HIGH-TEMPERATURE PROCESSING

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MICROELECTRONIC engineering 1994年第2-4期25卷 209-214页

作者： MISRA, V HATTANGADY, S XU, XL WATKINS, MJ HORNUNG, B LUCOVSKY, G WORTMAN, JJ EMMERICHS, U MEYER, C LEO, K KURZ, H Departments of Electrical and Computer Engineering Materials Science and Engineering and Physics North Carolina State University Raleigh NC 27695 USA Institute of Semiconductor Electronics II Rheinisch-Westfälische Technische Hochschule 5100 Aachen Germany

We discuss a novel approach to the formation of deposited stacked-gate structures that combines several different processing steps into a single chamber with multi-function oxidation, passivation and deposition capabilities. To form a Si-based stacked gate structures the following in-situ steps can be performed i) a final cleaning/passivation of the Si surface, ii) formation of the SiO2/Si interface, iii) deposition of a single, or multi-layer dielectric, e.g., SiO2, or an oxide/nitride/oxide (ONO) structure, and iv) deposition of a polysilicon gate electrode. We discuss the fabrication and performance of test device structures that combine remote plasma and rapid thermal processing steps, but omit the polysilicon deposition, and use an Al gate electrode instead. These structures are use to demonstrate the effectiveness of different interface formation processes.

关键词： Microelectronic processing

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Multiple neural networks using the reduced input dimension

Multiple neural networks using the reduced input dimension

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Proceedings of the 1994 IEEE International Conference on Acoustics, Speech and Signal Processing. Part 2 (of 6)

作者： Kim, Jongwan Ahn, Jesung Kim, Chong Sang Hwang, Heeyeung Cho, Seongwon Dept. of Computer Engineering Seoul National University Gwanak-Gu Seoul151-742 Korea Republic of Dept. of Electronics Engineering Hoseo University Chon-An Chungnam-Do330-180 Korea Republic of Dept. of Electrical and Control Engineering Hong Ik University Mapo-Gu Seoul121-791 Korea Republic of

An ensemble of neural networks with competitive learning and consensus schemes is proposed. Conventional learning methods utilize all the dimensions of the original input patterns. However, a particular attribute of the input patterns does not necessarily contribute to classification. In this paper, we use the reduced input dimension for learning a neural network. We have developed three consensus schemes so as to judge the classification using multiple neural networks. The experimental results with remote sensing data indicate the improved performance of the networks when applying the proposed method to the conventional competitive learning algorithms. © 1994 IEEE.

关键词： Learning systems

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Nonlinear system identification and control of a reactive ion etcher

Nonlinear system identification and control of a reactive io...

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American control Conference (ACC)

作者： T.L. Vincent P.P. Khargonekar B.A. Rashap E. Terry M. Elta Electronics Manufacturing and Control Systems Department of Electrical Engineering and Computer Science University of Michigan Ann Arbor MI USA

This paper presents experimental results on empirical nonlinear models (of the Hammerstein type) for a reactive ion etcher. A nonlinear tracking controller design based on the nonlinear model was implemented. Experime... 详细信息

关键词： Nonlinear systems Nonlinear control systems control systems Etching Plasma applications Plasma materials processing Semiconductor process modeling Semiconductor device manufacture Virtual manufacturing control system synthesis

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Bioelectronics, three-dimensional memories and hybrid computers

Bioelectronics, three-dimensional memories and hybrid comput...

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International Electron Devices Meeting (IEDM)

作者： R.R. Birge D.S.K. Govender R.B. Gross A.F. Lawrence J.A. Stuart J.R. Tallent E. Tan B.W. Vought W.M. Keck Center for Molecular Electronics Departments of Chemistry Physics & Electrical and Computer Engineering Syracuse University Syracuse NY USA

The promise of new architectures and more cost-effective miniaturization has prompted interest in hybrid molecular and semiconductor computers. Nature has already optimized some molecules for such applications. We examine here the use of the protein bacteriorhodopsin in associative and three-dimensional memories and the potential for making hybrid computer systems which combine semiconductor and biomolecular components.< >

关键词： Molecular electronics Proteins Holography Optical films Biomedical optical imaging Holographic optical components Optical pumping Optical refraction Optical variables control Physics computing

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A feedback limitation of decentralized controllers for TITO systems, with application to a reactive ion etcher

A feedback limitation of decentralized controllers for TITO ...

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IEEE Conference on Decision and control

作者： J.S. Freudenberg J.W. Grizzle B.A. Rashap Electronics Manufacturing and Control Systems Laboratory Department of Electrical Engineering and Computer Science University of Michigan Ann Arbor MI USA

This paper explores an inherent feedback limitation of using decentralized LTI control on a two-input, two-output LTI plant. The result is motivated by, and illustrated on, a reactive ion etcher.

This paper explores an inherent feedback limitation of using decentralized LTI control on a two-input, two-output LTI plant. The result is motivated by, and illustrated on, a reactive ion etcher.< >

关键词： Feedback control systems Etching Centralized control Actuators Chemical processes Plasma applications computer aided manufacturing Semiconductor device noise Power system modeling

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A new competitive learning algorithm with dynamic output neuron generation

A new competitive learning algorithm with dynamic output neu...

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International Joint Conference on Neural Networks (IJCNN)

作者： Jongwan Kim Jesung Ahn Chong Sang Kim Heeyeung Hwang Seongwon Cho Department of Computer Engineering Seoul National University Seoul South Korea Department of Electronics Engineering Hoseo University Chonan ChungNam South Korea Department of Electrical and Control Engineering Hong Ik University Seoul South Korea

Proposes a new competitive learning algorithm that dynamically creates output neurons. The number of output neurons is increased as learning proceeds, whereas conventional competitive learning algorithms use all of the available output neurons during the entire learning phase. An acceptance test for the winning output neuron is performed using class thresholds if the number of created output neurons is less than the predefined maximum number. Accepted input vectors are used to adjust the reference vector of the winning output neuron. If an input vector is rejected, it is used as the initial reference vector of a new output neuron. The proposed method gets around the drawbacks of the conventional competitive learning algorithms by changing the class threshold values of output neurons dynamically. Experiments with remote sensing data and speech data indicate the superiority of the proposed algorithm in comparison to the conventional competitive learning methods.< >

关键词： Heuristic algorithms Neurons Neural networks Testing Remote sensing Speech Subspace constraints control engineering Performance evaluation Learning systems

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