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A deep learning framework for automatic assessment of presence in virtual reality using multimodal behavioral cues

Neural Computing and Applications 2025年第8期37卷 6283-6303页

作者： Pannattee, Peerawat Shimada, Shogo Yem, Vibol Nishiuchi, Nobuyuki Graduate School of Systems Design Tokyo Metropolitan University Tokyo191-0065 Japan Graduate School of Science and Technology Degree Program in Systems and Information Engineering University of Tsukuba Ibaraki3058573 Japan

Effective development of virtual reality (VR) applications is heavily reliant on the evaluation of user experience (UX). However, traditional methods such as questionnaires have inherent limitations which hinder their ability to capture nuanced behavioral responses and impede the agility of VR content creation: They are time-consuming, burdensome for users, and require significant human effort for interpretation. This study introduces an automated framework aimed at addressing the limitations of questionnaire-based evaluations to assess UX in VR. Our primary focus is to validate the concept of this framework through assessment of the sense of presence (SOP), a crucial psychological perception with significant impact on VR UX. Our proposed framework utilizes a deep neural network (DNN) to analyze patterns in multimodal behavioral cues, including facial expressions, head movements, and hand movements, to predict scores from the Igroup Presence Questionnaire (IPQ). Additionally, we introduce two statistical profiles: the Visual Entropy Profile (VEP), which offers insights into visual complexity by depicting scene entropy, and the Experiential Presence Profile (EPP), which is designed to capture users’ historical SOP levels to enable personalized baseline and sensitivity estimation. The proposed framework achieves a significant correlation between actual and predicted IPQ scores, with a Spearman’s rank correlation coefficient of 0.7303, showcasing the potential of DNNs in analyzing complex behavioral signals and automating SOP assessment. This study represents a pioneering effort in leveraging DNNs for the automatic assessment of SOP and paves the way for future advances in automatically assessing VR UX and unlocking new opportunities in the field. © The Author(s) 2025.

关键词： Virtual environments

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Throughput and Quality Optimized Down-Selection of Overlay Measurement Markers for Robust Control of the Maximum Overlay Error in a Pattern Layer in Photolithography Processes

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IEEE Transactions on Semiconductor Manufacturing 2025年第2期38卷 251-262页

作者： Graff, Noah Djurdjanovic, Dragan The University of Texas at Austin Graduate Program in Dynamic Systems & Controls Walker Department of Mechanical Engineering AustinTX78712 United States The University of Texas at Austin Walker Department of Mechanical Engineering AustinTX78712 United States

This paper presents a metaheuristic optimization-based approach for selecting a pre-determined number of measurement markers from the set of available markers that optimizes the performance of the recently introduced robust L∞ norm overlay control algorithm, which robustly minimizes the worst overlay error across a given pattern layer. This optimization is then used in a Design of Experiments (DOE) setting to build a tractable regression model of a customizable objective function encompassing cost effects of quality losses and throughput benefits resulting from the down-selection of markers selected for robust overlay control. Using this model, one can rapidly determine the optimal proportion of markers for any set of cost parameters, and the optimal subset forming this proportion of available markers can be down-selected to maximize performance of the resulting robust overlay controller. Overlay data and models from a semiconductor manufacturing fab were used to evaluate the newly proposed inspection and control strategy. Results clearly indicate that the novel strategic down-selection of measurement markers coupled with robust overlay control could lead to vastly improved throughputs without decreasing quality relative to what can be achieved using traditional Run-to-Run (R2R) control. Feasibility of the novel DOE-based optimization was demonstrated for two scenarios of cost-effect parameters. © 1988-2012 IEEE.

关键词： Throughput

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A Design Study on Integrated Complex Coefficient Filters with Peripheral Circuits for Accurate Frequency Response Measurement

IEEJ Transactions on Electronics, Information and Systems

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IEEJ Transactions on Electronics, Information and systems 2025年第1期145卷 16-24页

作者： Shouno, Kazuhiro Sato, Lina Fukagawa, Kanta Tanimoto, Hiroshi Muto, Cosy Division of Information Engineering University of Tsukuba 1-1-1 Tennoudai Ibaraki Tsukuba305-8573 Japan Graduate School of Science and Technology Degree Programs in Systems and Information Engineering Master’s Program in Computer Science University of Tsukuba Japan Kitami Institute of Technology 165 Koen-cho Hokkaido Kitami090-8507 Japan Faculty of Education Nagasaki University 1-14 Bunkyo-machi Nagasaki852-8521 Japan

This paper proposes a measurement technique for an integrated complex filter. The proposed method is based on two measurement methods with integrated circuitry for calibration. It is accomplished by applying square waves to an FUT (Filter Under Test) instead of sinusoidal waves or by superposing transfer characteristics obtained by applying a single sinusoidal wave to an FUT. In both of the above methods, the output signal connected to the external measurement equipment via a 50 Ω coaxial cable and so on. In this case, the output signal of the FUT should be amplified by internal or external amplifiers, which degrades the response. However, it is cancelled out by the proposed calibration circuitry with some analog switches. In addition to the above, for the RC polyphase filter, the source resistance and the load capacitance degrade the measurement results and their effect is discussed. The validity of the proposal is confirmed through computer simulation for a third-order RCPF whose passband is 8–40 MHz fabricated by Phenitec 0.6 µm CMOS process. It is shown that the measurement error is −1.10 dB for the square-wave method and −1.00 dB and −0.43 degrees for the superposition method at 40 MHz. © 2025 The Institute of Electrical Engineers of Japan.

关键词： Capacitance

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Deep Learning for Real-Time PPE Usage Monitoring Using Wearable IMU Sensors

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IEEE Access 2025年 13卷 82492-82502页

作者： Guimarães, Pedro Carvalho da Fonseca De Cristo, Leonardo Braga Monteiro, Marcos Eduardo Pivaro Rebelatto, João Luiz Peron, Guilherme de Santi Rayel, Ohara Kerusauskas Moritz, Guilherme Luiz Federal University of Technology - Paraná (UTFPR) Curitiba Brazil Federal University of Technology - Paraná (UTFPR) Graduate Program in Electrical and Computer Engineering (CPGEI-CT) Curitiba Brazil Federal University of Technology - Paraná (UTFPR) Graduate Program in Energy Systems (PPGSE-CT) Curitiba Brazil

Ensuring the proper use of Personal Protective Equipment (PPE) is critical for safeguarding workers in high-risk environments, such as power distribution systems. This work presents an innovative approach to monitoring PPE usage through Deep Neural Networks (DNNs). Using data from inertial measurement units (IMUs) integrated into PPE items, we propose a solution to classify three usage states—namely carrying, still, and wearing—using raw accelerometer and gyroscope data. More specifically, thiswork assesses the effectiveness of three distinct network architectures—Convolutional Neural Networks (CNN), Bidirectional Long Short-Term Memory (BiLSTM), and CNN-BiLSTM—on a publicly released dataset on PPE usage provided by this study, while also comparing them against a traditional baseline Multi- Layer Perceptron (MLP) architecture. Our results demonstrate the superiority of BiLSTM in balancing high accuracy with computational efficiency, achieving above 98% accuracy regardless of the PPE type. Thiswork represents the first application of DNNs for PPE monitoring using IMU data, offering significant implications for enhancing safety compliance and operational monitoring in power distribution. © 2013 IEEE.

关键词： AI BiLSTM CNN DNN IoT PPE

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Generative assistant for digital twin simulations 12

Generative assistant for digital twin simulations

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12th CIRP Global Web Conference, CIRPe 2024

作者： Boareto, Pedro Antonio De Freitas Rocha Loures, Eduardo Portela Santos, Eduardo Alves Deschamps, Fernando Industrial and Systems Engineering Graduate Program Pontifical Catholic University of Paraná 1155 Imaculada Conceição St. Paraná Curitiba80215-901 Brazil Federal University of Paraná 632 Prefeito Lothário Meissner Av. Paraná Curitiba80210-170 Brazil

One of the key emerging technologies in Industry 4.0 is the Digital Twin (DT). Although it promises increased efficiency, productivity, and innovation, its adoption faces challenges such as high investment costs and the need for workforce requalification. Generative Artificial Intelligence (GAI) emerges as a promising solution, offering capabilities to accelerate development processes and reduce costs. This study aims to leverage GAI to enhance the development of DT and support decision-making in industrial environments by proposing a Generative Assistant for Digital Twin Simulations (GADTS). This proposal generates operational models quickly, offers greater customization, and facilitates the creation of efficient scenario simulations in natural language. The proposal was tested with artificial data. As a result, the development of highly personalized DT simulations with Key Performance Indicators (KPIs) was entirely abstracted into natural language requests. © 2025 Elsevier B.V.. All rights reserved.

关键词： Generative adversarial networks

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Towards an Integration of Augmented Reality in Industrial Assembly Processes: Issues and Perspectives

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Procedia Computer Science 2025年 253卷 1063-1072页

作者： Bruno J. Souza Anderson L. Szejka Roberto Z. Freire Industrial and Systems Engineering Graduate Program Pontifical Catholic University of Parana (PUCPR) Curitiba 80215-901 Brazil Federal University of Technology – Parana (UTFPR) Curitiba 80050-540 Brazil

The evolution of manufacturing has led to Industry 5.0, where human creativity is integrated with advanced technology to achieve efficient and sustainable production. Given the high volume and diversity of assembly tasks, operator assistance systems have become essential tools in the industry, leveraging augmented reality (AR) and other new technologies. This literature review specifically examines 19 papers on AR applications within the context of industrial assembly tasks. The review focuses on identifying the types of AR technologies utilized, the methodologies for implementing AR systems in assembly, and the primary limitations and challenges encountered. The findings indicate a growing field with promising applications in assembly, training, and maintenance, predominantly using AR glasses. Furthermore, a gap is identified indicating the absence of a standardized framework for AR-based assembly assistance systems. Future research should aim at creating a foundational framework for AR system implementation, thereby accelerating the adoption of innovative technologies in the industry.

关键词： Industry 5.0 augmented reality assembly assistance

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Generative a bistant for digital twin simulations 1

Generative a bistant for digital twin simulations

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1st International Conference on Digital Sovereignty, ICDS 2024

作者： Boareto, Pedro Antonio De Freitas Rocha Loures, Eduardo Portela Santos, Eduardo Alves Deschamps, Fernando Industrial and Systems Engineering Graduate Program Pontifical Catholic University of Paraná 1155 Imaculada Conceição St. Curitiba Paraná80215-901 Brazil Federal University of Paraná 632 Prefeito Lothário Mei bner Av. Curitiba Paraná80210-170 Brazil

One of the key emerging technologies in Industry 4.0 is the Digital Twin (DT). Although it promises increased efficiency, productivity, and innovation, its adoption faces challenges such as high investment costs and the need for workforce requalification. Generative Artificial Intelligence (GAI) emerges as a promising solution, offering capabilities to accelerate development proce bes and reduce costs. This study aims to leverage GAI to enhance the development of DT and support decision-making in industrial environments by proposing a Generative A bistant for Digital Twin Simulations (GADTS). This proposal generates operational models quickly, offers greater customization, and facilitates the creation of efficient scenario simulations in natural language. The proposal was tested with artificial data. As a result, the development of highly personalized DT simulations with Key Performance Indicators (KPIs) was entirely abstracted into natural language requests. © 2025 Elsevier B.V.. All rights reserved.

关键词： Generative adversarial networks

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Optimizing CdS thin films as optical windows in solar cells: A comparative study of cryogenic and classical techniques

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Applied Physics A 2025年第6期131卷 1-17页

作者： Manir, Melih Genç, Gamze Nevruzoglu, Vagif Tomakin, Murat Department of Energy Systems Engineering Erciyes University Kayseri Turkey Energy Systems Engineering Program Graduate School of Natural and Applied Sciences Erciyes University Kayseri Turkey Department of Energy Systems Engineering Recep Tayyip Erdogan University Rize Turkey Electrochemical Storage and Energy Conversion (ESCE) Research Group Erciyes University Kayseri Turkey Department of Physics Recep Tayyip Erdogan University Rize Turkey

In this study, CdS thin films were produced in a quasi-closed volume using two different techniques (classical and cryogenic thermal evaporation techniques) between the 100–573 K substrate temperature, and their characteristic properties (structural, electrical, and optical properties) were investigated. While CdS thin films were produced at 373 K, 473 K, and 573 K substrate temperatures in the classical technique (hot), they were produced at 100–300 K substrate temperature range with 50 K steps in the cryogenic technique (cold). The X-Ray Diffraction (XRD) analysis showed that the CdS thin films grew in a hexagonal structure in the (002) plane at all substrate temperatures. According to the field emission scanning electron microscope (FESEM) images, the thin films produced at 200 K substrate temperature consisted of equally sized spherical grains. This situation shows that the soliton growth mechanism occurs at a substrate temperature of 200 K during the film production process with the cryogenic technique. Due to the characteristic properties of the soliton waves occurring on the substrate surface in the soliton growth mechanism (mass transport), the films grow in a tight-packed form. Therefore, the produced films consist of clusters of equal size, providing a homogeneous surface and a uniform thickness. In addition, Atomic Force Microscope (AFM) and optical analyses showed that the CdS thin film produced at 200 K substrate temperature had the smallest average surface roughness value (Ra) and the highest optical transmittance value. It was found that the energy band gap (2.37–2.47 eV) and resistivity (1.25 × 103–5.39 × 103 Ω-cm) values of CdS thin films increased with decreasing substrate temperature. The carrier density increased with decreasing substrate temperature (3.91 × 1017–1.73 × 1016 cm−3). Energy Dispersive Spectroscopy (EDS) analysis showed that the films grew stoichiometrically at substrate tempe

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Deep Learning-Based Residual Useful Lifetime Prediction for Assets With Uncertain Failure Modes

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Journal of Computing and Information Science in engineering 2025年第4期25卷 041002页

作者： Su, Yuqi Fang, Xiaolei Operations Research Graduate Program North Carolina State University 915 Partners Way Raleigh NC 27607 Edward P. Fitts Department of Industrial and Systems Engineering North Carolina State University 915 Partners Way Raleigh NC 27607

Industrial prognostics focuses on utilizing degradation signals to forecast and continually update the residual useful life of complex engineering systems. However, existing prognostic models for systems with multiple failure modes face several challenges in real-world applications, including overlapping degradation signals from multiple components, the presence of unlabeled historical data, and the similarity of signals across different failure modes. To tackle these issues, this research introduces two prognostic models that integrate the mixture (log)-location-scale distribution with deep learning. This integration facilitates the modeling of overlapping degradation signals, eliminates the need for explicit failure mode identification, and utilizes deep learning to capture complex nonlinear relationships between degradation signals and residual useful lifetimes. Numerical studies validate the superior performance of these proposed models compared to existing methods.

关键词： Failure mechanisms mixture (log)-location-scale distribution Failure Weibull distribution multiple failure modes Signals Service life (Equipment) prognostics data analytics Deep learning machine learning for engineering applications engineering systems and industry applications industrial Internet of things big data and analytics

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Alignment-Free Estimation of Read to Genome Distances and Its Applications

Alignment-Free Estimation of Read to Genome Distances and...

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29th International Conference on Research in Computational Molecular Biology, RECOMB 2025

作者： Şapcı, Ali Osman Berk Mirarab, Siavash Bioinformatics and Systems Biology Graduate Program UC San Diego San DiegoCA92093 United States Department of Electrical and Computer Engineering UC San Diego San DiegoCA92093 United States

ISBN: (纸本)9783031902512

Searching reads from unknown origins in a reference database and finding evolutionarily similar genomes is central to many applications. Quantifying the similarity by estimating the distance between each read and matching references could further help downstream analyses such as taxonomic characterization or even placing the read on a reference phylogeny. Such distances can be computed using alignment. Since alignment becomes impractical for ultra-large reference databases, many use k-mer-based tools for downstream tasks, but these methods do not compute distances. We introduce krepp to compute the distance between a read and a genome using a maximum likelihood framework built around k-mers. We further introduce algorithms to place reads on a reference tree. Empirical evaluations show that krepp accurately estimates distances, scales well with large databases, and can place short reads coming from any part of the genome on a reference phylogeny. © The Author(s), under exclusive license to Springer Nature Switzerland AG 2025.

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